JPS62102157U - - Google Patents
Info
- Publication number
- JPS62102157U JPS62102157U JP19496585U JP19496585U JPS62102157U JP S62102157 U JPS62102157 U JP S62102157U JP 19496585 U JP19496585 U JP 19496585U JP 19496585 U JP19496585 U JP 19496585U JP S62102157 U JPS62102157 U JP S62102157U
- Authority
- JP
- Japan
- Prior art keywords
- fluorescent
- target
- rays
- filter
- utility
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001228 spectrum Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19496585U JPS62102157U (US07413550-20080819-C00001.png) | 1985-12-18 | 1985-12-18 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19496585U JPS62102157U (US07413550-20080819-C00001.png) | 1985-12-18 | 1985-12-18 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS62102157U true JPS62102157U (US07413550-20080819-C00001.png) | 1987-06-29 |
Family
ID=31152427
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19496585U Pending JPS62102157U (US07413550-20080819-C00001.png) | 1985-12-18 | 1985-12-18 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62102157U (US07413550-20080819-C00001.png) |
-
1985
- 1985-12-18 JP JP19496585U patent/JPS62102157U/ja active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS62102157U (US07413550-20080819-C00001.png) | ||
| JPS60148958U (ja) | 混合ガス中の水蒸気成分の測定装置 | |
| JPS5935858U (ja) | 螢光ｘ線分析装置 | |
| JPS6320053U (US07413550-20080819-C00001.png) | ||
| JPS6138509U (ja) | Ｘ線測定装置 | |
| JPS6065665U (ja) | 放射線分析装置 | |
| JPS637350U (US07413550-20080819-C00001.png) | ||
| JPS58112909U (ja) | Ｘ線膜厚装置 | |
| JPS6054954U (ja) | 微粒子検出装置 | |
| JPS58153807U (ja) | Ｘ線ｃｔ装置 | |
| JPS58112906U (ja) | Ｘ線膜厚装置 | |
| JPH03106451U (US07413550-20080819-C00001.png) | ||
| JPS6288974U (US07413550-20080819-C00001.png) | ||
| ES8304790A1 (es) | Perfeccionamientos en un aparato de analisis radiologico. | |
| JPS61137256U (US07413550-20080819-C00001.png) | ||
| JPS6312153U (US07413550-20080819-C00001.png) | ||
| JPS6293758U (US07413550-20080819-C00001.png) | ||
| JPS6354058U (US07413550-20080819-C00001.png) | ||
| JPH01142850U (US07413550-20080819-C00001.png) | ||
| JPS59103260U (ja) | 放射線応用測定装置 | |
| JPH02150555U (US07413550-20080819-C00001.png) | ||
| JPH02144757U (US07413550-20080819-C00001.png) | ||
| JPS6279150U (US07413550-20080819-C00001.png) | ||
| JPS60165847U (ja) | 赤外線分析計の校正機構 | |
| JPS59109951U (ja) | 放射線透過試験装置 |
