JPS61206279A - Superconductive element - Google Patents

Superconductive element

Info

Publication number
JPS61206279A
JPS61206279A JP60046541A JP4654185A JPS61206279A JP S61206279 A JPS61206279 A JP S61206279A JP 60046541 A JP60046541 A JP 60046541A JP 4654185 A JP4654185 A JP 4654185A JP S61206279 A JPS61206279 A JP S61206279A
Authority
JP
Japan
Prior art keywords
superconducting
implanted
superconductive
electrode
conductive material
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60046541A
Other languages
Japanese (ja)
Inventor
Juichi Nishino
西野 壽一
Yutaka Harada
豊 原田
Mutsuko Miyake
三宅 睦子
Ushio Kawabe
川辺 潮
Masaaki Aoki
正明 青木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP60046541A priority Critical patent/JPS61206279A/en
Publication of JPS61206279A publication Critical patent/JPS61206279A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N60/00Superconducting devices
    • H10N60/01Manufacture or treatment

Abstract

PURPOSE:To flatten and miniaturize an element, and to improve the degree of integration of a circuit by selectively implanting ions to a semiconductor or a substrate material displaying electric conduction as a normal conductor and forming a superconductive electrode. CONSTITUTION:The surface of an Si single crystal substrate 1 to shape an insulator layer 2, and a conductive material layer 3 is deposited. When a protective film 4 consisting of SiO2 is formed through a resistance heating evaporation method, and processed through a lift-off method, and oxygen ions are implanted through the protective film 4 and annealed in a vacuum, the superconductive transition temperature of a section to which oxygen ions are implanted rises, and a superconductive electrode 5 is shaped. Accordingly, the superconductive electrode section is flattened, thus fining an element and improving the degree of integration of a circuit in three dimensions.

Description

【発明の詳細な説明】 【発明の利用分野〕 本発明は極低温で動作する超電導体を用いたスイッチン
グ素子に係り、特に素子の微細化と回路の高集積化に好
適な超電導素子の構造と材料とに関する。
Detailed Description of the Invention [Field of Application of the Invention] The present invention relates to a switching element using a superconductor that operates at extremely low temperatures, and in particular to a structure of a superconducting element suitable for miniaturization of elements and high integration of circuits. Regarding materials.

〔発明の背景〕[Background of the invention]

(1981)において発表しているごとく、基板上に超
電導材料を堆積させたのち、これを微細加工して超電導
電極および弱結合部分を形成している。この方法は、超
電導体の材料が特に限定されず、しかも任意の形状を実
現できる点で優れている。しかし超電導体を加工して形
成した超電導電極の端部には超電導体の厚さである20
0〜400nmと同じか又はそれ以上の段差が存在して
いる。従って素子を微細化してこれを立体的に集積化す
るためには、この段差を平坦化する技術が必要とされて
いた。
(1981), superconducting materials are deposited on a substrate and then microfabricated to form superconducting electrodes and weak coupling parts. This method is advantageous in that the material of the superconductor is not particularly limited and any shape can be realized. However, the edge of a superconducting electrode formed by processing a superconductor has a thickness of 20 mm, which is the thickness of the superconductor.
There is a level difference that is equal to or greater than 0 to 400 nm. Therefore, in order to miniaturize elements and integrate them three-dimensionally, a technique for flattening these steps is required.

〔発明の目的〕[Purpose of the invention]

本発明の目的は、従来技術に含まれる課題を解決し、素
子を平坦化して作製することにより、素子の微小化と高
集積化が可能な超電導素子の構造と材料とを提供するこ
とにある。
An object of the present invention is to provide a structure and material for a superconducting element that solves the problems involved in the prior art and enables miniaturization and high integration of the element by flattening and manufacturing the element. .

〔発明の概要〕[Summary of the invention]

本発明においては、超電導体を微細加工して超電導電極
を得るのではなく、素子が動作する温度において、本来
は半導体あるいは常電導体としての電気伝導を示す基板
材料に、イオン打込みを選択的に行って、イオンが打込
まれた部分が超電導現象を示すことを利用して、この部
分を超電導電極として使用するものである。これによっ
て、素子の平坦化と微小化が実現でき、回路の高集積化
が可能となる。
In the present invention, rather than obtaining a superconducting electrode by microfabrication of a superconductor, ions are selectively implanted into a substrate material that originally exhibits electrical conductivity as a semiconductor or normal conductor at the operating temperature of the device. By utilizing the fact that the part into which ions have been implanted exhibits a superconducting phenomenon, this part is used as a superconducting electrode. This makes it possible to achieve flattening and miniaturization of the element, and to achieve high integration of the circuit.

