JPS6136704B2 - - Google Patents

Info

Publication number
JPS6136704B2
JPS6136704B2 JP3374579A JP3374579A JPS6136704B2 JP S6136704 B2 JPS6136704 B2 JP S6136704B2 JP 3374579 A JP3374579 A JP 3374579A JP 3374579 A JP3374579 A JP 3374579A JP S6136704 B2 JPS6136704 B2 JP S6136704B2
Authority
JP
Japan
Prior art keywords
chip
mark
camera
signal
detection circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP3374579A
Other languages
English (en)
Japanese (ja)
Other versions
JPS55125641A (en
Inventor
Masayuki Naruse
Shige Yamada
Isao Tokumaru
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP3374579A priority Critical patent/JPS55125641A/ja
Publication of JPS55125641A publication Critical patent/JPS55125641A/ja
Publication of JPS6136704B2 publication Critical patent/JPS6136704B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP3374579A 1979-03-22 1979-03-22 Automatic chip selection apparatus Granted JPS55125641A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3374579A JPS55125641A (en) 1979-03-22 1979-03-22 Automatic chip selection apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3374579A JPS55125641A (en) 1979-03-22 1979-03-22 Automatic chip selection apparatus

Publications (2)

Publication Number Publication Date
JPS55125641A JPS55125641A (en) 1980-09-27
JPS6136704B2 true JPS6136704B2 (enrdf_load_stackoverflow) 1986-08-20

Family

ID=12394945

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3374579A Granted JPS55125641A (en) 1979-03-22 1979-03-22 Automatic chip selection apparatus

Country Status (1)

Country Link
JP (1) JPS55125641A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007258482A (ja) * 2006-03-23 2007-10-04 Fujitsu Ltd 半導体装置の検査装置及び検査方法

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5897844A (ja) * 1981-12-07 1983-06-10 Shinkawa Ltd ダイ詰め換え装置
JPS58165339A (ja) * 1982-03-26 1983-09-30 Nec Corp 半導体ペレツトのマウント方法及びその装置
JPS59211239A (ja) * 1983-05-17 1984-11-30 Nec Corp 半導体ペレツト配列機
JPS6127652A (ja) * 1984-07-18 1986-02-07 Shinkawa Ltd ウエハ位置決め装置
SG148902A1 (en) * 2007-07-09 2009-01-29 Generic Power Pte Ltd Die ejector with illuminating unit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007258482A (ja) * 2006-03-23 2007-10-04 Fujitsu Ltd 半導体装置の検査装置及び検査方法

Also Published As

Publication number Publication date
JPS55125641A (en) 1980-09-27

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