JPS61201419A - Apparatus for manufacture of semiconductor - Google Patents
Apparatus for manufacture of semiconductorInfo
- Publication number
- JPS61201419A JPS61201419A JP4395585A JP4395585A JPS61201419A JP S61201419 A JPS61201419 A JP S61201419A JP 4395585 A JP4395585 A JP 4395585A JP 4395585 A JP4395585 A JP 4395585A JP S61201419 A JPS61201419 A JP S61201419A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- substrate holder
- indium
- holder
- welding material
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/02631—Physical deposition at reduced pressure, e.g. MBE, sputtering, evaporation
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
この発明は、半導体製造装置、特に分子線エピタキシー
(MBE)!!置などに用いられている基板ホルダの改
良に関するものである。[Detailed Description of the Invention] [Industrial Application Field] This invention is applicable to semiconductor manufacturing equipment, especially molecular beam epitaxy (MBE)! ! This paper relates to improvements to substrate holders used in equipment such as equipment.
従来のこの棟の半導体製造装置を第2図により説明する
。第2図は基板ホルダ上に基板を貼り付けた際の側面図
である。第2図において、1は基板で、例えばGaAS
のよ5に、その上にエピタキシャル成長をさせるための
半導体基板である。2は前記基板1を貼り付ける基板ホ
ルダである。The conventional semiconductor manufacturing equipment in this building will be explained with reference to FIG. FIG. 2 is a side view of the substrate affixed onto the substrate holder. In FIG. 2, 1 is a substrate, for example, a GaAS
No. 5 is a semiconductor substrate on which epitaxial growth is performed. 2 is a substrate holder to which the substrate 1 is attached.
これは通常モリブデンでできている。3は前記1板1を
基板ホルダ2に貼り付けるための溶着材であり、通常イ
ンジウムが用いられている。This is usually made of molybdenum. Reference numeral 3 denotes a welding material for pasting the board 1 to the substrate holder 2, and indium is usually used.
このような基板10基板ホルダ2においては、■ 基板
1を一様に/Jl熱しなければならない。In such a substrate 10 and substrate holder 2, (1) the substrate 1 must be uniformly heated by /Jl;
■ 檀々の形状、大きさの異なる基板1に対応できる必
要がある。- It is necessary to be able to handle substrates 1 having different shapes and sizes.
Q)基板ホルダ2の大きさは、搬送の都合上一定に固定
せざるを得ない。Q) The size of the substrate holder 2 must be fixed for convenience of transportation.
等の理由により、基&1より大きい基板ホルダ2上にイ
ンジウム3等の溶着材で貼り付けることをせざるを得な
い。For these reasons, it is necessary to attach the substrate holder 2, which is larger than the substrate &1, using a welding material such as indium 3.
しかしながら、従来の基板ホルダ2にインジウム3を用
いて貼り付ける除、基板1および基板ホルダ2にインジ
ウム3を十分に馴ま※せるために、基板1を基板ホルダ
2上で滑らせながら接着させるので、基板ホルダ2上の
基板1が置かれていない部分にまでインジウム3が付滑
し、その余分なインジウム3が成長中に蒸発して成長装
置の真空チャンバを汚染する原因となる等の問題点があ
った。However, in addition to pasting indium 3 on the conventional substrate holder 2, the substrate 1 is bonded while sliding on the substrate holder 2 in order to fully adapt the indium 3 to the substrate 1 and the substrate holder 2. , problems such as indium 3 slipping onto the parts of the substrate holder 2 where the substrate 1 is not placed, and the excess indium 3 evaporating during growth and contaminating the vacuum chamber of the growth apparatus. was there.
この発明は、かかる問題点を解消するため罠なされたも
ので、基板上に良好なエピタキシャル成長がなされるよ
5Kした半導体製造装置を提供することを目的とする。The present invention has been made to solve these problems, and an object of the present invention is to provide a 5K semiconductor manufacturing apparatus that allows good epitaxial growth on a substrate.
この発明に係る半導体製造装置は、基板ホルダ上に基板
より小さい凸部を設け、この凸部に基板を貼り付けるよ
うKしたものである。In the semiconductor manufacturing apparatus according to the present invention, a convex portion smaller than the substrate is provided on the substrate holder, and the substrate is attached to the convex portion.
この発明においては、基板ホルダの凸部上に基板が載置
されたとき、基板の方が凸部より大きいので、基板の貼
り付けに使用する溶層材が他の部分にはみ出すこともな
く、エピタキシャル成長中にこのはみ出した溶層材が蒸
発して成長装置の真空チャンバ内を汚染することもない
。In this invention, when the substrate is placed on the convex portion of the substrate holder, the substrate is larger than the convex portion, so the melting layer material used for pasting the substrate does not protrude to other parts. During epitaxial growth, the protruding melt layer material will not evaporate and contaminate the inside of the vacuum chamber of the growth apparatus.
第1図はこの発明の一実施例を示す側面図である。この
図で、1,2.3は第2図と同じものであり、2aは前
記基板ホルダ2上に設けた凸部である。FIG. 1 is a side view showing an embodiment of the present invention. In this figure, 1, 2.3 are the same as those in FIG. 2, and 2a is a convex portion provided on the substrate holder 2.