〔発明の実施例〕[Embodiments of the invention]

以下1本発明の一実施例を第1図を用いて説明する。(
100)方位のSi単結晶基板1を、1000℃の水蒸
気を含んだ酸素中で表面の酸化を行い、厚さ約700n
mの5in2より成る絶縁物層2を形成する。続いてR
Fスパッタリング法により、[1aPb、 、 、 B
i0. 、 O,なる組成の導電性材料M3を約600
nm堆積させる。続いてSiOより成る保護膜4を抵抗
加熱蓋着方によって割膜し、リフトオフ法によって加工
する。続いて、この保護膜4を通して、酸素イオンを加
速電圧150にボルト、密度I X 101sam−”
の条件によってイオン打込みする。その結果、酸素イオ
ンを打込んだ部分の導電性材料層3には、酸素がI X
 10”cm−”〜3×1 () L II am −
3の密度で追加されたことになる。次に温度500℃で
約10時間のアニールを真空中で行うと、酸素イオンを
打込んだ部分の超電導転移温度が上昇するために、超電
導電極5が形成される。以上によって本発明の超電導素
子を作製することができた。この超電導素子を絶対温度
6Kに冷却して動作させたところ、導電性材料層3は常
電導状態にあるのに対して、酸素イオンの打込みを行っ
た超電導電極5は、超電導を示すため、第1図に示した
超電導素子は、いわゆるマイクロブリッジ型のジョセフ
ソン素子として機能した。この素子は平坦化されている
ために立体的な集積や。
An embodiment of the present invention will be described below with reference to FIG. (
100) orientation, the surface of the Si single crystal substrate 1 is oxidized in oxygen containing water vapor at 1000°C, and the thickness is about 700 nm.
An insulating layer 2 of 5 in 2 m is formed. followed by R
By F sputtering method, [1aPb, , , B
i0. , O, conductive material M3 having a composition of about 600
nm deposited. Subsequently, the protective film 4 made of SiO is split by a resistance heating capping method and processed by a lift-off method. Subsequently, oxygen ions are accelerated through the protective film 4 at an acceleration voltage of 150 volts and a density of I x 101 sam-"
Ion implantation is performed according to the following conditions. As a result, oxygen is I
10"cm-"~3×1 () L II am-
This means that it was added at a density of 3. Next, when annealing is performed in a vacuum at a temperature of 500° C. for about 10 hours, a superconducting electrode 5 is formed because the superconducting transition temperature of the portion into which oxygen ions have been implanted rises. Through the above steps, the superconducting element of the present invention could be manufactured. When this superconducting element is cooled to an absolute temperature of 6 K and operated, the conductive material layer 3 is in a normal conductive state, whereas the superconducting electrode 5 into which oxygen ions have been implanted exhibits superconductivity. The superconducting element shown in Figure 1 functioned as a so-called microbridge type Josephson element. Because this element is flattened, it can be integrated three-dimensionally.

他の半導体あるいは金属材料と制御電極とを組合せたい
わゆる超電導多端子素子への応用も容易であった。すな
わち第2図に示したように、第1図に示した構造を有す
る素子の上に、気相成長法によって厚さ約150nmの
多結晶Si層6を形成する。その表面を酸化して厚さ約
20nmのSin。
It was also easy to apply this method to so-called superconducting multi-terminal devices in which control electrodes are combined with other semiconductor or metal materials. That is, as shown in FIG. 2, a polycrystalline Si layer 6 having a thickness of about 150 nm is formed by vapor phase growth on the element having the structure shown in FIG. The surface of the film is oxidized to give a thickness of about 20 nm.

より成る絶縁物層7を形成する。続いてその表面に、厚
さ約400 n mのAQ蒸着膜より成る制御電極8を
設けた0以上によって、電界効果トランジスタ型の超電
導多端子素子を得ることができた。
An insulator layer 7 consisting of the following is formed. Subsequently, a control electrode 8 made of an AQ vapor-deposited film having a thickness of about 400 nm was provided on the surface of the control electrode 8, thereby making it possible to obtain a field effect transistor type superconducting multi-terminal device.

