JPS618877U - Ic試験装置の測定ユニツト - Google Patents

Ic試験装置の測定ユニツト

Info

Publication number
JPS618877U
JPS618877U JP9366084U JP9366084U JPS618877U JP S618877 U JPS618877 U JP S618877U JP 9366084 U JP9366084 U JP 9366084U JP 9366084 U JP9366084 U JP 9366084U JP S618877 U JPS618877 U JP S618877U
Authority
JP
Japan
Prior art keywords
measurement unit
coupler
contact
plug
unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9366084U
Other languages
English (en)
Japanese (ja)
Other versions
JPS645258Y2 (enrdf_load_stackoverflow
Inventor
博史 佐藤
雄司 岩永
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP9366084U priority Critical patent/JPS618877U/ja
Publication of JPS618877U publication Critical patent/JPS618877U/ja
Application granted granted Critical
Publication of JPS645258Y2 publication Critical patent/JPS645258Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP9366084U 1984-06-22 1984-06-22 Ic試験装置の測定ユニツト Granted JPS618877U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9366084U JPS618877U (ja) 1984-06-22 1984-06-22 Ic試験装置の測定ユニツト

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9366084U JPS618877U (ja) 1984-06-22 1984-06-22 Ic試験装置の測定ユニツト

Publications (2)

Publication Number Publication Date
JPS618877U true JPS618877U (ja) 1986-01-20
JPS645258Y2 JPS645258Y2 (enrdf_load_stackoverflow) 1989-02-09

Family

ID=30651537

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9366084U Granted JPS618877U (ja) 1984-06-22 1984-06-22 Ic試験装置の測定ユニツト

Country Status (1)

Country Link
JP (1) JPS618877U (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS645258Y2 (enrdf_load_stackoverflow) 1989-02-09

Similar Documents

Publication Publication Date Title
JPS618877U (ja) Ic試験装置の測定ユニツト
JPS5821879U (ja) 電子回路試験装置
JPS59125837U (ja) 半導体検査装置
JPS59176977U (ja) 半導体装置の試験装置
JPS59187144U (ja) 半導体装置用試験装置
JPS608882U (ja) インサ−キツトテスタ用フイクスチユア
JPS62174283U (enrdf_load_stackoverflow)
JPH0263565U (enrdf_load_stackoverflow)
JPS59180446U (ja) Lsiパツケ−ジ
JPS59121872U (ja) 小型電子機器の試験端子板
JPS6117680U (ja) 半導体装置の検査治具
JPH0463134U (enrdf_load_stackoverflow)
JPS61102042U (enrdf_load_stackoverflow)
JPH0399438U (enrdf_load_stackoverflow)
JPS5941764U (ja) Icテスタ用パ−フオマンスボ−ド
JPS60191979U (ja) フイクスチヤ
JPS60163374U (ja) 試験装置の接続具
JPS60141140U (ja) Icテスト用ソケツト
JPS6197774U (enrdf_load_stackoverflow)
JPS62158561U (enrdf_load_stackoverflow)
JPS58148934U (ja) 集積回路測定装置
JPS60109326U (ja) 半導体疑似試験装置
JPS59185900U (ja) 素子リ−ド検出装置
JPS6099564U (ja) 印刷配線板
JPS59168173U (ja) プリント基板回路検査用プロ−ブユニツト