JPS642437Y2 - - Google Patents
Info
- Publication number
- JPS642437Y2 JPS642437Y2 JP3198687U JP3198687U JPS642437Y2 JP S642437 Y2 JPS642437 Y2 JP S642437Y2 JP 3198687 U JP3198687 U JP 3198687U JP 3198687 U JP3198687 U JP 3198687U JP S642437 Y2 JPS642437 Y2 JP S642437Y2
- Authority
- JP
- Japan
- Prior art keywords
- source unit
- evaporation source
- substrate
- electron gun
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000000758 substrate Substances 0.000 claims description 30
- 230000008020 evaporation Effects 0.000 claims description 29
- 238000001704 evaporation Methods 0.000 claims description 29
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 12
- 238000001451 molecular beam epitaxy Methods 0.000 claims description 11
- 230000005484 gravity Effects 0.000 claims description 9
- 239000007788 liquid Substances 0.000 claims description 6
- 229910052757 nitrogen Inorganic materials 0.000 claims description 6
- 230000001154 acute effect Effects 0.000 claims description 5
- 238000001816 cooling Methods 0.000 claims description 4
- 238000000151 deposition Methods 0.000 claims description 2
- 230000008021 deposition Effects 0.000 claims description 2
- 239000012535 impurity Substances 0.000 description 5
- 238000011109 contamination Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Description
【考案の詳細な説明】
〔産業上の利用分野〕
本考案は基板にエピタキシヤル層を成長させる
装置に関し、特に分子線エピタキシ装置に関する
ものである。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to an apparatus for growing an epitaxial layer on a substrate, and particularly relates to a molecular beam epitaxy apparatus.
一般に、上述の分子線エピタキシ装置は、エピ
タキシヤル成長用試料を加熱し蒸発させるために
クヌーセン型セルや電子銃を備えた蒸発源ユニツ
トが、エピタキシヤル成長させる基板面に対向す
るように配置され、該蒸発源ユニツトによつて蒸
発された分子の上記基板への堆積を妨げないよう
に該蒸発源ユニツトの周囲を液体窒素冷却ジヤケ
ツト等で囲んだ構造を有している。
Generally, in the above-mentioned molecular beam epitaxy apparatus, an evaporation source unit equipped with a Knudsen cell or an electron gun is arranged to face the surface of a substrate on which epitaxial growth is to be performed, in order to heat and evaporate a sample for epitaxial growth. The evaporation source unit is surrounded by a liquid nitrogen cooling jacket or the like so as not to prevent the molecules evaporated by the evaporation source unit from being deposited on the substrate.
エピタキシヤル成長中、蒸発源ユニツトによつ
て蒸発噴出される試料の分子線は、約150mm離れ
て配置した基板面に堆積する。1回の成長で、数
種の試料を多いもので基板面に3μm程度を堆積
させる。また各々の堆積物質は生成した膜の特性
上の制約から、その純度は、厳しいもので
0.01ppm程度が要求される。この純度を保つ上で
最も大きな障害となつている点は、基板面以外に
堆積した試料がはがれてクヌーセン型セルや電子
銃の内部に落下し、試料7へ不純物となつて混入
することである。 During epitaxial growth, the molecular beam of the sample evaporated and ejected by the evaporation source unit is deposited on the substrate surface located approximately 150 mm apart. In one growth, several types of samples are deposited on the substrate surface to a thickness of approximately 3 μm. Furthermore, the purity of each deposited substance is subject to strict limitations due to the characteristics of the produced film.
Approximately 0.01ppm is required. The biggest obstacle to maintaining this purity is that the sample deposited on surfaces other than the substrate surface peels off and falls into the Knudsen cell or electron gun, contaminating sample 7 as impurities. .