この電界効果トランジスタ型の超電導多端子素子では、
制御電極8に印加する電圧によって多結晶Si層6を流
れる超電導電流が制御される。
In this field effect transistor type superconducting multi-terminal device,
The superconducting current flowing through the polycrystalline Si layer 6 is controlled by the voltage applied to the control electrode 8.

本実施例では、導電性材料にBaPb、、、[lit+
、iolを、打込むイオンに酸素を用いたが、この他に
導電性材料にNb、打込むイオンにSiあるいはNを用
いても、又は、導電性材料にM0.打込むイオンにNを
用いても同様の効果を得ることができた。
In this example, the conductive material is BaPb, , [lit+
, iol, oxygen was used as the ion to be implanted, but Nb may be used as the conductive material, Si or N as the ion to be implanted, or M0. A similar effect could be obtained by using N as the implanted ions.

〔発明の効果〕〔Effect of the invention〕

以上述べたように、本発明の超電導素子は、従来の技術
により作られた超電導素子と異なり、超電導電極部分が
平坦化されているために、段差を解消し、素子の微小化
と回路の立体的集積化が可能となる効果がある。
As described above, the superconducting element of the present invention differs from superconducting elements made by conventional technology in that the superconducting electrode portion is flattened, which eliminates the step difference, miniaturizes the element, and creates three-dimensional circuits. This has the effect of making it possible to integrate various materials.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図及び第2図は本発明の実施例による超電導素子の
一部を示す断面図。 3・・・半導体あるいは常電導金属から成る導電性材料
層、5・・・超電導電極。 ヰ2目
1 and 2 are cross-sectional views showing a part of a superconducting element according to an embodiment of the present invention. 3... Conductive material layer made of a semiconductor or a normal conducting metal, 5... Superconducting electrode.ヰ2nd eye

Claims (1)

【特許請求の範囲】 1、極低温において動作し、2つまたはそれ以上の超電
導体より成る超電導電極を有する超電導素子において、
該超電導電極は半導体又は常電導金属から成る導電性材
料層にイオンを注入あるいは拡散することによつて形成
されることを特徴とする超電導素子。 2、特許請求の範囲第1項において、前記導電性材料層
はBaPb_0_._7Bi_0_._3O_3から成
ることを特徴とする超電導素子。 3、特許請求の範囲第1項において、前記導電性材料層
はNbから成ることを特徴とする超電導素子。 4、特許請求の範囲第1項において、前記導電性材料層
はMoから成ることを特徴とする超電導素子。
[Claims] 1. A superconducting element that operates at extremely low temperatures and has a superconducting electrode made of two or more superconductors,
A superconducting element characterized in that the superconducting electrode is formed by implanting or diffusing ions into a conductive material layer made of a semiconductor or a normal conductive metal. 2. In claim 1, the conductive material layer is BaPb_0_. _7Bi_0_. A superconducting element characterized by comprising _3O_3. 3. A superconducting element according to claim 1, wherein the conductive material layer is made of Nb. 4. A superconducting element according to claim 1, wherein the conductive material layer is made of Mo.
JP60046541A 1985-03-11 1985-03-11 Superconductive element Pending JPS61206279A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60046541A JPS61206279A (en) 1985-03-11 1985-03-11 Superconductive element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60046541A JPS61206279A (en) 1985-03-11 1985-03-11 Superconductive element

Publications (1)

Publication Number Publication Date
JPS61206279A true JPS61206279A (en) 1986-09-12

Family

ID=12750153

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60046541A Pending JPS61206279A (en) 1985-03-11 1985-03-11 Superconductive element

Country Status (1)

Country Link
JP (1) JPS61206279A (en)

