JPS6137562B2 - - Google Patents
Info
- Publication number
- JPS6137562B2 JPS6137562B2 JP53030915A JP3091578A JPS6137562B2 JP S6137562 B2 JPS6137562 B2 JP S6137562B2 JP 53030915 A JP53030915 A JP 53030915A JP 3091578 A JP3091578 A JP 3091578A JP S6137562 B2 JPS6137562 B2 JP S6137562B2
- Authority
- JP
- Japan
- Prior art keywords
- bar
- signal
- pulse
- electro
- camera
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 claims description 83
- 238000012937 correction Methods 0.000 claims description 40
- 230000006870 function Effects 0.000 claims description 34
- 230000004044 response Effects 0.000 claims description 34
- 238000000034 method Methods 0.000 claims description 27
- 230000003287 optical effect Effects 0.000 claims description 27
- 230000002457 bidirectional effect Effects 0.000 claims description 25
- 239000000463 material Substances 0.000 claims description 19
- 239000000203 mixture Substances 0.000 claims description 19
- 238000000691 measurement method Methods 0.000 claims description 13
- 230000008569 process Effects 0.000 claims description 10
- 230000000694 effects Effects 0.000 claims description 5
- 238000003708 edge detection Methods 0.000 claims description 4
- 238000004519 manufacturing process Methods 0.000 claims description 4
- 230000002441 reversible effect Effects 0.000 claims description 4
- 230000002093 peripheral effect Effects 0.000 claims description 2
- 239000000872 buffer Substances 0.000 description 41
- 238000010586 diagram Methods 0.000 description 31
- 239000004020 conductor Substances 0.000 description 29
- 238000005096 rolling process Methods 0.000 description 29
- 238000012546 transfer Methods 0.000 description 25
- 238000004590 computer program Methods 0.000 description 15
- 238000003860 storage Methods 0.000 description 13
- 230000003993 interaction Effects 0.000 description 12
- 230000008859 change Effects 0.000 description 11
- 230000000007 visual effect Effects 0.000 description 10
- 239000002184 metal Substances 0.000 description 8
- 230000005284 excitation Effects 0.000 description 7
- 238000012360 testing method Methods 0.000 description 7
- 229910000831 Steel Inorganic materials 0.000 description 6
- 230000001343 mnemonic effect Effects 0.000 description 6
- 238000012545 processing Methods 0.000 description 6
- 239000010959 steel Substances 0.000 description 6
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 5
- 230000009471 action Effects 0.000 description 5
- 229910052799 carbon Inorganic materials 0.000 description 5
- 238000001514 detection method Methods 0.000 description 5
- 230000007246 mechanism Effects 0.000 description 5
- 230000035945 sensitivity Effects 0.000 description 5
- 238000006243 chemical reaction Methods 0.000 description 4
- 238000005098 hot rolling Methods 0.000 description 4
- 229910000595 mu-metal Inorganic materials 0.000 description 4
- 230000007704 transition Effects 0.000 description 4
- 239000013078 crystal Substances 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 230000009977 dual effect Effects 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 238000002360 preparation method Methods 0.000 description 3
- 238000004513 sizing Methods 0.000 description 3
- 230000032258 transport Effects 0.000 description 3
- 230000001960 triggered effect Effects 0.000 description 3
- 230000032683 aging Effects 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- 230000007257 malfunction Effects 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 230000000630 rising effect Effects 0.000 description 2
- 230000001360 synchronised effect Effects 0.000 description 2
- WCXDHFDTOYPNIE-UHFFFAOYSA-N acetamiprid Chemical compound N#CN=C(C)N(C)CC1=CC=C(Cl)N=C1 WCXDHFDTOYPNIE-UHFFFAOYSA-N 0.000 description 1
- 230000004913 activation Effects 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 230000001174 ascending effect Effects 0.000 description 1
- 238000005311 autocorrelation function Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000009529 body temperature measurement Methods 0.000 description 1
