JPS61223666A - 回路基板検査装置 - Google Patents
回路基板検査装置Info
- Publication number
- JPS61223666A JPS61223666A JP60065316A JP6531685A JPS61223666A JP S61223666 A JPS61223666 A JP S61223666A JP 60065316 A JP60065316 A JP 60065316A JP 6531685 A JP6531685 A JP 6531685A JP S61223666 A JPS61223666 A JP S61223666A
- Authority
- JP
- Japan
- Prior art keywords
- circuit board
- pin
- board
- compression spring
- holding member
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000006835 compression Effects 0.000 claims abstract description 25
- 238000007906 compression Methods 0.000 claims abstract description 25
- 238000007689 inspection Methods 0.000 claims abstract description 23
- 238000000034 method Methods 0.000 abstract description 3
- 238000000605 extraction Methods 0.000 description 22
- 238000012360 testing method Methods 0.000 description 18
- 238000005259 measurement Methods 0.000 description 4
- 230000004913 activation Effects 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 238000013459 approach Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 238000003491 array Methods 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 230000003139 buffering effect Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60065316A JPS61223666A (ja) | 1985-03-29 | 1985-03-29 | 回路基板検査装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60065316A JPS61223666A (ja) | 1985-03-29 | 1985-03-29 | 回路基板検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61223666A true JPS61223666A (ja) | 1986-10-04 |
JPH0464430B2 JPH0464430B2 (enrdf_load_stackoverflow) | 1992-10-14 |
Family
ID=13283380
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60065316A Granted JPS61223666A (ja) | 1985-03-29 | 1985-03-29 | 回路基板検査装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61223666A (enrdf_load_stackoverflow) |
-
1985
- 1985-03-29 JP JP60065316A patent/JPS61223666A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPH0464430B2 (enrdf_load_stackoverflow) | 1992-10-14 |
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