JPS6122254B2 - - Google Patents
Info
- Publication number
- JPS6122254B2 JPS6122254B2 JP49011869A JP1186974A JPS6122254B2 JP S6122254 B2 JPS6122254 B2 JP S6122254B2 JP 49011869 A JP49011869 A JP 49011869A JP 1186974 A JP1186974 A JP 1186974A JP S6122254 B2 JPS6122254 B2 JP S6122254B2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- pattern
- shift register
- output
- memory means
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000000605 extraction Methods 0.000 claims description 6
- 238000000034 method Methods 0.000 claims description 5
- 238000007689 inspection Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000012360 testing method Methods 0.000 description 4
- 241000282412 Homo Species 0.000 description 3
- 239000000284 extract Substances 0.000 description 3
- 238000003384 imaging method Methods 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 230000007547 defect Effects 0.000 description 2
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 231100000241 scar Toxicity 0.000 description 2
- 238000011179 visual inspection Methods 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 230000010365 information processing Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000013139 quantization Methods 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 230000002123 temporal effect Effects 0.000 description 1
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Image Input (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP49011869A JPS6122254B2 (US06262066-20010717-C00424.png) | 1974-01-30 | 1974-01-30 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP49011869A JPS6122254B2 (US06262066-20010717-C00424.png) | 1974-01-30 | 1974-01-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS50107987A JPS50107987A (US06262066-20010717-C00424.png) | 1975-08-25 |
JPS6122254B2 true JPS6122254B2 (US06262066-20010717-C00424.png) | 1986-05-30 |
Family
ID=11789717
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP49011869A Expired JPS6122254B2 (US06262066-20010717-C00424.png) | 1974-01-30 | 1974-01-30 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6122254B2 (US06262066-20010717-C00424.png) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5293386A (en) * | 1976-02-02 | 1977-08-05 | Toshiba Corp | Flaw detector |
JPS56110059A (en) * | 1980-02-05 | 1981-09-01 | Toshiba Corp | Automatic inspecting device for printed wiring board |
GB8320016D0 (en) * | 1983-07-25 | 1983-08-24 | Lloyd Doyle Ltd | Apparatus for inspecting printed wiring boards |
JPS6052728A (ja) * | 1983-08-31 | 1985-03-26 | Matsushita Electric Works Ltd | はんだ付不良検出方法 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4898886A (US06262066-20010717-C00424.png) * | 1972-03-29 | 1973-12-14 |
-
1974
- 1974-01-30 JP JP49011869A patent/JPS6122254B2/ja not_active Expired
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4898886A (US06262066-20010717-C00424.png) * | 1972-03-29 | 1973-12-14 |
Also Published As
Publication number | Publication date |
---|---|
JPS50107987A (US06262066-20010717-C00424.png) | 1975-08-25 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP3132565B2 (ja) | 欠陥検査方法及びその装置 | |
EP0195161B1 (en) | Apparatus for automatically inspecting objects and identifying or recognizing known and unknown portions thereof, including defects and the like and method | |
JPH02140884A (ja) | イメージ処理方法および装置 | |
JPS6122254B2 (US06262066-20010717-C00424.png) | ||
JP2710527B2 (ja) | 周期性パターンの検査装置 | |
JPH09264856A (ja) | 物品外観検査装置 | |
JPH10141925A (ja) | 外観検査装置 | |
JPS6342201B2 (US06262066-20010717-C00424.png) | ||
KR100227421B1 (ko) | 프린트 기판의 미삽 검사장치 및 그 제어방법 | |
JP3283866B2 (ja) | 回路パターンの欠陥検査方法及びその装置 | |
JPH0483107A (ja) | 配線パターン検査装置 | |
JP2756738B2 (ja) | 半導体装置の外観検査装置 | |
JP3400797B2 (ja) | 回路パターンの欠陥検査方法及びその装置 | |
JPH0238955A (ja) | 表面疵検査装置 | |
JPS6228647A (ja) | プリント基板等におけるパタ−ンの検査装置 | |
JPH03252546A (ja) | 配線パターン検査装置 | |
JPH0344774A (ja) | 検査装置 | |
JPS5967633A (ja) | フオトマスクの検査方法及び装置 | |
JPS59121335A (ja) | フオトマスクの検査方法及び装置 | |
JPS59102106A (ja) | 検査方式 | |
JPH0644281B2 (ja) | パターン欠陥検査装置 | |
JPS5821108A (ja) | パタ−ン欠陥検査装置 | |
JPH0619252B2 (ja) | 印刷配線基板のはんだ付検査装置 | |
JPH07243824A (ja) | 画像検査装置 | |
Chehdi et al. | Automatic System of Quality Control by Vision of Hybrid Circuits |