JPS61255025A - 欠陥検査用ウエハマスク材 - Google Patents
欠陥検査用ウエハマスク材Info
- Publication number
- JPS61255025A JPS61255025A JP60098518A JP9851885A JPS61255025A JP S61255025 A JPS61255025 A JP S61255025A JP 60098518 A JP60098518 A JP 60098518A JP 9851885 A JP9851885 A JP 9851885A JP S61255025 A JPS61255025 A JP S61255025A
- Authority
- JP
- Japan
- Prior art keywords
- masking material
- transparent substrate
- substrate
- etching
- silicide film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000007547 defect Effects 0.000 title claims abstract description 19
- 239000000463 material Substances 0.000 title claims abstract description 17
- 230000000873 masking effect Effects 0.000 title abstract 4
- 239000000758 substrate Substances 0.000 claims abstract description 24
- 229910021332 silicide Inorganic materials 0.000 claims abstract description 15
- FVBUAEGBCNSCDD-UHFFFAOYSA-N silicide(4-) Chemical compound [Si-4] FVBUAEGBCNSCDD-UHFFFAOYSA-N 0.000 claims abstract description 15
- 229910052594 sapphire Inorganic materials 0.000 claims abstract description 9
- 239000010980 sapphire Substances 0.000 claims abstract description 9
- 239000013078 crystal Substances 0.000 claims abstract description 8
- 239000002184 metal Substances 0.000 claims description 19
- 238000007689 inspection Methods 0.000 claims description 12
- 238000000034 method Methods 0.000 abstract description 16
- 238000005530 etching Methods 0.000 abstract description 12
- 238000001312 dry etching Methods 0.000 abstract description 10
- 150000002500 ions Chemical class 0.000 abstract description 2
- 229910020968 MoSi2 Inorganic materials 0.000 abstract 1
- 230000001070 adhesive effect Effects 0.000 abstract 1
- 239000011521 glass Substances 0.000 description 5
- 238000004544 sputter deposition Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 239000010453 quartz Substances 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 238000011109 contamination Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- VLTRZXGMWDSKGL-UHFFFAOYSA-N perchloric acid Chemical compound OCl(=O)(=O)=O VLTRZXGMWDSKGL-UHFFFAOYSA-N 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- VZGDMQKNWNREIO-UHFFFAOYSA-N tetrachloromethane Chemical compound ClC(Cl)(Cl)Cl VZGDMQKNWNREIO-UHFFFAOYSA-N 0.000 description 2
- 238000007740 vapor deposition Methods 0.000 description 2
- 241001012508 Carpiodes cyprinus Species 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- YNKVVRHAQCDJQM-UHFFFAOYSA-P diazanium dinitrate Chemical compound [NH4+].[NH4+].[O-][N+]([O-])=O.[O-][N+]([O-])=O YNKVVRHAQCDJQM-UHFFFAOYSA-P 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- -1 etc. Substances 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 238000010791 quenching Methods 0.000 description 1
- 230000000171 quenching effect Effects 0.000 description 1
- 239000002966 varnish Substances 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60098518A JPS61255025A (ja) | 1985-05-07 | 1985-05-07 | 欠陥検査用ウエハマスク材 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60098518A JPS61255025A (ja) | 1985-05-07 | 1985-05-07 | 欠陥検査用ウエハマスク材 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61255025A true JPS61255025A (ja) | 1986-11-12 |
| JPH0528823B2 JPH0528823B2 (enrdf_load_stackoverflow) | 1993-04-27 |
Family
ID=14221869
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60098518A Granted JPS61255025A (ja) | 1985-05-07 | 1985-05-07 | 欠陥検査用ウエハマスク材 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61255025A (enrdf_load_stackoverflow) |
-
1985
- 1985-05-07 JP JP60098518A patent/JPS61255025A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0528823B2 (enrdf_load_stackoverflow) | 1993-04-27 |
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