JPS6155848A - 誘導結合プラズマをイオン源とした質量分析装置 - Google Patents
誘導結合プラズマをイオン源とした質量分析装置Info
- Publication number
- JPS6155848A JPS6155848A JP59178869A JP17886984A JPS6155848A JP S6155848 A JPS6155848 A JP S6155848A JP 59178869 A JP59178869 A JP 59178869A JP 17886984 A JP17886984 A JP 17886984A JP S6155848 A JPS6155848 A JP S6155848A
- Authority
- JP
- Japan
- Prior art keywords
- contact
- nozzle
- icp
- ion source
- plasma
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/12—Ion sources; Ion guns using an arc discharge, e.g. of the duoplasmatron type
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59178869A JPS6155848A (ja) | 1984-08-28 | 1984-08-28 | 誘導結合プラズマをイオン源とした質量分析装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59178869A JPS6155848A (ja) | 1984-08-28 | 1984-08-28 | 誘導結合プラズマをイオン源とした質量分析装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6155848A true JPS6155848A (ja) | 1986-03-20 |
| JPH0322015B2 JPH0322015B2 (enExample) | 1991-03-26 |
Family
ID=16056107
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59178869A Granted JPS6155848A (ja) | 1984-08-28 | 1984-08-28 | 誘導結合プラズマをイオン源とした質量分析装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6155848A (enExample) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6489256A (en) * | 1987-09-30 | 1989-04-03 | Yokogawa Electric Corp | High-frequency inductive coupling plasma mass spectrometer |
| JPH02312154A (ja) * | 1989-05-26 | 1990-12-27 | Jeol Ltd | 高周波誘導結合プラズマ質量分析装置 |
| JPH05500286A (ja) * | 1989-01-30 | 1993-01-21 | フィソンズ・パブリック・リミテッド・カンパニー | プラズマ質量分析計 |
| CN105355534A (zh) * | 2015-11-23 | 2016-02-24 | 中国科学院地质与地球物理研究所 | 一种实现电感耦合等离子体离子源工作在惰性气体环境的方法及装置 |
-
1984
- 1984-08-28 JP JP59178869A patent/JPS6155848A/ja active Granted
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6489256A (en) * | 1987-09-30 | 1989-04-03 | Yokogawa Electric Corp | High-frequency inductive coupling plasma mass spectrometer |
| JPH05500286A (ja) * | 1989-01-30 | 1993-01-21 | フィソンズ・パブリック・リミテッド・カンパニー | プラズマ質量分析計 |
| JPH02312154A (ja) * | 1989-05-26 | 1990-12-27 | Jeol Ltd | 高周波誘導結合プラズマ質量分析装置 |
| CN105355534A (zh) * | 2015-11-23 | 2016-02-24 | 中国科学院地质与地球物理研究所 | 一种实现电感耦合等离子体离子源工作在惰性气体环境的方法及装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0322015B2 (enExample) | 1991-03-26 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| EXPY | Cancellation because of completion of term |