- 239000007853 buffer solution Substances 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 238000005094 computer simulation Methods 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 108700010758 gag-pro Proteins 0.000 description 1
- 101150081889 gag-pro gene Proteins 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000012432 intermediate storage Methods 0.000 description 1
- 230000009191 jumping Effects 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 230000000873 masking effect Effects 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 230000008092 positive effect Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 238000005549 size reduction Methods 0.000 description 1
- 239000013077 target material Substances 0.000 description 1
- 239000011800 void material Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B21—MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
- B21B—ROLLING OF METAL
- B21B38/00—Methods or devices for measuring, detecting or monitoring specially adapted for metal-rolling mills, e.g. position detection, inspection of the product
- B21B38/04—Methods or devices for measuring, detecting or monitoring specially adapted for metal-rolling mills, e.g. position detection, inspection of the product for measuring thickness, width, diameter or other transverse dimensions of the product
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
- G01B11/10—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
- G01B11/105—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving using photoelectric detection means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Control Of Metal Rolling (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US05/778,810 US4121294A (en) | 1977-03-17 | 1977-03-17 | Electro-optical gaging system |
| US05/778,809 US4121292A (en) | 1977-03-17 | 1977-03-17 | Electro-optical gaging system having dual cameras on a scanner |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5415768A JPS5415768A (en) | 1979-02-05 |
| JPS6137562B2 true JPS6137562B2 (id) | 1986-08-25 |
Family
ID=27119507
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3091578A Granted JPS5415768A (en) | 1977-03-17 | 1978-03-17 | Electooptic measuring method of dimension profile of rolling bar material and its device |
Country Status (9)
| Country | Link |
|---|---|
| JP (1) | JPS5415768A (id) |
| CA (1) | CA1125915A (id) |
| DE (1) | DE2811707A1 (id) |
| FR (1) | FR2384234A1 (id) |
| GB (1) | GB1597564A (id) |
| IT (1) | IT1109651B (id) |
| LU (1) | LU79257A1 (id) |
| NL (1) | NL7802956A (id) |
| SE (1) | SE429163C (id) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5567607A (en) * | 1978-11-17 | 1980-05-21 | Hajime Sangyo Kk | Pattern discrimination method |
| DE2927410A1 (de) * | 1979-07-06 | 1981-01-08 | Siemens Ag | Anordnung zur ueberwachung des laengsprofils von geschliffenen zylinderbolzen |
| DE4013792C2 (de) * | 1990-04-28 | 1994-11-03 | Wolfgang Madlener | Längenmeßvorrichtung |
| DE4105838A1 (de) * | 1991-02-25 | 1992-09-03 | Rheydt Kabelwerk Ag | Optoelektronisches messverfahren |
| DE19829670A1 (de) * | 1997-07-04 | 1999-01-07 | Visicontrol Ges Fuer Elektroni | Vorrichtung zur Vermessung von heißen Gegenständen |
| DE10304503A1 (de) * | 2003-02-05 | 2004-08-19 | Hauni Maschinenbau Ag | Vorrichtung und Verfahren zum Messen des Durchmessers eines stabförmigen Gegenstandes insbesondere der tabakverarbeitenden Industrie |
| JP2004264063A (ja) | 2003-02-20 | 2004-09-24 | Ihi Aerospace Co Ltd | 撮像装置 |
| ES2525424T3 (es) | 2005-12-02 | 2014-12-22 | Hos Hottinger Systems Gbr | Dispositivo para inspeccionar la continuidad de canales de ventilación continuos de un disco de freno |
| DE102005061834B4 (de) | 2005-12-23 | 2007-11-08 | Ioss Intelligente Optische Sensoren & Systeme Gmbh | Vorrichtung und Verfahren zum optischen Prüfen einer Oberfläche |
| KR100891842B1 (ko) * | 2007-08-28 | 2009-04-07 | 주식회사 포스코 | 원형 선재 광학결함 검출장치 및 방법 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4958864A (id) * | 1972-10-05 | 1974-06-07 | ||
| JPS4990559A (id) * | 1972-12-28 | 1974-08-29 | ||
| JPS49111665A (id) * | 1973-02-22 | 1974-10-24 | ||
| JPS50103366A (id) * | 1974-01-14 | 1975-08-15 | ||
