JPS62119434A - Monitor for dust inside gas piping - Google Patents
Monitor for dust inside gas pipingInfo
- Publication number
- JPS62119434A JPS62119434A JP26031485A JP26031485A JPS62119434A JP S62119434 A JPS62119434 A JP S62119434A JP 26031485 A JP26031485 A JP 26031485A JP 26031485 A JP26031485 A JP 26031485A JP S62119434 A JPS62119434 A JP S62119434A
- Authority
- JP
- Japan
- Prior art keywords
- gas
- dust
- light
- housing
- gas piping
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
- G01N21/53—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke
Abstract
Description
【発明の詳細な説明】
〔概要〕
ガス配管内のガスをサンプリングせずに、配管内のダス
トを測定監視することができるガス配管内ダストモニタ
装置である。[Detailed Description of the Invention] [Summary] This is a gas piping dust monitoring device that can measure and monitor dust in the piping without sampling the gas in the gas piping.
本発明はガス配管内のダストをモニタする装置に関する
もので、さらに詳しく言えば、半導体製造工程における
品質管理のためにその製造過程に用いられるガス内のダ
ストをモニタする装置に関する。The present invention relates to an apparatus for monitoring dust in gas piping, and more specifically, to an apparatus for monitoring dust in gas used in semiconductor manufacturing processes for quality control.
半導体装置の製造においては各種のガスを使用するが、
これらのガスの内にはダスト(ゴミ)が入っている。ダ
ストはガスの供給源において既にガスに含まれているこ
ともあり、また使用において配管のバルブ、継手、タッ
プ等から発生するものがある。ガスにダストが含まれて
いると半導体装置の製造に支障があるのでダストのモニ
タが要求されるのであるが、従来、ガス配管内のダスト
をモニタする場合、第3図に示すようにガス配管31の
途中に弁別器32を設け、この弁別器32の切換機構に
よりモニタ用配管33ヘガスをサンプリングし、このサ
ンプリングされたガスをダストモニタ装置34において
検知している。なお、このサンプリング時以外は、ガス
配管31内のガスは例えば半導体ウェハを製造する処理
室35に供給される。Various gases are used in the manufacturing of semiconductor devices.
These gases contain dust. Dust may already be contained in the gas at the gas supply source, or may be generated from pipe valves, joints, taps, etc. during use. If dust is included in the gas, it will hinder the production of semiconductor devices, so dust monitoring is required. Conventionally, when monitoring dust in gas piping, as shown in Figure 3, A discriminator 32 is provided in the middle of the pipe 31, and a switching mechanism of the discriminator 32 samples gas to a monitoring pipe 33, and the sampled gas is detected by a dust monitor device 34. Note that, except during this sampling, the gas in the gas pipe 31 is supplied to a processing chamber 35 in which semiconductor wafers are manufactured, for example.
しかし、この従来例によると、ガス配管31のガス圧力
がサンプリング時にそのままダストモニタ装置34に印
加され、この場合ダストモニタ装置34内には通常光学
系と電気系とが一括収納されているために、圧力に弱い
部品、ガスの圧力によって損傷破壊されるおそれがある
。However, according to this conventional example, the gas pressure in the gas pipe 31 is directly applied to the dust monitor device 34 during sampling, and in this case, the optical system and the electrical system are usually housed together in the dust monitor device 34. , parts that are sensitive to pressure, may be damaged or destroyed by gas pressure.
また、検知終了後、サンプリングガスをどのように排気
処理すべきかも使用ガスの危険性、毒性が大きい場合に
は人命にも影響を及ぼすために重大な問題になっている
。Furthermore, how to exhaust the sampling gas after the detection is completed is a serious issue because if the gas used is dangerous and toxic, it may affect human life.
かかる問題点を解決すべく、監視モジュール(view
ing module)が提案され、それによると、ガ
ス配管の一部にのぞき窓を設け、こののぞき窓に計測器
を取り付けてガス内のダストをカウントすることが試み
られたが、この方法によると、のぞき窓を設けるについ
てどの場所にするかという制約があり、またその都度計
測器をのぞき窓に取り付けなければならない問題があり
、満足すべきモニタ方式とはいいえない。In order to solve this problem, a monitoring module (view
According to this method, an attempt was made to install a peephole in a part of the gas pipe and attach a measuring instrument to the peephole to count the dust in the gas. There are restrictions on where the peephole can be installed, and there is also the problem of having to attach a measuring instrument to the peephole each time, so it cannot be said that this is a satisfactory monitoring method.
本発明はこのような点に鑑みて創作されたもので、ガス
配管内のダストをサンプリングせずにモニタすることが
できる装置を提供することを目的とする。The present invention was created in view of these points, and an object of the present invention is to provide a device that can monitor dust in gas piping without sampling it.