このため、従来、分子線エピタキシ装置では、
第2図に示すように、クヌーセン型セル3及び電
子銃4を含む蒸発源ユニツトを下部に配置し、そ
の直上に成長膜生成面を下方へ向けて基板1を配
置するものが一般に用いられており、この場合既
述のクヌーセン型セル3及び電子銃4内の試料7
への不純物混入は避け得なかつた。
For this reason, conventional molecular beam epitaxy equipment
As shown in FIG. 2, an evaporation source unit including a Knudsen cell 3 and an electron gun 4 is placed at the bottom, and a substrate 1 is placed directly above the evaporation source unit with the growth film production surface facing downward. In this case, the sample 7 in the Knudsen cell 3 and the electron gun 4 described above
Contamination with impurities was unavoidable.
また、特殊なケースとして、この不純物混入を
避けるため第3図の如くクヌーセン型セル3及び
8を含む蒸発源ユニツトと基板1を互いに重力方
向に対し垂直に配置した装置がある。この場合、
クヌーセン型セル3及び8への試料7の仕込量が
極端に少なくなり、試料7を仕込むために真空系
を大気に開放する頻度が著しく増加し作業能率を
低下させる。しかも、蒸発させる際溶融する試料
はこれに増して仕込量に制限を受ける。そこで、
この形の配置ではクヌーセン型セルの噴出口に流
出防止用の特殊な蓋を設けたもの8もあるが、さ
したる効果は得られていない。また蒸発させる試
料によつては例えばSiの場合にはクヌーセン型セ
ルが使用できず電子ビーム加熱型蒸発源が必要に
なる。この場合試料は、すりばち状の水冷ハース
に載せる形となり、横方向に使用することは不可
能である。 As a special case, there is a device in which an evaporation source unit including Knudsen cells 3 and 8 and a substrate 1 are disposed perpendicular to the direction of gravity, as shown in FIG. 3, in order to avoid contamination with impurities. in this case,
The amount of sample 7 charged into the Knudsen cells 3 and 8 becomes extremely small, and the frequency of opening the vacuum system to the atmosphere to charge sample 7 increases significantly, reducing work efficiency. Moreover, the amount of sample that is melted during evaporation is even more limited. Therefore,
In this type of arrangement, some Knudsen cells are equipped with a special lid on the outlet to prevent leakage, but this has not been very effective. Furthermore, depending on the sample to be evaporated, for example, in the case of Si, a Knudsen type cell cannot be used and an electron beam heating type evaporation source is required. In this case, the sample is placed on a mortar-shaped water-cooled hearth, and it is impossible to use it horizontally.
なお、第2図及び第3図において、5が液体窒
素ジヤケツト、2は基板保持部品、6はシヤツタ
である。 In addition, in FIGS. 2 and 3, 5 is a liquid nitrogen jacket, 2 is a substrate holding component, and 6 is a shutter.
そこで、本考案は上述した上下対向型と左右対
向型の上記欠点を補う蒸発源ユニツトと基板との
配置関係を達成するものである。 Therefore, the present invention aims to achieve a positional relationship between the evaporation source unit and the substrate that compensates for the above-mentioned drawbacks of the vertically opposed type and the leftwardly opposed type.