このように凸部2aは高さにしてlTIm程度、大きさ
は基板1が円形であるとすれば直径にして基板1より2
菌根度小さいことが望ましい。第1図に示すようK、イ
ンジウム3は凸部2aの表面にのみ塗布し、その上に基
&1を貼り付ける。こうすることにより、たとえ溶層材
が浴けても基板1の裏面で覆われる形になり、直接基板
10表面に向って蒸発することはなく、基板10表面が
インジウム3によって汚染されることは極力防ぐことが
可能となる。また基板ホルダ2は基&1より大きいため
、基板1を加熱中、基板1が周囲からの放熱により周辺
部だけが温度が少し低くなるというような温度R配を持
つことも防ぐことができ、基板1を一様に加熱できる。In this way, the height of the convex portion 2a is about 1TIm, and the size is 2 TIm in diameter compared to the substrate 1 if the substrate 1 is circular.
It is desirable that the degree of mycorrhiza is low. As shown in FIG. 1, K and indium 3 are applied only to the surface of the convex portion 2a, and the base &1 is pasted thereon. By doing this, even if the molten layer material is exposed, it will be covered with the back surface of the substrate 1 and will not evaporate directly toward the surface of the substrate 10, thereby preventing the surface of the substrate 10 from being contaminated by indium 3. This can be prevented as much as possible. In addition, since the substrate holder 2 is larger than the base &1, it is possible to prevent the substrate 1 from having a temperature R distribution where only the peripheral part becomes slightly lower in temperature due to heat dissipation from the surroundings while the substrate 1 is being heated. 1 can be heated uniformly.
なお、上記実施例では、分子線エピタキシー装置におい
て用いられる基板ホルダを例にとって説明したが、この
種の他の半導体製造装置にも適用できることはいうまで
もない。Although the above embodiments have been described using a substrate holder used in a molecular beam epitaxy apparatus as an example, it goes without saying that the present invention can also be applied to other semiconductor manufacturing apparatuses of this type.
この発明は以上説明したとおり、基板ホルダ上面に基板
より小径の凸部を設けたので、基板ホルダ上に基板な溶
層材によって貼り付ける際に、溶層材が基板表面を汚染
することを抑えることができ、良好な膜成長を実現でき
る効果が得られる。As explained above, in this invention, a convex portion having a smaller diameter than the substrate is provided on the upper surface of the substrate holder, so that when the welding layer material is attached to the substrate holder, it is possible to suppress the contamination of the substrate surface by the welding layer material. The effect of achieving good film growth can be obtained.
第1図はこの発明の一実施例を示す側面図、第2図は従
来の半導体製造装置を示す側面図である。
図において、1は基板、2は基板ホルダ、2aは凸部、
3はインジウムである。
なお、各図中の同一符号は同一または相当部分を示す。
代理人 大岩増雄 (外2名ン
第1図
1:基板
2:基板ホルダ
2a:凸部
3:インジウム
第2図
手続補正書(自発)
昭和 年 月 日FIG. 1 is a side view showing an embodiment of the present invention, and FIG. 2 is a side view showing a conventional semiconductor manufacturing apparatus. In the figure, 1 is a substrate, 2 is a substrate holder, 2a is a convex part,
3 is indium. Note that the same reference numerals in each figure indicate the same or corresponding parts. Agent Masuo Oiwa (2 others) Diagram 1 1: Substrate 2: Substrate holder 2a: Convex portion 3: Indium Diagram 2 Procedural Amendment (voluntary) Showa Year, Month, Day
Claims (1)
半導体製造装置において、前記半導体基板より大径の基
板ホルダを用い、前記基板ホルダ上に前記半導体基板よ
り小径の凸部を設け、この凸部上に前記半導体基板を貼
り付けたことを特徴とする半導体製造装置。In a semiconductor manufacturing apparatus in which a semiconductor substrate is pasted onto a substrate holder using a welding material, a substrate holder having a diameter larger than that of the semiconductor substrate is used, a convex portion having a smaller diameter than the semiconductor substrate is provided on the substrate holder, and the convex portion A semiconductor manufacturing device, characterized in that the semiconductor substrate is pasted thereon.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4395585A JPS61201419A (en) | 1985-03-04 | 1985-03-04 | Apparatus for manufacture of semiconductor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4395585A JPS61201419A (en) | 1985-03-04 | 1985-03-04 | Apparatus for manufacture of semiconductor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61201419A true JPS61201419A (en) | 1986-09-06 |
Family
ID=12678124
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4395585A Pending JPS61201419A (en) | 1985-03-04 | 1985-03-04 | Apparatus for manufacture of semiconductor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61201419A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001338878A (en) * | 2000-03-21 | 2001-12-07 | Sharp Corp | Susceptor and surface treatment method |
-
1985
- 1985-03-04 JP JP4395585A patent/JPS61201419A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001338878A (en) * | 2000-03-21 | 2001-12-07 | Sharp Corp | Susceptor and surface treatment method |
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