JPS6167817A - Semiconductor laser light scanner - Google Patents

Semiconductor laser light scanner

Info

Publication number
JPS6167817A
JPS6167817A JP59191022A JP19102284A JPS6167817A JP S6167817 A JPS6167817 A JP S6167817A JP 59191022 A JP59191022 A JP 59191022A JP 19102284 A JP19102284 A JP 19102284A JP S6167817 A JPS6167817 A JP S6167817A
Authority
JP
Japan
Prior art keywords
scanning
semiconductor laser
lens
laser light
laser beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP59191022A
Other languages
Japanese (ja)
Inventor
Osamu Ito
修 伊藤
Masaichiro Tachikawa
雅一郎 立川
Hiroshi Wakahara
廣 若原
Yasuhiro Ozawa
小沢 康宏
Hironori Ono
小野 広則
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP59191022A priority Critical patent/JPS6167817A/en
Publication of JPS6167817A publication Critical patent/JPS6167817A/en
Pending legal-status Critical Current

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  • Facsimile Scanning Arrangements (AREA)

Abstract

PURPOSE:To compensate the scanning shift value of laser light scanning and to attain highly accurate scanning by moving a semiconductor laser and a collimator lens in accordance with the detected scanning shift value. CONSTITUTION:Light from the semiconductor laser 8 is collimated by the collimator lens 9 and the parallel light is scanned by the rotation of a rotary polyhedral mirror 10 and formed at its image on a photosensitive body 12 by an ftheta lens 11 to scan the photosensitive body 12 at a constant speed. A part of the laser light is formed on the photodetecting surface of a synchronization detecter 13, which applies a write starting signal in each scanning line to a semiconductor laser driving device 14 to synchronize the scanning as to the turning direction of the photosensitive body 12. The scanning line on the photosensitive body 12 is shifted in the H direction by the turn or the like of respective reflecting surfaces of the mirror 10 in the G direction, the shift is detected by a device 15 and a moving device 16 moves the lens 9 in the J direction in accordance with the detected shift value to compensate the shift value.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、半導体レーザビームプリンタ等に用いられる
半導体レーザ光走査装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a semiconductor laser beam scanning device used in semiconductor laser beam printers and the like.

従来例の構成とその問題点 近年、半導体技術の進歩に伴ない半導体レーザは年々信
頼性が向上し、かつ価格も安くなっている。これに加え
て、半導体レーザは小型でがっ直接変調が可能であると
いう特徴を持つため、その利用分野が急速に広がってお
り、半導体レーザビーム走査装置にも、一層の高精度化
が要求されている。
Conventional Structures and Their Problems In recent years, as semiconductor technology has progressed, semiconductor lasers have become more reliable and cheaper year by year. In addition, semiconductor lasers are small and can be directly modulated, so their field of use is rapidly expanding, and semiconductor laser beam scanning devices are also required to have even higher precision. ing.

以下、半導体レーザビーム走査装置を利用した典型的な
例として、半導体レーザビームプリンタを取りあげ、説
明を行なう。
Hereinafter, a semiconductor laser beam printer will be explained as a typical example using a semiconductor laser beam scanning device.

以下、図面を参照しながら従来の半導体レーザビームプ
リンタについて説明する。第1図は従来の半導体レーザ
ビームプリンタの斜視図であシ、1は半導体レーザ、2
はコリメートレンズ、3は回転多面鏡、4はfθレンズ
、5は感光体、6は同期検出装置、7は半導体レーザ駆
動装置である。
A conventional semiconductor laser beam printer will be described below with reference to the drawings. Figure 1 is a perspective view of a conventional semiconductor laser beam printer.
3 is a collimating lens, 3 is a rotating polygon mirror, 4 is an fθ lens, 5 is a photoreceptor, 6 is a synchronization detection device, and 7 is a semiconductor laser drive device.

以上の様に構成された半導体レーザビームプリンタにつ
いて、その動作を以下に説明する。半導体レーザ1から
発せられたレーザ光は、コリメートレンズ2によって平
行レーザ光となり、回転多面鏡3に入射する。回転多面
鏡30図中矢印人方向の回転により、平行レーザ光は図
中矢印B方向に走査され、さらにfθレンズ4によって
感光体6上に結像され、感光体6上を図中矢印C方向に
等速走査する。さらに感光体6が図中矢印り方向に回転
することによって感光体5上に平面走査が行なわれる。
The operation of the semiconductor laser beam printer configured as above will be described below. A laser beam emitted from a semiconductor laser 1 is converted into a parallel laser beam by a collimating lens 2, and is incident on a rotating polygon mirror 3. By rotating the rotating polygon mirror 30 in the direction of the arrow in the figure, the parallel laser beam is scanned in the direction of the arrow B in the figure, and is further imaged onto the photoconductor 6 by the fθ lens 4, and then scanned on the photoconductor 6 in the direction of the arrow C in the figure. Scan at a constant speed. Further, by rotating the photoreceptor 6 in the direction indicated by the arrow in the figure, a plane scan is performed on the photoreceptor 5.

