JPS6122254B2 - - Google Patents

Info

Publication number
JPS6122254B2
JPS6122254B2 JP49011869A JP1186974A JPS6122254B2 JP S6122254 B2 JPS6122254 B2 JP S6122254B2 JP 49011869 A JP49011869 A JP 49011869A JP 1186974 A JP1186974 A JP 1186974A JP S6122254 B2 JPS6122254 B2 JP S6122254B2
Authority
JP
Japan
Prior art keywords
signal
pattern
shift register
output
memory means
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP49011869A
Other languages
English (en)
Japanese (ja)
Other versions
JPS50107987A (US06262066-20010717-C00424.png
Inventor
Michihiro Mese
Takeshi Karasuno
Sadahiro Ikeda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP49011869A priority Critical patent/JPS6122254B2/ja
Publication of JPS50107987A publication Critical patent/JPS50107987A/ja
Publication of JPS6122254B2 publication Critical patent/JPS6122254B2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Image Input (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP49011869A 1974-01-30 1974-01-30 Expired JPS6122254B2 (US06262066-20010717-C00424.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP49011869A JPS6122254B2 (US06262066-20010717-C00424.png) 1974-01-30 1974-01-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP49011869A JPS6122254B2 (US06262066-20010717-C00424.png) 1974-01-30 1974-01-30

Publications (2)

Publication Number Publication Date
JPS50107987A JPS50107987A (US06262066-20010717-C00424.png) 1975-08-25
JPS6122254B2 true JPS6122254B2 (US06262066-20010717-C00424.png) 1986-05-30

Family

ID=11789717

Family Applications (1)

Application Number Title Priority Date Filing Date
JP49011869A Expired JPS6122254B2 (US06262066-20010717-C00424.png) 1974-01-30 1974-01-30

Country Status (1)

Country Link
JP (1) JPS6122254B2 (US06262066-20010717-C00424.png)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5293386A (en) * 1976-02-02 1977-08-05 Toshiba Corp Flaw detector
JPS56110059A (en) * 1980-02-05 1981-09-01 Toshiba Corp Automatic inspecting device for printed wiring board
GB8320016D0 (en) * 1983-07-25 1983-08-24 Lloyd Doyle Ltd Apparatus for inspecting printed wiring boards
JPS6052728A (ja) * 1983-08-31 1985-03-26 Matsushita Electric Works Ltd はんだ付不良検出方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4898886A (US06262066-20010717-C00424.png) * 1972-03-29 1973-12-14

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4898886A (US06262066-20010717-C00424.png) * 1972-03-29 1973-12-14

Also Published As

Publication number Publication date
JPS50107987A (US06262066-20010717-C00424.png) 1975-08-25

Similar Documents

Publication Publication Date Title
JP3132565B2 (ja) 欠陥検査方法及びその装置
EP0195161B1 (en) Apparatus for automatically inspecting objects and identifying or recognizing known and unknown portions thereof, including defects and the like and method
JPH02140884A (ja) イメージ処理方法および装置
JPS6122254B2 (US06262066-20010717-C00424.png)
JP2710527B2 (ja) 周期性パターンの検査装置
JPH09264856A (ja) 物品外観検査装置
JPH10141925A (ja) 外観検査装置
JPS6342201B2 (US06262066-20010717-C00424.png)
KR100227421B1 (ko) 프린트 기판의 미삽 검사장치 및 그 제어방법
JP3283866B2 (ja) 回路パターンの欠陥検査方法及びその装置
JPH0483107A (ja) 配線パターン検査装置
JP2756738B2 (ja) 半導体装置の外観検査装置
JP3400797B2 (ja) 回路パターンの欠陥検査方法及びその装置
JPH0238955A (ja) 表面疵検査装置
JPS6228647A (ja) プリント基板等におけるパタ−ンの検査装置
JPH03252546A (ja) 配線パターン検査装置
JPH0344774A (ja) 検査装置
JPS5967633A (ja) フオトマスクの検査方法及び装置
JPS59121335A (ja) フオトマスクの検査方法及び装置
JPS59102106A (ja) 検査方式
JPH0644281B2 (ja) パターン欠陥検査装置
JPS5821108A (ja) パタ−ン欠陥検査装置
JPH0619252B2 (ja) 印刷配線基板のはんだ付検査装置
JPH07243824A (ja) 画像検査装置
Chehdi et al. Automatic System of Quality Control by Vision of Hybrid Circuits