そこで本発明は第1図に示す実施例のように、ガス配管
12の途中に筺体11を連結し、ガスは配管12(また
は透明管14)を通って通常の配管系を流れ、筺体11
内に流出することがなく、この筺体11内に光学系のみ
を収納し、増倍型光電管19によって電気系のカウンタ
20は筺体11の外部に設置することによって、サンプ
リングに伴う従来例の問題を解決する。Therefore, in the present invention, as in the embodiment shown in FIG.
By housing only the optical system within the housing 11 and installing the electrical system counter 20 outside the housing 11 using the multiplier type phototube 19, problems associated with conventional sampling can be solved. solve.
上記装置において、筺体11内を通過するガス内にダス
トが存在すると、光源15の光はダストに当って散乱す
る。光学系内の増倍型光電管19によってこの散乱光を
検出し、検出結果たる同光電管19の電気的出力信号を
筺体11外のカウンタ20に出力すれば、ダストの有無
および量をガスをサンプリングすることなく測定するこ
とができる。In the above device, if dust is present in the gas passing through the housing 11, the light from the light source 15 hits the dust and is scattered. This scattered light is detected by a multiplier phototube 19 in the optical system, and the electrical output signal of the phototube 19, which is the detection result, is output to a counter 20 outside the housing 11, thereby sampling the gas to determine the presence or absence of dust and the amount thereof. It can be measured without
以下、図面を参照して本発明の実施例を詳細に説明する
。Embodiments of the present invention will be described in detail below with reference to the drawings.
第1図は本発明の一実施例を示す断面図である。FIG. 1 is a sectional view showing an embodiment of the present invention.
図中、11はガス配管12の途中に配設した筺体であり
、ガス配管12との接続部はロックネジ13a、 13
bによって必要な気密性を保持する。なお、外来光があ
る場所では、この筺体11は遮光性をもたせる。In the figure, 11 is a housing disposed midway through the gas pipe 12, and the connection part with the gas pipe 12 is provided with lock screws 13a, 13.
Maintain the necessary airtightness by b. In addition, in a place where there is external light, this housing 11 has a light shielding property.
14はガス配管12の上下各端部の間に連結された透明
管である。ここで、この透明管14をガス配管12に対
して気密性をもたせて接続すれば、前記筺体11を気密
構造にする必要はない、15はハロゲンランプまたはレ
ーザビーム等の光源、16は光源15と透明管14との
間に設置した凸レンズであり、光を透明管14の軸心位
置に集光する。17は透明管14を境として光源15と
は反対側に設置した凹面鏡であり、ダストDに当って生
じた散乱光を集光する。14 is a transparent tube connected between the upper and lower ends of the gas pipe 12. Here, if the transparent tube 14 is connected to the gas pipe 12 in an airtight manner, there is no need for the housing 11 to have an airtight structure. 15 is a light source such as a halogen lamp or a laser beam, and 16 is a light source 15. This is a convex lens installed between the transparent tube 14 and the transparent tube 14, and focuses light on the axial center position of the transparent tube 14. A concave mirror 17 is installed on the opposite side of the light source 15 with the transparent tube 14 as a boundary, and condenses the scattered light generated when it hits the dust D.
18は透明管14と凸レンズ16との間に傾斜して配設
した反射鏡であって、この反射鏡18の中央部には光源
15からの光を通過させる投光窓18aを穿没する。ま
たは反射鏡18の全体をハーフミラ−で構成してもよい
。19はこの反射鏡18の下方部に配設した増倍型光電
管である。以上のうち光源15、凸レンズ16、凹面鏡
17、反射鏡18および増倍型光電管19は本装置の光
学系を構成するものであり、いずれも筺体11内に収納
配置する。他方、20は本装置の電気系を構成するカウ
ンタであり、光学系内の前記増倍型光電管19と電気的
に接続し、かつ前記筺体11外に設置する。Reference numeral 18 denotes a reflecting mirror disposed obliquely between the transparent tube 14 and the convex lens 16, and a light projection window 18a through which light from the light source 15 passes is bored in the center of the reflecting mirror 18. Alternatively, the entire reflecting mirror 18 may be composed of a half mirror. Reference numeral 19 denotes a multiplier phototube disposed below the reflecting mirror 18. Of the above, the light source 15, the convex lens 16, the concave mirror 17, the reflecting mirror 18, and the multiplier phototube 19 constitute the optical system of the present apparatus, and are all housed within the housing 11. On the other hand, 20 is a counter that constitutes the electrical system of this device, and is electrically connected to the multiplier phototube 19 in the optical system and installed outside the housing 11.
本発明の第1実施例は図示の透明管14が設けられず、
ガスは筺体11内に充満する。そしてガスに含まれるダ
ストが下記に説明する如くに検知される。In the first embodiment of the present invention, the illustrated transparent tube 14 is not provided,
Gas fills the housing 11. Dust contained in the gas is then detected as described below.
