JPS6156539B2 - - Google Patents

Info

Publication number
JPS6156539B2
JPS6156539B2 JP55026320A JP2632080A JPS6156539B2 JP S6156539 B2 JPS6156539 B2 JP S6156539B2 JP 55026320 A JP55026320 A JP 55026320A JP 2632080 A JP2632080 A JP 2632080A JP S6156539 B2 JPS6156539 B2 JP S6156539B2
Authority
JP
Japan
Prior art keywords
signal
signal processing
test signal
test
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55026320A
Other languages
English (en)
Japanese (ja)
Other versions
JPS56123044A (en
Inventor
Masahiko Iijima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP2632080A priority Critical patent/JPS56123044A/ja
Publication of JPS56123044A publication Critical patent/JPS56123044A/ja
Publication of JPS6156539B2 publication Critical patent/JPS6156539B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP2632080A 1980-03-03 1980-03-03 Digital signal processing device having selfdiagnostic function Granted JPS56123044A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2632080A JPS56123044A (en) 1980-03-03 1980-03-03 Digital signal processing device having selfdiagnostic function

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2632080A JPS56123044A (en) 1980-03-03 1980-03-03 Digital signal processing device having selfdiagnostic function

Publications (2)

Publication Number Publication Date
JPS56123044A JPS56123044A (en) 1981-09-26
JPS6156539B2 true JPS6156539B2 (zh) 1986-12-03

Family

ID=12190095

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2632080A Granted JPS56123044A (en) 1980-03-03 1980-03-03 Digital signal processing device having selfdiagnostic function

Country Status (1)

Country Link
JP (1) JPS56123044A (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4752729A (en) * 1986-07-01 1988-06-21 Texas Instruments Incorporated Test circuit for VSLI integrated circuits

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50158245A (zh) * 1974-06-11 1975-12-22
JPS526436A (en) * 1975-07-04 1977-01-18 Nec Corp Electronic circuit test system
JPS5222840A (en) * 1975-08-15 1977-02-21 Hitachi Ltd Logical circuit

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50158245A (zh) * 1974-06-11 1975-12-22
JPS526436A (en) * 1975-07-04 1977-01-18 Nec Corp Electronic circuit test system
JPS5222840A (en) * 1975-08-15 1977-02-21 Hitachi Ltd Logical circuit

Also Published As

Publication number Publication date
JPS56123044A (en) 1981-09-26

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