JPS62119434A - ガス配管内ダストモニタ装置 - Google Patents

ガス配管内ダストモニタ装置

Info

Publication number
JPS62119434A
JPS62119434A JP26031485A JP26031485A JPS62119434A JP S62119434 A JPS62119434 A JP S62119434A JP 26031485 A JP26031485 A JP 26031485A JP 26031485 A JP26031485 A JP 26031485A JP S62119434 A JPS62119434 A JP S62119434A
Authority
JP
Japan
Prior art keywords
gas
dust
housing
light
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP26031485A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0519932B2 (enrdf_load_html_response
Inventor
Kyoichi Ono
恭一 大野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP26031485A priority Critical patent/JPS62119434A/ja
Publication of JPS62119434A publication Critical patent/JPS62119434A/ja
Publication of JPH0519932B2 publication Critical patent/JPH0519932B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/49Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/53Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP26031485A 1985-11-20 1985-11-20 ガス配管内ダストモニタ装置 Granted JPS62119434A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26031485A JPS62119434A (ja) 1985-11-20 1985-11-20 ガス配管内ダストモニタ装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26031485A JPS62119434A (ja) 1985-11-20 1985-11-20 ガス配管内ダストモニタ装置

Publications (2)

Publication Number Publication Date
JPS62119434A true JPS62119434A (ja) 1987-05-30
JPH0519932B2 JPH0519932B2 (enrdf_load_html_response) 1993-03-18

Family

ID=17346300

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26031485A Granted JPS62119434A (ja) 1985-11-20 1985-11-20 ガス配管内ダストモニタ装置

Country Status (1)

Country Link
JP (1) JPS62119434A (enrdf_load_html_response)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002031594A (ja) * 2000-05-12 2002-01-31 Rion Co Ltd 光散乱式粒子検出器
WO2007112210A3 (en) * 2006-03-23 2008-05-29 Hach Co Optical design of a particulate measurement system
CN116223135A (zh) * 2023-05-05 2023-06-06 南京科力赛克安全设备有限公司 一种便于操作的一体化采样设备及其采样方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS509482A (enrdf_load_html_response) * 1973-05-22 1975-01-30
JPS55145350A (en) * 1979-04-27 1980-11-12 Mitsubishi Electric Corp Fabricating method of semiconductor device
JPS5757239A (en) * 1980-09-25 1982-04-06 Mitsubishi Heavy Ind Ltd Detector for concentration of powder material
JPS60156441A (ja) * 1983-09-30 1985-08-16 メツセルシユミツト−ベルコウ−ブロ−ム・ゲゼルシヤフト・ミト・ベシユレンクテル・ハフツング 外科レ−ザ処置用ハンドアプリケ−タ

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS509482A (enrdf_load_html_response) * 1973-05-22 1975-01-30
JPS55145350A (en) * 1979-04-27 1980-11-12 Mitsubishi Electric Corp Fabricating method of semiconductor device
JPS5757239A (en) * 1980-09-25 1982-04-06 Mitsubishi Heavy Ind Ltd Detector for concentration of powder material
JPS60156441A (ja) * 1983-09-30 1985-08-16 メツセルシユミツト−ベルコウ−ブロ−ム・ゲゼルシヤフト・ミト・ベシユレンクテル・ハフツング 外科レ−ザ処置用ハンドアプリケ−タ

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002031594A (ja) * 2000-05-12 2002-01-31 Rion Co Ltd 光散乱式粒子検出器
WO2007112210A3 (en) * 2006-03-23 2008-05-29 Hach Co Optical design of a particulate measurement system
US7525655B2 (en) 2006-03-23 2009-04-28 Hach Company Optical design of a particulate measurement system
CN116223135A (zh) * 2023-05-05 2023-06-06 南京科力赛克安全设备有限公司 一种便于操作的一体化采样设备及其采样方法

Also Published As

Publication number Publication date
JPH0519932B2 (enrdf_load_html_response) 1993-03-18

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term