図示した本発明の第2の実施例においては、透明管14
内のダストDに光源15からの光が当ると、ダストDに
よって光は散乱し、この散乱光が先ず凹面鏡17によっ
て集光され、次いで反射鏡18によって反射され、最終
的に増倍型光電管19の受光部に入る。増倍型光電管1
9は散乱光の有無およびその量に対応した電気的出力信
号を筺体11外のカウンタ20に出力する。カウンタ2
0はこの出力信号を計測し表示する。In the second illustrated embodiment of the invention, transparent tube 14
When the light from the light source 15 hits the dust D inside, the light is scattered by the dust D, and this scattered light is first focused by the concave mirror 17, then reflected by the reflector 18, and finally reflected by the multiplier phototube 19. enters the light receiving section. Multiplier phototube 1
9 outputs an electrical output signal corresponding to the presence or absence of scattered light and its amount to a counter 20 outside the housing 11. counter 2
0 measures and displays this output signal.
このように、ガス配管12内のガスが透明管14内にの
み通過する場合でも、また筺体11内に充満する場合で
もダストの検知機能に何ら差はない。In this way, there is no difference in the dust detection function even when the gas in the gas pipe 12 passes only into the transparent tube 14 or when the gas in the casing 11 is filled.
第2図は本発明の第3の実施例を示す断面図で、図中、
前図と同一符号は同一部分を示し、21は前図と形状が
異なる同種の筺体、22は透明管14を境に光源15と
は反対側に設置した凸レンズ、23はこの凸レンズ22
の光源15とは反対側に設置した増倍型光電管、24は
凸レンズ22と増倍型光電管23との間に介在させた遮
光マスクであり、光源15からの直接光が増倍型光電管
23に入るのを遮蔽する。FIG. 2 is a sectional view showing a third embodiment of the present invention, and in the figure,
The same reference numerals as in the previous figure indicate the same parts, 21 is the same type of housing with a different shape from the previous figure, 22 is a convex lens installed on the opposite side of the light source 15 with the transparent tube 14 as a boundary, and 23 is this convex lens 22.
24 is a light-shielding mask interposed between the convex lens 22 and the multiplier phototube 23, so that the direct light from the light source 15 is not directed to the multiplier phototube 23. Block entry.
本実施例においては、ダストDによる散乱光が凸レンズ
22によって集光され、かっ増倍型光電管23に導入さ
れるように光学系を組み立てた点が前実施例と異なるが
、他の作用については基本的に同じである。This embodiment differs from the previous embodiment in that the optical system is assembled in such a way that the light scattered by the dust D is collected by a convex lens 22 and introduced into a multiplier phototube 23, but other effects are different. Basically the same.
更に、光学系の配設状態については、本実施例の凸レン
ズ22および増倍型光電管23を光源15の光の方向に
対して角度をもたせて設置してもよい。Furthermore, regarding the arrangement of the optical system, the convex lens 22 and the multiplier phototube 23 of this embodiment may be installed at an angle to the direction of the light from the light source 15.
この場合には、光源15からの直接光が入らないので遮
光マスク24は不要になる。In this case, since direct light from the light source 15 does not enter, the light shielding mask 24 becomes unnecessary.
以上述べてきたように、本発明によれば、ガスのサンプ
リングをしないので全く排気の問題を考えな(てよく、
ガス圧力に対する部品の強度問題についても筺体内に光
学系のみを収納し、電気系を別個に設けるので、それだ
け構造設計を簡素化でき、特にガスを透明管内にのみ通
過させる構造においては簡素化の効果はより大きくなる
。また流量計を付加することにより定量測定も容易にで
き、更に本装置を配管の中途に多点設置すれば、電気系
の統合により一括集中管理システムも可能である。As described above, according to the present invention, since gas sampling is not performed, there is no need to consider the problem of exhaust gas.
Regarding the problem of the strength of parts against gas pressure, since only the optical system is housed in the housing and the electrical system is provided separately, the structural design can be simplified, especially in structures where gas only passes through the transparent tube. The effect will be greater. Furthermore, by adding a flow meter, quantitative measurements can be easily performed, and if this device is installed at multiple points in the middle of the piping, a comprehensive centralized control system can be created by integrating the electrical system.
