JPS62144013A - 光電式位置検出装置 - Google Patents

光電式位置検出装置

Info

Publication number
JPS62144013A
JPS62144013A JP28460785A JP28460785A JPS62144013A JP S62144013 A JPS62144013 A JP S62144013A JP 28460785 A JP28460785 A JP 28460785A JP 28460785 A JP28460785 A JP 28460785A JP S62144013 A JPS62144013 A JP S62144013A
Authority
JP
Japan
Prior art keywords
photoelectric
position detection
measured
detection device
light beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP28460785A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0224446B2 (enrdf_load_stackoverflow
Inventor
Yuuji Yunaka
柚中 裕士
Yoshiharu Kuwabara
義治 桑原
Osamu Koizumi
小泉 統
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsutoyo Manufacturing Co Ltd
Original Assignee
Mitsutoyo Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsutoyo Manufacturing Co Ltd filed Critical Mitsutoyo Manufacturing Co Ltd
Priority to JP28460785A priority Critical patent/JPS62144013A/ja
Publication of JPS62144013A publication Critical patent/JPS62144013A/ja
Publication of JPH0224446B2 publication Critical patent/JPH0224446B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Automatic Focus Adjustment (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
JP28460785A 1985-12-18 1985-12-18 光電式位置検出装置 Granted JPS62144013A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP28460785A JPS62144013A (ja) 1985-12-18 1985-12-18 光電式位置検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP28460785A JPS62144013A (ja) 1985-12-18 1985-12-18 光電式位置検出装置

Publications (2)

Publication Number Publication Date
JPS62144013A true JPS62144013A (ja) 1987-06-27
JPH0224446B2 JPH0224446B2 (enrdf_load_stackoverflow) 1990-05-29

Family

ID=17680645

Family Applications (1)

Application Number Title Priority Date Filing Date
JP28460785A Granted JPS62144013A (ja) 1985-12-18 1985-12-18 光電式位置検出装置

Country Status (1)

Country Link
JP (1) JPS62144013A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008505696A (ja) * 2004-07-09 2008-02-28 ヴィスクス インコーポレイテッド 走査レーザー眼手術装置用のレーザーパルス位置モニター

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008505696A (ja) * 2004-07-09 2008-02-28 ヴィスクス インコーポレイテッド 走査レーザー眼手術装置用のレーザーパルス位置モニター

Also Published As

Publication number Publication date
JPH0224446B2 (enrdf_load_stackoverflow) 1990-05-29

Similar Documents

Publication Publication Date Title
US4897536A (en) Optical axis displacement sensor with cylindrical lens means
JPH0374763B2 (enrdf_load_stackoverflow)
JPS5999304A (ja) 顕微鏡系のレーザ光による比較測長装置
US4730927A (en) Method and apparatus for measuring positions on the surface of a flat object
CN110132374A (zh) 一种自补偿式激光液位测量系统
JPS6324115A (ja) 磁気ヘツドの浮上量測定方法及びその装置
US7804605B2 (en) Optical multi-axis linear displacement measurement system and a method thereof
JPS62144014A (ja) 光電式位置検出装置
JPS62144013A (ja) 光電式位置検出装置
US20200292300A1 (en) Non-contact sheet material thickness measurement system
JPH08304068A (ja) 距離計測装置及びその方法
JPS61191908A (ja) 形状測定方法
JPH07332954A (ja) 変位傾斜測定方法および装置
JPH0318887Y2 (enrdf_load_stackoverflow)
JPH06258040A (ja) レーザー変位計
JPS5826325Y2 (ja) 位置検出装置
TWI239385B (en) A kind of apparatus using transmission grating to measure rotation axis errors
JPS635208A (ja) 表面形状測定装置
JPS62138715A (ja) 変位の測定方法および装置
JPS6262208A (ja) 距離測定装置および距離測定方法
JPH0359413A (ja) 位置測定装置
JPS63196807A (ja) 光学式変位計測方法
JPS5836032Y2 (ja) レベル検出装置
JPH0331367B2 (enrdf_load_stackoverflow)
JP2529049B2 (ja) 光学式変位計