Cited By (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63261770A (en) * 1987-04-18 1988-10-28 Semiconductor Energy Lab Co Ltd Manufacture of superconducting device
JPS63261768A (en) * 1987-04-18 1988-10-28 Semiconductor Energy Lab Co Ltd Manufacture of superconducting element
JPS63261769A (en) * 1987-04-18 1988-10-28 Semiconductor Energy Lab Co Ltd Manufacture of superconducting device
JPS63261765A (en) * 1987-04-18 1988-10-28 Semiconductor Energy Lab Co Ltd Superconducting element
JPS63263482A (en) * 1987-04-13 1988-10-31 インターナシヨナル・ビジネス・マシーンズ・コーポレーシヨン Superconducting device and manufacture thereof
JPS63262877A (en) * 1987-04-20 1988-10-31 Semiconductor Energy Lab Co Ltd Superconducting element
JPS63262878A (en) * 1987-04-20 1988-10-31 Semiconductor Energy Lab Co Ltd Manufacture of superconducting element
JPS6427282A (en) * 1987-01-30 1989-01-30 Hitachi Ltd Superconducting device
JPS6433006A (en) * 1987-04-08 1989-02-02 Hitachi Ltd Production of superconducting oxide and superconducting device
JPS6466978A (en) * 1987-09-07 1989-03-13 Semiconductor Energy Lab Manufacture of superconducting element
JPS6473775A (en) * 1987-09-16 1989-03-20 Semiconductor Energy Lab Superconducting device
JPS6473780A (en) * 1987-09-16 1989-03-20 Semiconductor Energy Lab Manufacture of superconducting device
JPS6486575A (en) * 1987-06-17 1989-03-31 Hitachi Ltd Superconducting device
JPH01157579A (en) * 1987-05-18 1989-06-20 Sumitomo Electric Ind Ltd Manufacture of superconductor and superconductive circuit
JPH01199453A (en) * 1988-02-04 1989-08-10 Fujitsu Ltd Manufacture of superconductor element
JPH0284732A (en) * 1988-02-04 1990-03-26 Fujitsu Ltd Manufacture of superconductor element
US5138401A (en) * 1987-08-24 1992-08-11 Semiconductor Energy Laboratory Co., Ltd. Electronic devices utilizing superconducting materials
US5596206A (en) * 1987-03-13 1997-01-21 Semiconductor Energy Laboratory Co., Ltd. Superconducting device

Cited By (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6427282A (en) * 1987-01-30 1989-01-30 Hitachi Ltd Superconducting device
US5596206A (en) * 1987-03-13 1997-01-21 Semiconductor Energy Laboratory Co., Ltd. Superconducting device
JPS6433006A (en) * 1987-04-08 1989-02-02 Hitachi Ltd Production of superconducting oxide and superconducting device
JPS63263482A (en) * 1987-04-13 1988-10-31 インターナシヨナル・ビジネス・マシーンズ・コーポレーシヨン Superconducting device and manufacture thereof
JPS63261770A (en) * 1987-04-18 1988-10-28 Semiconductor Energy Lab Co Ltd Manufacture of superconducting device
JPH0577314B2 (en) * 1987-04-18 1993-10-26 Handotai Energy Kenkyusho
JPH0577313B2 (en) * 1987-04-18 1993-10-26 Handotai Energy Kenkyusho
JPS63261765A (en) * 1987-04-18 1988-10-28 Semiconductor Energy Lab Co Ltd Superconducting element
JPS63261769A (en) * 1987-04-18 1988-10-28 Semiconductor Energy Lab Co Ltd Manufacture of superconducting device
JPH0577316B2 (en) * 1987-04-18 1993-10-26 Handotai Energy Kenkyusho
JPS63261768A (en) * 1987-04-18 1988-10-28 Semiconductor Energy Lab Co Ltd Manufacture of superconducting element
JPH0587154B2 (en) * 1987-04-20 1993-12-15 Handotai Energy Kenkyusho
JPS63262877A (en) * 1987-04-20 1988-10-31 Semiconductor Energy Lab Co Ltd Superconducting element
JPH0577349B2 (en) * 1987-04-20 1993-10-26 Handotai Energy Kenkyusho
JPS63262878A (en) * 1987-04-20 1988-10-31 Semiconductor Energy Lab Co Ltd Manufacture of superconducting element
JPH01157579A (en) * 1987-05-18 1989-06-20 Sumitomo Electric Ind Ltd Manufacture of superconductor and superconductive circuit
JPS6486575A (en) * 1987-06-17 1989-03-31 Hitachi Ltd Superconducting device
US5138401A (en) * 1987-08-24 1992-08-11 Semiconductor Energy Laboratory Co., Ltd. Electronic devices utilizing superconducting materials
JPS6466978A (en) * 1987-09-07 1989-03-13 Semiconductor Energy Lab Manufacture of superconducting element
JPS6473775A (en) * 1987-09-16 1989-03-20 Semiconductor Energy Lab Superconducting device
JPS6473780A (en) * 1987-09-16 1989-03-20 Semiconductor Energy Lab Manufacture of superconducting device
JPH0284732A (en) * 1988-02-04 1990-03-26 Fujitsu Ltd Manufacture of superconductor element
JPH01199453A (en) * 1988-02-04 1989-08-10 Fujitsu Ltd Manufacture of superconductor element

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