第1図は本発明の実施例を示す断面図、第2図は本発明
の他の実施例を示す断面図、第3図は従来例を示す図で
ある。
第1図と第2図において、
11、21は筺体、
■2はガス配管、
13a、 13bはロックネジ、
14は透明管、
15は光源、
16、22は凸レンズ、
17は凹面鏡、
18は反射鏡、
19、23は増倍型光電管、
20はカウンタ、24はマスクである。
本娶朗の突覚イ列を木すよケ面囚
第1図
宅セし 1ビ イ列FIG. 1 is a sectional view showing an embodiment of the present invention, FIG. 2 is a sectional view showing another embodiment of the invention, and FIG. 3 is a diagram showing a conventional example. In Figures 1 and 2, 11 and 21 are the housing, 2 is the gas pipe, 13a and 13b are the lock screws, 14 is the transparent tube, 15 is the light source, 16 and 22 are the convex lenses, 17 is the concave mirror, and 18 is the reflective mirror , 19 and 23 are multiplier phototubes, 20 is a counter, and 24 is a mask. Honjoro's sudden A row is shown in the first image of the masked prisoner.
Claims (2)
、21)内に光源(15)、レンズ(16)および増倍
型光電管(19)を有するダスト検知用の光学系を収納
し、 前記増倍型光電管(19)の電気的出力信号を前記筺体
(11、21)外のカウンタ(20)により測定するこ
とを特徴とするガス配管内ダストモニタ装置。(1) A housing (11) installed in the middle of the gas pipe (12)
, 21) houses an optical system for dust detection having a light source (15), a lens (16), and a multiplier phototube (19), and transmits an electrical output signal of the multiplier phototube (19) to the housing. (11, 21) A gas pipe internal dust monitoring device characterized in that measurement is performed using an external counter (20).
)とし、透明管(14)を通るガスのダストを検知する
構成としたことを特徴とする特許請求の範囲第1項記載
の装置。(2) Connect the gas pipe located inside the optical tube to a transparent pipe (14
), and is configured to detect gas dust passing through the transparent tube (14).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26031485A JPS62119434A (en) | 1985-11-20 | 1985-11-20 | Monitor for dust inside gas piping |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26031485A JPS62119434A (en) | 1985-11-20 | 1985-11-20 | Monitor for dust inside gas piping |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62119434A true JPS62119434A (en) | 1987-05-30 |
JPH0519932B2 JPH0519932B2 (en) | 1993-03-18 |
Family
ID=17346300
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP26031485A Granted JPS62119434A (en) | 1985-11-20 | 1985-11-20 | Monitor for dust inside gas piping |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62119434A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002031594A (en) * | 2000-05-12 | 2002-01-31 | Rion Co Ltd | Light scattering type particle detector |
WO2007112210A2 (en) * | 2006-03-23 | 2007-10-04 | Hach Company | Optical design of a particulate measurement system |
CN116223135A (en) * | 2023-05-05 | 2023-06-06 | 南京科力赛克安全设备有限公司 | Integrated sampling equipment convenient to operate and sampling method thereof |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS509482A (en) * | 1973-05-22 | 1975-01-30 | ||
JPS55145350A (en) * | 1979-04-27 | 1980-11-12 | Mitsubishi Electric Corp | Fabricating method of semiconductor device |
JPS5757239A (en) * | 1980-09-25 | 1982-04-06 | Mitsubishi Heavy Ind Ltd | Detector for concentration of powder material |
JPS60156441A (en) * | 1983-09-30 | 1985-08-16 | メツセルシユミツト−ベルコウ−ブロ−ム・ゲゼルシヤフト・ミト・ベシユレンクテル・ハフツング | Hand applicator for surgical laser treatment |
-
1985
- 1985-11-20 JP JP26031485A patent/JPS62119434A/en active Granted
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS509482A (en) * | 1973-05-22 | 1975-01-30 | ||
JPS55145350A (en) * | 1979-04-27 | 1980-11-12 | Mitsubishi Electric Corp | Fabricating method of semiconductor device |
JPS5757239A (en) * | 1980-09-25 | 1982-04-06 | Mitsubishi Heavy Ind Ltd | Detector for concentration of powder material |
JPS60156441A (en) * | 1983-09-30 | 1985-08-16 | メツセルシユミツト−ベルコウ−ブロ−ム・ゲゼルシヤフト・ミト・ベシユレンクテル・ハフツング | Hand applicator for surgical laser treatment |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002031594A (en) * | 2000-05-12 | 2002-01-31 | Rion Co Ltd | Light scattering type particle detector |
WO2007112210A2 (en) * | 2006-03-23 | 2007-10-04 | Hach Company | Optical design of a particulate measurement system |
WO2007112210A3 (en) * | 2006-03-23 | 2008-05-29 | Hach Co | Optical design of a particulate measurement system |
US7525655B2 (en) | 2006-03-23 | 2009-04-28 | Hach Company | Optical design of a particulate measurement system |
CN116223135A (en) * | 2023-05-05 | 2023-06-06 | 南京科力赛克安全设备有限公司 | Integrated sampling equipment convenient to operate and sampling method thereof |
Also Published As
Publication number | Publication date |
---|---|
JPH0519932B2 (en) | 1993-03-18 |
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Legal Events
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