JPS61272959A - 半導体装置のトリミング方法 - Google Patents

半導体装置のトリミング方法

Info

Publication number
JPS61272959A
JPS61272959A JP60114872A JP11487285A JPS61272959A JP S61272959 A JPS61272959 A JP S61272959A JP 60114872 A JP60114872 A JP 60114872A JP 11487285 A JP11487285 A JP 11487285A JP S61272959 A JPS61272959 A JP S61272959A
Authority
JP
Japan
Prior art keywords
temperature
temperature sensor
wafer
trimming
measurement system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60114872A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0315823B2 (enExample
Inventor
Minoru Odajima
稔 小田嶋
Michiaki Yamagata
通昭 山県
Yukikiyo Ando
進清 安藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Priority to JP60114872A priority Critical patent/JPS61272959A/ja
Publication of JPS61272959A publication Critical patent/JPS61272959A/ja
Publication of JPH0315823B2 publication Critical patent/JPH0315823B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/80Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple passive components, e.g. resistors, capacitors or inductors
    • H10D86/85Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple passive components, e.g. resistors, capacitors or inductors characterised by only passive components

Landscapes

  • Semiconductor Integrated Circuits (AREA)
JP60114872A 1985-05-28 1985-05-28 半導体装置のトリミング方法 Granted JPS61272959A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60114872A JPS61272959A (ja) 1985-05-28 1985-05-28 半導体装置のトリミング方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60114872A JPS61272959A (ja) 1985-05-28 1985-05-28 半導体装置のトリミング方法

Publications (2)

Publication Number Publication Date
JPS61272959A true JPS61272959A (ja) 1986-12-03
JPH0315823B2 JPH0315823B2 (enExample) 1991-03-04

Family

ID=14648794

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60114872A Granted JPS61272959A (ja) 1985-05-28 1985-05-28 半導体装置のトリミング方法

Country Status (1)

Country Link
JP (1) JPS61272959A (enExample)

Also Published As

Publication number Publication date
JPH0315823B2 (enExample) 1991-03-04

Similar Documents

Publication Publication Date Title
US6552561B2 (en) Apparatus and method for controlling temperature in a device under test using integrated temperature sensitive diode
US6890097B2 (en) Temperature measuring sensor incorporated in semiconductor substrate, and semiconductor device containing such temperature measuring sensor
US4734641A (en) Method for the thermal characterization of semiconductor packaging systems
JP4944129B2 (ja) 動的なプローブ調節の方法及び装置
US9562943B2 (en) Wafer temperature sensing methods and related semiconductor wafer
JPH07198777A (ja) 半導体試験装置
US7064568B2 (en) Optical testing of integrated circuits with temperature control
US6545494B1 (en) Apparatus and method for controlling temperature in a wafer using integrated temperature sensitive diode
US20040001527A1 (en) Circuit for sensing on-die temperature at multiple locations
JPS61272959A (ja) 半導体装置のトリミング方法
JPH0774218A (ja) Icのテスト方法およびそのプローブカード
JP3235272B2 (ja) 配線の評価方法及び評価装置
JPS61272960A (ja) 半導体装置のトリミング方法
JPS61156892A (ja) 半導体ウエハ
Nguyenphu et al. Wafer temperature measurement in a rapid thermal processor with modulated lamp power
JP3539231B2 (ja) 接合温度測定方法及びその方法を実施するための測定装置
JPH0315344B2 (enExample)
JPH0469531A (ja) 放射温度計による温度測定方法
JPH05152389A (ja) プローブカード
JP2005127729A (ja) 信頼性試験装置および信頼性試験方法
JP2611680B2 (ja) 温度測定方法及び装置
JP2517873B2 (ja) 熱電型交直流変換器の出力電圧測定装置
JPS61161748A (ja) 半導体ウエハ
US20050179035A1 (en) Apparatus and method to access a plurality of pn-junctions with a limited number of pins
JPH0579481U (ja) Lsiテスタ