レーザ光の一部は同期検出装置6の受光面に結像する。A portion of the laser light forms an image on the light receiving surface of the synchronization detection device 6.

同期検出装置6は、半導体レーザ駆動装置7に、−走査
線毎の書き込み開始信号を与え感光体60回転方向に関
して走査の同期をとる。
The synchronization detection device 6 provides a write start signal for each -scanning line to the semiconductor laser drive device 7, and synchronizes scanning with respect to the rotational direction of the photoreceptor 60.

しかしながら、上記のような構成においては、回転多面
鏡3の各鏡面の図中矢印E方向の倒れによって、レーザ
走査光が感光体S上のF方向にずれ、画質が低下すると
いう問題点を有していた。
However, in the above configuration, there is a problem that the laser scanning light is shifted in the F direction on the photoreceptor S due to the tilting of each mirror surface of the rotating polygon mirror 3 in the direction of the arrow E in the figure, resulting in a decrease in image quality. Was.

発明の目的 本発明の目的は高精度の走査を可能とする半導体レーザ
ビーム走査装置を提供することである。
OBJECTS OF THE INVENTION An object of the present invention is to provide a semiconductor laser beam scanning device that enables highly accurate scanning.

発明の構成 本発明の半導体レーザビーム走査装置は、光源となる半
導体レーザと、前記半導体レーザが発するレーザ光を平
行レーザ光とするコリメートレンズと、第1の方向に対
して前記レーザ光の走査を行なうレーザ光走査手段と、
前記レーザ光の前記走査の前記第1の方向と平行でない
第2の方向の走査ずれ量を検出する走査ずれ量検出手段
と、前記走査ずれ量検出手段によって検出される走査ず
れ量に応じて、前記半導体レーザと前記コリメー、トレ
ンズを前記第1の方向に対応する方向に相対的に移動さ
せる光学系移動手段とを具備するように構成したもので
ちゃ、これにより、レーザ光走査の走査ずれ量を補正し
、高精度の走査を行なうものである。
Structure of the Invention A semiconductor laser beam scanning device of the present invention includes a semiconductor laser serving as a light source, a collimating lens that converts laser light emitted by the semiconductor laser into parallel laser light, and scanning the laser light in a first direction. a laser beam scanning means for performing the scanning;
a scanning deviation amount detection means for detecting a scanning deviation amount in a second direction that is not parallel to the first direction of the scanning of the laser beam, and according to the scanning deviation amount detected by the scanning deviation amount detection means, The device may be configured to include an optical system moving means for relatively moving the semiconductor laser, the collimator, and the lens in a direction corresponding to the first direction. The system corrects this and performs highly accurate scanning.

実施例の説明 以下、本発明の一実施例について、図面を参照しながら
説明する。
DESCRIPTION OF EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings.

第2図は、本発明の一実施例における半導体レーザビー
ムプリンタの斜視図であり、8は半導体レーザ、9はコ
リメートレンズ、1oは回転多面鏡、11はfθレンズ
、12は感光体、13は同期検出装置、14は半導体レ
ーザ駆動装置、16は走査ずれ量検出装置、16はコリ
メートレンズ移動装置である。
FIG. 2 is a perspective view of a semiconductor laser beam printer according to an embodiment of the present invention, in which 8 is a semiconductor laser, 9 is a collimating lens, 1o is a rotating polygon mirror, 11 is an fθ lens, 12 is a photoreceptor, and 13 is a 14 is a semiconductor laser drive device, 16 is a scanning deviation amount detection device, and 16 is a collimating lens moving device.

以上の様に構成された本実施例の半導体レーザビームプ
リンタについて、以下その動作を説明する。但し、8〜
14の基本的な動作については第1図の1〜7の動作と
同様であるので説明を省略する1、 回転多面鏡10の各反へ射面の図中矢印G方向の倒れ等
によって感光体12上のレーザ光の走査線は図中矢印H
方向にずれる。走査ずれ量検出装置16は、このずれ量
を検出する。検出されたずれ量に応じて、コリメートレ
ンズ移動装置16はコリメートレンズ9を図中矢印J方
向に移動し、ずれ量を補正する。
The operation of the semiconductor laser beam printer of this embodiment configured as described above will be described below. However, 8~
The basic operations of 14 are the same as those of 1 to 7 in FIG. 1, so their explanation will be omitted. The scanning line of the laser beam on 12 is indicated by arrow H in the figure.
direction. The scanning deviation amount detection device 16 detects this deviation amount. According to the detected amount of deviation, the collimating lens moving device 16 moves the collimating lens 9 in the direction of arrow J in the figure to correct the amount of deviation.