| JPS50123362A (id) * | 1974-03-14 | 1975-09-27 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| BE752635A (fr) * | 1970-06-26 | 1970-12-28 | Centre Rech Metallurgique | Procede de mesure d'une dimension telle qu'une largeur, |
| US3897156A (en) * | 1971-07-27 | 1975-07-29 | Atmospheric Sciences Inc | Structure for measuring the average diameter of an approximately circular cross-section of an object |
| US3820366A (en) * | 1972-11-06 | 1974-06-28 | Westinghouse Electric Corp | Rolling mill gauge control method and apparatus including temperatureand hardness correction |
| JPS5737806B2 (id) * | 1972-12-27 | 1982-08-12 | ||
| US3856412A (en) * | 1973-06-08 | 1974-12-24 | Zygo Corp | Optical noncontacting gauge |
| US3907439A (en) * | 1973-08-14 | 1975-09-23 | Zygo Corp | Edge-sensing with a scanning laser beam |
| SE376968B (id) * | 1973-10-12 | 1975-06-16 | Aga Ab | |
| DE2516756A1 (de) * | 1975-04-16 | 1976-10-28 | Betr Forsch Inst Angew Forsch | Verfahren und vorrichtung zur bestimmung einer flaechenabmessung in einer ebene |
-
1978
- 1978-03-14 SE SE7802955A patent/SE429163C/sv not_active IP Right Cessation
- 1978-03-16 CA CA299,089A patent/CA1125915A/en not_active Expired
- 1978-03-16 GB GB10521/78A patent/GB1597564A/en not_active Expired
- 1978-03-17 JP JP3091578A patent/JPS5415768A/ja active Granted
- 1978-03-17 IT IT67593/78A patent/IT1109651B/it active
- 1978-03-17 LU LU79257A patent/LU79257A1/xx unknown
- 1978-03-17 NL NL7802956A patent/NL7802956A/xx not_active Application Discontinuation
- 1978-03-17 FR FR7807859A patent/FR2384234A1/fr active Granted
- 1978-03-17 DE DE19782811707 patent/DE2811707A1/de not_active Withdrawn
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4958864A (id) * | 1972-10-05 | 1974-06-07 | ||
| JPS4990559A (id) * | 1972-12-28 | 1974-08-29 | ||
| JPS49111665A (id) * | 1973-02-22 | 1974-10-24 | ||
| JPS50103366A (id) * | 1974-01-14 | 1975-08-15 | ||
| JPS50123362A (id) * | 1974-03-14 | 1975-09-27 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5415768A (en) | 1979-02-05 |
| GB1597564A (en) | 1981-09-09 |
| CA1125915A (en) | 1982-06-15 |
| NL7802956A (nl) | 1978-09-19 |
| SE7802955L (sv) | 1978-09-18 |
| FR2384234B1 (id) | 1984-06-01 |
| SE429163B (sv) | 1983-08-15 |
| IT7867593A0 (it) | 1978-03-17 |
| SE429163C (sv) | 1985-11-18 |
| DE2811707A1 (de) | 1979-02-22 |
| LU79257A1 (fr) | 1978-11-03 |
| IT1109651B (it) | 1985-12-23 |
| FR2384234A1 (fr) | 1978-10-13 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4141071A (en) | Automatic diametric dimension control for mill for rolling round bars | |
| US3902811A (en) | Electro-optical scanning system for dimensional gauging of parts | |
| JPH0357402B2 (id) | ||
| JPS6127682B2 (id) | ||
| JPS6137562B2 (id) | ||
| US4764015A (en) | Method and apparatus for non-contact spatial measurement | |
| US3858983A (en) | Shaped product measurement | |
| US4121292A (en) | Electro-optical gaging system having dual cameras on a scanner | |
| CN113889423A (zh) | 一种可视化测量薄膜应力激光检测系统 | |
| US4810894A (en) | Method and apparatus for measuring film thickness using a second sheet of known thickness | |
| WO1981003698A1 (en) | Method and apparatus for monitoring movement | |
| US4121294A (en) | Electro-optical gaging system | |
| US4139890A (en) | Bar gauge plotting and display system | |
| US5107132A (en) | Apparatus for the verification of corrected surfaces or in the process of correction | |
| US4777610A (en) | Thickness monitor | |
| JP2878769B2 (ja) | 増分尺度に対して相対的に走査装置の基準点の位置を決定するための方法，および基準点形成器 | |
| US4121291A (en) | Linearity correction system for electro-optical gage | |
| EP0789258A1 (en) | Automatic measuring system of the wear of the overhead distribution contact wires | |
| US4099244A (en) | Recalibration system for electro-optical gage | |
| CN203132702U (zh) | 红外测温仪检定成套装置 | |
| JPH04145315A (ja) | 曲げ角度検出可能な折曲げ装置 | |
| IE41669B1 (en) | Opto-electronic scanning system for dimensional gauging ofparts | |
| EP0296252A1 (en) | Optical measuring instrument | |
| GB2117898A (en) | Extracting normal incidence signals in surface roughness measurement | |
| JP2669695B2 (ja) | レーザ加工装置 |