JPS6152979B2 - - Google Patents

Info

Publication number
JPS6152979B2
JPS6152979B2 JP4211578A JP4211578A JPS6152979B2 JP S6152979 B2 JPS6152979 B2 JP S6152979B2 JP 4211578 A JP4211578 A JP 4211578A JP 4211578 A JP4211578 A JP 4211578A JP S6152979 B2 JPS6152979 B2 JP S6152979B2
Authority
JP
Japan
Prior art keywords
street
detection
illumination
detected
semiconductor wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP4211578A
Other languages
English (en)
Japanese (ja)
Other versions
JPS54134982A (en
Inventor
Yukio Kenbo
Tomohiro Kuji
Hiroshi Makihira
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP4211578A priority Critical patent/JPS54134982A/ja
Priority to US05/964,353 priority patent/US4213117A/en
Publication of JPS54134982A publication Critical patent/JPS54134982A/ja
Publication of JPS6152979B2 publication Critical patent/JPS6152979B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Dicing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP4211578A 1977-11-28 1978-04-12 Detector for street position on semiconductor wafer Granted JPS54134982A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP4211578A JPS54134982A (en) 1978-04-12 1978-04-12 Detector for street position on semiconductor wafer
US05/964,353 US4213117A (en) 1977-11-28 1978-11-28 Method and apparatus for detecting positions of chips on a semiconductor wafer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4211578A JPS54134982A (en) 1978-04-12 1978-04-12 Detector for street position on semiconductor wafer

Publications (2)

Publication Number Publication Date
JPS54134982A JPS54134982A (en) 1979-10-19
JPS6152979B2 true JPS6152979B2 (ko) 1986-11-15

Family

ID=12626944

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4211578A Granted JPS54134982A (en) 1977-11-28 1978-04-12 Detector for street position on semiconductor wafer

Country Status (1)

Country Link
JP (1) JPS54134982A (ko)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5788414A (en) * 1980-11-21 1982-06-02 Seiko Epson Corp Alignment device
JP5700436B2 (ja) * 2011-06-07 2015-04-15 株式会社ディスコ 加工装置

Also Published As

Publication number Publication date
JPS54134982A (en) 1979-10-19

Similar Documents

Publication Publication Date Title
US6141038A (en) Alignment correction prior to image sampling in inspection systems
US6291816B1 (en) System and method for measuring object features with coordinated two and three dimensional imaging
US4213117A (en) Method and apparatus for detecting positions of chips on a semiconductor wafer
KR100898963B1 (ko) 라인 광 스팟으로 2차원 이미지화를 수행하는 검사 시스템
US5101442A (en) Three-dimensional imaging technique using sharp gradient of illumination
KR960005090B1 (ko) 본딩와이어 검사장치
US4557602A (en) Edge detector in optical measuring instrument
US4875779A (en) Lead inspection system for surface-mounted circuit packages
JPS6152979B2 (ko)
JP3135063B2 (ja) 比較検査方法および装置
JPH0156682B2 (ko)
JPH10185830A (ja) 透明シート検査装置
JP3189796B2 (ja) 欠陥検査方法及び装置
JP3126282B2 (ja) 物品有無検出装置
JPH01227910A (ja) 光学検査装置
JPS6379342A (ja) アライメント装置
JPS624851B2 (ko)
JP3232811B2 (ja) 実装済みプリント基板の検査方法
JP2818597B2 (ja) パターン検査方法
KR0152582B1 (ko) 무패턴 기판의 결함 자동검색장치 및 그 검색방법
JP2986130B2 (ja) マークの検出処理方法
JPH09287928A (ja) Ic外観検査装置
JPH04291110A (ja) 光分割型高さ測定装置
JPS61126405A (ja) 位置検査装置
JPH07167623A (ja) Icリード高さ測定装置