JPH0518052B2 - - Google Patents
Info
- Publication number
- JPH0518052B2 JPH0518052B2 JP60108098A JP10809885A JPH0518052B2 JP H0518052 B2 JPH0518052 B2 JP H0518052B2 JP 60108098 A JP60108098 A JP 60108098A JP 10809885 A JP10809885 A JP 10809885A JP H0518052 B2 JPH0518052 B2 JP H0518052B2
- Authority
- JP
- Japan
- Prior art keywords
- electron microscope
- sample
- center point
- coordinate
- pulse
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005259 measurement Methods 0.000 claims description 36
- 239000002245 particle Substances 0.000 claims description 13
- 238000004804 winding Methods 0.000 claims description 6
- 239000012528 membrane Substances 0.000 description 19
- 238000001914 filtration Methods 0.000 description 15
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 13
- 229910021642 ultra pure water Inorganic materials 0.000 description 5
- 239000012498 ultrapure water Substances 0.000 description 5
- 239000010419 fine particle Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000009827 uniform distribution Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/06—Investigating concentration of particle suspensions
- G01N15/0606—Investigating concentration of particle suspensions by collecting particles on a support
- G01N15/0618—Investigating concentration of particle suspensions by collecting particles on a support of the filter type
Landscapes
- Chemical & Material Sciences (AREA)
- Dispersion Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Microscoopes, Condenser (AREA)
- Automatic Focus Adjustment (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60108098A JPS61266939A (ja) | 1985-05-22 | 1985-05-22 | 走査型電子顕微鏡を用いた微粒子測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60108098A JPS61266939A (ja) | 1985-05-22 | 1985-05-22 | 走査型電子顕微鏡を用いた微粒子測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61266939A JPS61266939A (ja) | 1986-11-26 |
| JPH0518052B2 true JPH0518052B2 (enExample) | 1993-03-10 |
Family
ID=14475822
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60108098A Granted JPS61266939A (ja) | 1985-05-22 | 1985-05-22 | 走査型電子顕微鏡を用いた微粒子測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61266939A (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007207683A (ja) * | 2006-02-03 | 2007-08-16 | Tokyo Seimitsu Co Ltd | 電子顕微鏡 |
| HUP0600177A2 (en) * | 2006-03-03 | 2009-03-02 | 3D Histech Kft | Equipment for and method of digitizing slides by automated digital image recording system |
| JP7054995B2 (ja) * | 2017-07-12 | 2022-04-15 | オルガノ株式会社 | 超純水の評価方法、超純水製造用膜モジュールの評価方法及び超純水製造用イオン交換樹脂の評価方法 |
| CN119164842B (zh) * | 2024-09-23 | 2025-10-03 | 南开大学 | 基于高低加速电压耦合分析的大气颗粒物分析方法及装置 |
-
1985
- 1985-05-22 JP JP60108098A patent/JPS61266939A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61266939A (ja) | 1986-11-26 |
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