本考案によれば、エピタキシヤル成長用試料を
加熱し蒸発させるためにクヌーセン型セル及び電
子銃を備えた蒸発源ユニツトが、エピタキシヤル
成長させる基板面に対向するように配置され、該
蒸発源ユニツトによつて蒸発された分子の上記基
板への堆積を妨げないように前記蒸発源ユニツト
の周辺を液体窒素冷却ジヤケツト等で囲んだ構造
を有する分子線エピタキシ装置であつて、上記蒸
発源ユニツトと上記基板とを、前記蒸発源ユニツ
トが上記基板の斜め下方に位置するように互いの
対向関係をくずすことなく互いの対向方向を重力
の方向に対して30゜ないし50゜の角度に傾けて配置
し、且つ、上記電子銃と上記基板との対向方向と
重力方向との成す鋭角は、上記クヌーセン型セル
と上記基板との対向方向と重力方向との成す鋭角
よりも小さくなるように上記蒸発源ユニツト内に
配置したことを特徴とする分子線エピタキシ装置
が得られる。 According to the present invention, in order to heat and evaporate a sample for epitaxial growth, an evaporation source unit equipped with a Knudsen cell and an electron gun is disposed so as to face the surface of a substrate to be epitaxially grown, and the evaporation source unit The molecular beam epitaxy apparatus has a structure in which the periphery of the evaporation source unit is surrounded by a liquid nitrogen cooling jacket or the like so as not to hinder the deposition of molecules evaporated by the evaporation source unit onto the substrate, the evaporation source unit and the and a substrate, the evaporation source unit is positioned diagonally below the substrate, and the opposing directions are tilted at an angle of 30° to 50° with respect to the direction of gravity without destroying the mutual facing relationship. , and the evaporation source unit is arranged such that the acute angle between the direction in which the electron gun and the substrate face each other and the direction of gravity is smaller than the acute angle between the direction in which the Knudsen cell and the substrate face each other and the direction of gravity. A molecular beam epitaxy apparatus is obtained, which is characterized in that the molecular beam epitaxy apparatus is disposed within
以下図面を参照して本考案の実施例を説明す
る。
Embodiments of the present invention will be described below with reference to the drawings.
本考案の一実施例による分子線エピタキシ装置
は、第1図に示したように、クヌーセン型セル3
および電子銃4を含む蒸発源ユニツトと基板1と
を、該蒸発源ユニツトが基板1の斜め下方に位置
するように互いの対向関係をくずすことなく互い
の対向方向を重力の方向に対して45゜±15゜の角度
に傾けて配置し、且つ、上記電子銃は上記クヌー
セン型セルよりも下方に配置したことを特徴とす
る。このようにすることにより、
1 基板1面以外の部分、すなわち基板保持部品
2、シヤツタ6、第1図に示された部分を取り
囲む真空槽(図示せず)等、からはがれた蒸発
物が直接クヌーセン型セル3および電子銃4内
に落下して試料7に不純物が混入することを有
効に防ぐことができる。 A molecular beam epitaxy apparatus according to an embodiment of the present invention has a Knudsen type cell 3 as shown in FIG.
Then, the evaporation source unit including the electron gun 4 and the substrate 1 are arranged such that the evaporation source unit is located diagonally below the substrate 1, so that the facing direction of each other is 45 degrees with respect to the direction of gravity without destroying the mutual facing relationship. The electron gun is arranged at an angle of ±15°, and the electron gun is arranged below the Knudsen cell. By doing this, 1. Evaporated matter that has come off from parts other than the board 1 surface, such as the board holding part 2, the shutter 6, and the vacuum chamber (not shown) surrounding the part shown in FIG. It is possible to effectively prevent impurities from falling into the Knudsen cell 3 and the electron gun 4 and mixing into the sample 7.
2 第3図に示されるとおり、電子銃4と基板1
との対向方向と重力方向との成す鋭角は、クヌ
ーセン型セル3と基板1との対向方向と重力方
向との成す角よりも小さくなるように蒸発源ユ
ニツト内に配置し、即ち、クヌーセン型セル3
よりも下方に電子銃4を配置することにより、
蒸発源ユニツトと基板1との対向方向が、重力
の方向に対して45゜の角度で傾斜させたとして
も、基板1と電子銃4との対向方向は、重力の
方向に対して、実質的に、45゜よりも緩く傾け
る(30゜)ことができるから、クヌーセン型セ
ル3および電子銃4への試料7の仕込量が45゜
の傾斜角で約7割が確保できる。2 As shown in FIG. 3, the electron gun 4 and the substrate 1
The evaporation source unit is arranged in such a way that the acute angle formed between the opposing direction of the Knudsen cell 3 and the substrate 1 and the gravitational direction is smaller than the angle formed between the opposing direction of the Knudsen cell 3 and the substrate 1 and the gravitational direction. 3
By placing the electron gun 4 lower than
Even if the facing direction of the evaporation source unit and the substrate 1 is inclined at an angle of 45 degrees with respect to the direction of gravity, the facing direction of the substrate 1 and the electron gun 4 is substantially tilted with respect to the direction of gravity. In addition, since it can be tilted more gently than 45 degrees (30 degrees), approximately 70% of the amount of sample 7 fed into the Knudsen cell 3 and electron gun 4 can be secured at a tilt angle of 45 degrees.
