JPS61266939A - 走査型電子顕微鏡を用いた微粒子測定装置 - Google Patents
走査型電子顕微鏡を用いた微粒子測定装置Info
- Publication number
- JPS61266939A JPS61266939A JP60108098A JP10809885A JPS61266939A JP S61266939 A JPS61266939 A JP S61266939A JP 60108098 A JP60108098 A JP 60108098A JP 10809885 A JP10809885 A JP 10809885A JP S61266939 A JPS61266939 A JP S61266939A
- Authority
- JP
- Japan
- Prior art keywords
- electron microscope
- sample
- center point
- sample stage
- measurement positions
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000002245 particle Substances 0.000 title claims description 14
- 238000005259 measurement Methods 0.000 claims abstract description 49
- 238000004804 winding Methods 0.000 claims description 6
- 239000012528 membrane Substances 0.000 description 17
- 238000001914 filtration Methods 0.000 description 13
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 13
- 229910021642 ultra pure water Inorganic materials 0.000 description 4
- 239000012498 ultrapure water Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000010419 fine particle Substances 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000009827 uniform distribution Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/06—Investigating concentration of particle suspensions
- G01N15/0606—Investigating concentration of particle suspensions by collecting particles on a support
- G01N15/0618—Investigating concentration of particle suspensions by collecting particles on a support of the filter type
Landscapes
- Chemical & Material Sciences (AREA)
- Dispersion Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Microscoopes, Condenser (AREA)
- Automatic Focus Adjustment (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60108098A JPS61266939A (ja) | 1985-05-22 | 1985-05-22 | 走査型電子顕微鏡を用いた微粒子測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60108098A JPS61266939A (ja) | 1985-05-22 | 1985-05-22 | 走査型電子顕微鏡を用いた微粒子測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61266939A true JPS61266939A (ja) | 1986-11-26 |
| JPH0518052B2 JPH0518052B2 (enExample) | 1993-03-10 |
Family
ID=14475822
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60108098A Granted JPS61266939A (ja) | 1985-05-22 | 1985-05-22 | 走査型電子顕微鏡を用いた微粒子測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61266939A (enExample) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007207683A (ja) * | 2006-02-03 | 2007-08-16 | Tokyo Seimitsu Co Ltd | 電子顕微鏡 |
| JP2009528580A (ja) * | 2006-03-03 | 2009-08-06 | 3ディーヒステック ケイエフティー. | スライドをディジタル撮影する方法及びそのための自動ディジタル画像記録システム |
| JP2019020154A (ja) * | 2017-07-12 | 2019-02-07 | オルガノ株式会社 | 超純水の評価方法、超純水製造用膜モジュールの評価方法及び超純水製造用イオン交換樹脂の評価方法 |
| CN119164842A (zh) * | 2024-09-23 | 2024-12-20 | 南开大学 | 基于高低加速电压耦合分析的大气颗粒物分析方法及装置 |
-
1985
- 1985-05-22 JP JP60108098A patent/JPS61266939A/ja active Granted
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007207683A (ja) * | 2006-02-03 | 2007-08-16 | Tokyo Seimitsu Co Ltd | 電子顕微鏡 |
| JP2009528580A (ja) * | 2006-03-03 | 2009-08-06 | 3ディーヒステック ケイエフティー. | スライドをディジタル撮影する方法及びそのための自動ディジタル画像記録システム |
| JP2019020154A (ja) * | 2017-07-12 | 2019-02-07 | オルガノ株式会社 | 超純水の評価方法、超純水製造用膜モジュールの評価方法及び超純水製造用イオン交換樹脂の評価方法 |
| CN119164842A (zh) * | 2024-09-23 | 2024-12-20 | 南开大学 | 基于高低加速电压耦合分析的大气颗粒物分析方法及装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0518052B2 (enExample) | 1993-03-10 |
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