コリメートレンズ9の移動によって、走査線のずれをど
の程度補正できるかを、第3図を用いて説明する。第3
図は、本発明の一実施例における半導体レーザビームプ
リンタの正面図である。
The extent to which the shift in the scanning line can be corrected by moving the collimating lens 9 will be explained with reference to FIG. Third
The figure is a front view of a semiconductor laser beam printer in an embodiment of the present invention.

17は半導体レーザ、18はコリメートレンズ、19は
fθレンズ、2oはレーザ光結像線、21はfθレンズ
19の光軸である。また、半導体レーザ17の発光点は
、fθレンズ19の光軸上に位置する。さらに、第3図
において、aはコリメートレンズ18の光軸とfθレン
ズ19の光軸21とのずれ量、θはコリメートレンズ1
8を通過後のレーザ光と光軸21との傾き、bは結像点
と光軸21のずれ量、f’、、f2はそれぞれコリメー
トレンズ18、fθレンズ19の焦点距離、図中矢印に
は第2図中の矢印H,Jに対応する方向を示す矢印であ
る。第3図より、θは下式にて求められる。
17 is a semiconductor laser, 18 is a collimating lens, 19 is an fθ lens, 2o is a laser beam imaging line, and 21 is an optical axis of the fθ lens 19. Further, the light emitting point of the semiconductor laser 17 is located on the optical axis of the fθ lens 19. Furthermore, in FIG. 3, a is the amount of deviation between the optical axis of the collimating lens 18 and the optical axis 21 of the fθ lens 19, and θ is the amount of deviation between the optical axis of the collimating lens 18 and the optical axis 21 of the fθ lens 19.
8 is the inclination of the laser beam and the optical axis 21, b is the amount of deviation between the imaging point and the optical axis 21, f', and f2 are the focal lengths of the collimating lens 18 and fθ lens 19, respectively, and are indicated by the arrows in the figure. is an arrow indicating a direction corresponding to arrows H and J in FIG. From FIG. 3, θ can be determined by the following formula.

θ=a/f、           ・・・・・・(1
)fθレンズの特性から、 b=f2θ           ・川・・(2)(1
) 、 (2)式より fl & =−b                ・・・・
・・(3)走査線のずれ量は、通常、 5626μm         ・・・・・・(4)程
度であり、また光学系としては、 f、=  10順        ・旧・・(6)f2
=260ytpr         ・・・・・・(6
)程度に設計される。
θ=a/f, ・・・・・・(1
) From the characteristics of the fθ lens, b = f2θ ・River... (2) (1
), From formula (2), fl & =-b...
... (3) The amount of deviation of the scanning line is usually about 5626 μm ... (4) and as an optical system, f, = 10 order - Old ... (6) f2
=260ytpr (6
) is designed to a certain degree.

(4)〜(6)式を(3)式に代入して、a≦1μm 
         ・・・・・・(7)が得られ、コリ
メートレンズ18をわずかに変位させるだけで、レーザ
光走査線のずれ量の補正が可能である事がわかる。
Substituting equations (4) to (6) into equation (3), a≦1μm
. . . (7) is obtained, and it can be seen that the amount of deviation of the laser beam scanning line can be corrected by only slightly displacing the collimating lens 18.

まだ、第2図のコリメートレンズ移動装置16は電歪効
果を持つ材料を用いて構成しているため、簡易な構成で
(7)式で表わされるような微小な変位を精度良く実現
している。
However, since the collimating lens moving device 16 shown in FIG. 2 is constructed using a material that has an electrostrictive effect, it is possible to accurately realize minute displacement as expressed by equation (7) with a simple configuration. .

発明の効果 以上の説明から明らかなように、本発明による半導体レ
ーザ走査装置は光源となる半導体レーザと、前記半導体
レーザが発するレーザ光を平行レーXザ光とするコリメ
ートレンズと、第1の方向に対して前記レーザ光の走査
を行なうレーザ光走査手段と、前記レーザ光の前記走査
の前記第1の方向と平行でない第2の方向の走査ずれ量
を検出する走査ずれ量検出手段と、前記走査ずれ量検出
手段によって検出される走査ずれ量に応じて、前記半導
体レーザと前記コリメートレンズを前記第1の方向に対
応する方向に相対的に移動させる光学系移動手段とを具
備するように構成しているので、レーザ走査光の走査ず
れ量を補正し、高精度の走査が行なえるという優れた効
果が得られる。
Effects of the Invention As is clear from the above description, the semiconductor laser scanning device according to the present invention includes a semiconductor laser serving as a light source, a collimating lens that transforms the laser light emitted by the semiconductor laser into parallel laser X laser light, and a first direction. a scanning deviation amount detection means for detecting a scanning deviation amount in a second direction not parallel to the first direction of the scanning of the laser beam; Optical system moving means for relatively moving the semiconductor laser and the collimating lens in a direction corresponding to the first direction according to the scanning deviation amount detected by the scanning deviation amount detection means. Therefore, the excellent effect of correcting the amount of scanning deviation of the laser scanning light and performing highly accurate scanning can be obtained.

