JPS6128938B2 - - Google Patents

Info

Publication number
JPS6128938B2
JPS6128938B2 JP55147387A JP14738780A JPS6128938B2 JP S6128938 B2 JPS6128938 B2 JP S6128938B2 JP 55147387 A JP55147387 A JP 55147387A JP 14738780 A JP14738780 A JP 14738780A JP S6128938 B2 JPS6128938 B2 JP S6128938B2
Authority
JP
Japan
Prior art keywords
magnetic field
detection
inspected
defect
defects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55147387A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5770451A (en
Inventor
Shuji Naito
Makoto Murata
Shuichi Ishikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP55147387A priority Critical patent/JPS5770451A/ja
Publication of JPS5770451A publication Critical patent/JPS5770451A/ja
Publication of JPS6128938B2 publication Critical patent/JPS6128938B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9006—Details, e.g. in the structure or functioning of sensors

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
JP55147387A 1980-10-21 1980-10-21 Device for detecting edge defect of metallic plate Granted JPS5770451A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55147387A JPS5770451A (en) 1980-10-21 1980-10-21 Device for detecting edge defect of metallic plate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55147387A JPS5770451A (en) 1980-10-21 1980-10-21 Device for detecting edge defect of metallic plate

Publications (2)

Publication Number Publication Date
JPS5770451A JPS5770451A (en) 1982-04-30
JPS6128938B2 true JPS6128938B2 (enrdf_load_stackoverflow) 1986-07-03

Family

ID=15429098

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55147387A Granted JPS5770451A (en) 1980-10-21 1980-10-21 Device for detecting edge defect of metallic plate

Country Status (1)

Country Link
JP (1) JPS5770451A (enrdf_load_stackoverflow)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100573561B1 (ko) * 2001-12-24 2006-04-25 주식회사 포스코 에지필터를 이용한 핀홀 검출기
JP5765140B2 (ja) * 2011-08-29 2015-08-19 Ｊｆｅスチール株式会社 磁気特性測定方法および磁気特性測定装置
JP5851783B2 (ja) * 2011-09-27 2016-02-03 三菱重工業株式会社 渦電流探傷用プローブ
JP5940401B2 (ja) * 2012-07-24 2016-06-29 株式会社東芝 渦電流探傷装置
JP6474343B2 (ja) * 2015-11-27 2019-02-27 株式会社電子工学センター 渦電流探傷検査装置のプローブ及び渦電流探傷検査装置
JP7475029B2 (ja) * 2020-04-15 2024-04-26 株式会社テイエルブイ プローブ

Also Published As

Publication number Publication date
JPS5770451A (en) 1982-04-30

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