JPS62103548A - リ−ドフレ−ムの欠陥検査装置 - Google Patents

リ−ドフレ−ムの欠陥検査装置

Info

Publication number
JPS62103548A
JPS62103548A JP24474785A JP24474785A JPS62103548A JP S62103548 A JPS62103548 A JP S62103548A JP 24474785 A JP24474785 A JP 24474785A JP 24474785 A JP24474785 A JP 24474785A JP S62103548 A JPS62103548 A JP S62103548A
Authority
JP
Japan
Prior art keywords
lead frame
light
illumination means
image
defects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP24474785A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0575062B2 (enrdf_load_stackoverflow
Inventor
Kazuo Watanabe
一生 渡辺
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dai Nippon Printing Co Ltd
Original Assignee
Dai Nippon Printing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dai Nippon Printing Co Ltd filed Critical Dai Nippon Printing Co Ltd
Priority to JP24474785A priority Critical patent/JPS62103548A/ja
Publication of JPS62103548A publication Critical patent/JPS62103548A/ja
Publication of JPH0575062B2 publication Critical patent/JPH0575062B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP24474785A 1985-10-31 1985-10-31 リ−ドフレ−ムの欠陥検査装置 Granted JPS62103548A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24474785A JPS62103548A (ja) 1985-10-31 1985-10-31 リ−ドフレ−ムの欠陥検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24474785A JPS62103548A (ja) 1985-10-31 1985-10-31 リ−ドフレ−ムの欠陥検査装置

Publications (2)

Publication Number Publication Date
JPS62103548A true JPS62103548A (ja) 1987-05-14
JPH0575062B2 JPH0575062B2 (enrdf_load_stackoverflow) 1993-10-19

Family

ID=17123290

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24474785A Granted JPS62103548A (ja) 1985-10-31 1985-10-31 リ−ドフレ−ムの欠陥検査装置

Country Status (1)

Country Link
JP (1) JPS62103548A (enrdf_load_stackoverflow)

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01237439A (ja) * 1988-03-17 1989-09-21 Toshiba Corp 薄板パターン製品の外観検査装置
JPH0369238U (enrdf_load_stackoverflow) * 1989-11-10 1991-07-09
JPH0434345A (ja) * 1990-05-30 1992-02-05 Dainippon Screen Mfg Co Ltd プリント基板検査装置のためのイメージ読取りシステム
JPH04233440A (ja) * 1990-12-14 1992-08-21 Internatl Business Mach Corp <Ibm> 光学的検査装置
WO2001077652A1 (fr) * 2000-04-10 2001-10-18 Ccs Co., Ltd. Dispositif d'examen de surfaces
KR20010099035A (ko) * 2001-08-14 2001-11-09 - 리드프레임의 도금 및 외관검사방법
US6437312B1 (en) 1999-08-05 2002-08-20 Orbotech, Ltd. Illumination for inspecting surfaces of articles
JP2003315282A (ja) * 2000-04-10 2003-11-06 Ccs Inc 表面検査装置
JP2004012219A (ja) * 2002-06-05 2004-01-15 Hitachi Eng Co Ltd 透明容器内注入液中の異物検出装置
JP2007040913A (ja) * 2005-08-05 2007-02-15 Meinan Mach Works Inc 木材の検査方法及び装置及びプログラム
JP2008096296A (ja) * 2006-10-12 2008-04-24 Lasertec Corp 異物検査方法及びその異物検査方法を用いた異物検査装置
JP2010210373A (ja) * 2009-03-10 2010-09-24 Kyushu Nogeden:Kk 外観検査装置
US7971869B2 (en) 2005-08-31 2011-07-05 Samsung Electronics Co., Ltd. Printing media supply device for image forming apparatus
CN105784714A (zh) * 2016-03-31 2016-07-20 浙江工业大学 一种通过鱼眼透镜组检测货架横梁是否合格的装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50129285A (enrdf_load_stackoverflow) * 1974-04-01 1975-10-13
JPS5495290U (enrdf_load_stackoverflow) * 1977-12-17 1979-07-05

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50129285A (enrdf_load_stackoverflow) * 1974-04-01 1975-10-13
JPS5495290U (enrdf_load_stackoverflow) * 1977-12-17 1979-07-05

Cited By (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01237439A (ja) * 1988-03-17 1989-09-21 Toshiba Corp 薄板パターン製品の外観検査装置
JPH0369238U (enrdf_load_stackoverflow) * 1989-11-10 1991-07-09
JPH0434345A (ja) * 1990-05-30 1992-02-05 Dainippon Screen Mfg Co Ltd プリント基板検査装置のためのイメージ読取りシステム
JPH04233440A (ja) * 1990-12-14 1992-08-21 Internatl Business Mach Corp <Ibm> 光学的検査装置
US6437312B1 (en) 1999-08-05 2002-08-20 Orbotech, Ltd. Illumination for inspecting surfaces of articles
US6832843B2 (en) 1999-08-05 2004-12-21 Orbotech, Ltd. Illumination for inspecting surfaces of articles
JP2003315282A (ja) * 2000-04-10 2003-11-06 Ccs Inc 表面検査装置
US6538729B2 (en) 2000-04-10 2003-03-25 Ccs Co., Ltd. Unit for inspecting a surface
WO2001077652A1 (fr) * 2000-04-10 2001-10-18 Ccs Co., Ltd. Dispositif d'examen de surfaces
KR100635989B1 (ko) * 2000-04-10 2006-10-18 씨씨에스 가부시키가이샤 표면검사장치
KR20010099035A (ko) * 2001-08-14 2001-11-09 - 리드프레임의 도금 및 외관검사방법
JP2004012219A (ja) * 2002-06-05 2004-01-15 Hitachi Eng Co Ltd 透明容器内注入液中の異物検出装置
JP2007040913A (ja) * 2005-08-05 2007-02-15 Meinan Mach Works Inc 木材の検査方法及び装置及びプログラム
US7971869B2 (en) 2005-08-31 2011-07-05 Samsung Electronics Co., Ltd. Printing media supply device for image forming apparatus
JP2008096296A (ja) * 2006-10-12 2008-04-24 Lasertec Corp 異物検査方法及びその異物検査方法を用いた異物検査装置
JP2010210373A (ja) * 2009-03-10 2010-09-24 Kyushu Nogeden:Kk 外観検査装置
CN105784714A (zh) * 2016-03-31 2016-07-20 浙江工业大学 一种通过鱼眼透镜组检测货架横梁是否合格的装置
CN105784714B (zh) * 2016-03-31 2018-05-29 浙江工业大学 一种通过鱼眼透镜组检测货架横梁是否合格的装置

Also Published As

Publication number Publication date
JPH0575062B2 (enrdf_load_stackoverflow) 1993-10-19

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