さらに、光学系移動手段に電歪効果を持つ部材を利用す
ることにより、簡易な構成で、半導体レーザとコリメー
トレンズの相対的移動を精度良く実現できるという効果
が得られる。
Further, by using a member having an electrostrictive effect in the optical system moving means, it is possible to achieve the effect that relative movement between the semiconductor laser and the collimating lens can be realized with high accuracy with a simple configuration.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の半導体レーザビームプリンタの斜視図、
第2図は本発明の一実施例における半導体レーザ光走査
装置の斜視図、第3図は同正面図である。 8.17・・・・・・半導体レーザ、9,18・・・・
・・コリメートレンズ、1o・・・・・・回転多面鏡、
16・・・・・・走査ずれ量検出装置、16・・・・・
・コリメートレンズ移動装置。 代理人の氏名 弁理士 中 尾 敏 男 ほか1名第3
図 IK
Figure 1 is a perspective view of a conventional semiconductor laser beam printer.
FIG. 2 is a perspective view of a semiconductor laser beam scanning device according to an embodiment of the present invention, and FIG. 3 is a front view thereof. 8.17... Semiconductor laser, 9,18...
...Collimating lens, 1o...Rotating polygon mirror,
16...Scanning deviation amount detection device, 16...
・Collimator lens moving device. Name of agent: Patent attorney Toshio Nakao and 1 other person No. 3
Figure IK

Claims (2)

【特許請求の範囲】[Claims] (1)光源となる半導体レーザと、前記半導体レーザが
発するレーザ光を平行レーザ光とするコリメートレンズ
と、第1の方向に対して前記レーザ光の走査を行なうレ
ーザ光走査手段と、前記レーザ光の前記走査の前記第1
の方向と平行でない第2の方向の走査ずれ量を検出する
走査ずれ量検出手段と、前記走査ずれ量検出手段によっ
て検出される走査ずれ量に応じて前記半導体レーザと前
記コリメートレンズを前記第2の方向に対応する方向に
相対的に移動させる光学系移動手段とを具備する事を特
徴とする半導体レーザ光走査装置。
(1) A semiconductor laser serving as a light source, a collimating lens that converts the laser light emitted by the semiconductor laser into parallel laser light, a laser light scanning unit that scans the laser light in a first direction, and the laser light the first of the scans of
scanning deviation amount detection means for detecting a scanning deviation amount in a second direction that is not parallel to the direction of 1. A semiconductor laser beam scanning device comprising an optical system moving means for moving the optical system relatively in a direction corresponding to the direction.
(2)光学系移動手段に電歪効果を持つ部材を利用した
ことを特徴とする特許請求の範囲第1項記載の半導体レ
ーザ光走査装置。
(2) A semiconductor laser beam scanning device according to claim 1, wherein a member having an electrostrictive effect is used for the optical system moving means.
JP59191022A 1984-09-12 1984-09-12 Semiconductor laser light scanner Pending JPS6167817A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59191022A JPS6167817A (en) 1984-09-12 1984-09-12 Semiconductor laser light scanner

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59191022A JPS6167817A (en) 1984-09-12 1984-09-12 Semiconductor laser light scanner

Publications (1)

Publication Number Publication Date
JPS6167817A true JPS6167817A (en) 1986-04-08

Family

ID=16267585

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59191022A Pending JPS6167817A (en) 1984-09-12 1984-09-12 Semiconductor laser light scanner

Country Status (1)

Country Link
JP (1) JPS6167817A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6324520U (en) * 1986-07-31 1988-02-18
JPS6490435A (en) * 1987-10-01 1989-04-06 Fuji Photo Film Co Ltd Radiograph information reader
US5627670A (en) * 1989-07-05 1997-05-06 Canon Kabushiki Kaisha Scanning optical apparatus having beam scan controller

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6324520U (en) * 1986-07-31 1988-02-18
JPS6490435A (en) * 1987-10-01 1989-04-06 Fuji Photo Film Co Ltd Radiograph information reader
US5627670A (en) * 1989-07-05 1997-05-06 Canon Kabushiki Kaisha Scanning optical apparatus having beam scan controller

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