JPS6143854B2 - - Google Patents

Info

Publication number
JPS6143854B2
JPS6143854B2 JP17041380A JP17041380A JPS6143854B2 JP S6143854 B2 JPS6143854 B2 JP S6143854B2 JP 17041380 A JP17041380 A JP 17041380A JP 17041380 A JP17041380 A JP 17041380A JP S6143854 B2 JPS6143854 B2 JP S6143854B2
Authority
JP
Japan
Prior art keywords
probe card
socket
probe
contact
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP17041380A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5793543A (en
Inventor
Hiromi Takano
Atsushi Nigorikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP17041380A priority Critical patent/JPS5793543A/ja
Publication of JPS5793543A publication Critical patent/JPS5793543A/ja
Publication of JPS6143854B2 publication Critical patent/JPS6143854B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP17041380A 1980-12-03 1980-12-03 Measuring system for semiconductor element Granted JPS5793543A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17041380A JPS5793543A (en) 1980-12-03 1980-12-03 Measuring system for semiconductor element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17041380A JPS5793543A (en) 1980-12-03 1980-12-03 Measuring system for semiconductor element

Publications (2)

Publication Number Publication Date
JPS5793543A JPS5793543A (en) 1982-06-10
JPS6143854B2 true JPS6143854B2 (enEXAMPLES) 1986-09-30

Family

ID=15904457

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17041380A Granted JPS5793543A (en) 1980-12-03 1980-12-03 Measuring system for semiconductor element

Country Status (1)

Country Link
JP (1) JPS5793543A (enEXAMPLES)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5972148A (ja) * 1982-09-14 1984-04-24 アキユテスト・コ−ポレ−シヨン 電子回路ウエ−ハ−検査装置
JPS5960559U (ja) * 1982-10-15 1984-04-20 株式会社アドバンテスト 接続端子浮動機構
JPS59138345A (ja) * 1983-01-27 1984-08-08 Rohm Co Ltd プロ−ブカ−ド
JPS60143372U (ja) * 1984-03-06 1985-09-24 株式会社東芝 半導体素子の電気特性測定装置
JPH0637337Y2 (ja) * 1986-01-29 1994-09-28 横河・ヒユ−レツト・パツカ−ド株式会社 プロ−ブ装置

Also Published As

Publication number Publication date
JPS5793543A (en) 1982-06-10

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