JPS6146465Y2 - - Google Patents
Info
- Publication number
- JPS6146465Y2 JPS6146465Y2 JP17260780U JP17260780U JPS6146465Y2 JP S6146465 Y2 JPS6146465 Y2 JP S6146465Y2 JP 17260780 U JP17260780 U JP 17260780U JP 17260780 U JP17260780 U JP 17260780U JP S6146465 Y2 JPS6146465 Y2 JP S6146465Y2
- Authority
- JP
- Japan
- Prior art keywords
- wiring
- contacts
- continuity
- probe
- wiring board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 20
- 239000000523 sample Substances 0.000 claims description 18
- 238000007689 inspection Methods 0.000 description 6
- 238000000034 method Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000004806 packaging method and process Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17260780U JPS6146465Y2 (instruction) | 1980-12-03 | 1980-12-03 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17260780U JPS6146465Y2 (instruction) | 1980-12-03 | 1980-12-03 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5794870U JPS5794870U (instruction) | 1982-06-11 |
| JPS6146465Y2 true JPS6146465Y2 (instruction) | 1986-12-27 |
Family
ID=29530900
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17260780U Expired JPS6146465Y2 (instruction) | 1980-12-03 | 1980-12-03 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6146465Y2 (instruction) |
-
1980
- 1980-12-03 JP JP17260780U patent/JPS6146465Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5794870U (instruction) | 1982-06-11 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6249114B1 (en) | Electronic component continuity inspection method and apparatus | |
| JPS6146465Y2 (instruction) | ||
| US7795891B2 (en) | Tester with low signal attenuation | |
| JP2000232141A (ja) | 半導体パッケージ用基板の導通検査方法 | |
| JP2000074975A (ja) | 基板検査装置および基板検査方法 | |
| JP2948802B2 (ja) | 電気接続用部材 | |
| KR100218499B1 (ko) | 프로빙 측정 방법 및 측정용 패드 | |
| JPH0533972Y2 (instruction) | ||
| JPH0533973Y2 (instruction) | ||
| JPS62261972A (ja) | 基板検査装置 | |
| JPH0666869A (ja) | 半導体テスタ及び半導体テスタのプローブ針の電気的導 通判定方法 | |
| JPS58155374A (ja) | プリント基板のテスト装置 | |
| JPH0219745Y2 (instruction) | ||
| JPH0815361A (ja) | プリント配線板の検査方法 | |
| KR20240073639A (ko) | 4-와이어 프로브 방식의 테스트 장치 | |
| KR980012185A (ko) | 웨이퍼의 전기적 테스트 장치 | |
| JP3060535B2 (ja) | 導線検査方法および装置 | |
| JPH0432757Y2 (instruction) | ||
| JPH10307149A (ja) | 電気接続用部材及びそれを用いた電気測定方法 | |
| JPS5828360Y2 (ja) | Ｉｃクリツプ | |
| JPS6361966A (ja) | 加圧導電ゴム利用による配線板の回路導通検査方法 | |
| JPS6137776B2 (instruction) | ||
| JPH07104023A (ja) | プリント基板検査方法 | |
| JPS62130364A (ja) | 印刷配線板の検査方法 | |
| JPH08304486A (ja) | 四端子測定用接触子構造 |