3 上述の傾斜角が70゜より大きくなると試料7
を加熱し蒸発させるために電子銃4を用いるこ
とができないが、上記傾斜角を70゜以下にする
と試料7の仕込量に多少の制限を受けるが試料
7を加熱し蒸発させるために電子銃4を用いる
ことができる。3 When the above-mentioned inclination angle is larger than 70°, sample 7
The electron gun 4 cannot be used to heat and evaporate the sample 7, but if the above-mentioned inclination angle is set to 70 degrees or less, the amount of sample 7 to be prepared is somewhat limited. can be used.
等の効果が得られる。Effects such as this can be obtained.
なお、第1図において、5が液体窒素冷却ジヤ
ケツトである。 In addition, in FIG. 1, 5 is a liquid nitrogen cooling jacket.
以上説明したように、本考案によれば、クヌー
セン型セルまたは電子銃内の試料への不純物の混
入を有効に防ぐことができ、かなり多量の試料を
仕込むことができ、しかも試料を加熱し蒸発させ
るために電子銃を用いることができる。
As explained above, according to the present invention, it is possible to effectively prevent impurities from entering the sample in the Knudsen cell or electron gun, it is possible to prepare a considerably large amount of sample, and the sample can be heated and evaporated. An electron gun can be used to do this.
第1図は本考案の一実施例による分子線エピタ
キシ装置の配置を示す断面図、第2図及び第3図
はそれぞれ従来の分子線エピタキシ装置の配置を
示す断面図である。
1……基板、2……基板保持部品、3……クヌ
ーセン型セル、4……電子銃、5……液体窒素ジ
ヤケツト、6……シヤツタ、7……試料、8……
流出防止フタ付クヌーセン型セル。
FIG. 1 is a sectional view showing the arrangement of a molecular beam epitaxy apparatus according to an embodiment of the present invention, and FIGS. 2 and 3 are sectional views showing the arrangement of a conventional molecular beam epitaxy apparatus. DESCRIPTION OF SYMBOLS 1...Substrate, 2...Substrate holding part, 3...Knudsen type cell, 4...Electron gun, 5...Liquid nitrogen jacket, 6...Shutter, 7...Sample, 8...
Knudsen type cell with leakage prevention lid.
Claims (1)
ためにクヌーセン型セル及び電子銃を備えた蒸発
源ユニツトが、エピタキシヤル成長させる基板面
に対向するように配置され、該蒸発源ユニツトに
よつて蒸発された分子の上記基板への堆積を妨げ
ないように前記蒸発源ユニツトの周辺を液体窒素
冷却ジヤケツト等で囲んだ構造を有する分子線エ
ピタキシ装置であつて、上記蒸発源ユニツトと上
記基板とを、前記蒸発源ユニツトが上記基板の斜
め下方に位置するように互いの対向関係をくずす
ことなく互いの対向方向を重力の方向に対して
30゜ないし50゜の角度に傾けて配置し、且つ、上記
電子銃と上記基板との対向方向と重力方向との成
す鋭角は、上記クヌーセン型セルと上記基板との
対向方向と重力方向との成す鋭角よりも小さくな
るように上記蒸発源ユニツト内に配置したことを
特徴とする分子線エピタキシ装置。 In order to heat and evaporate the sample for epitaxial growth, an evaporation source unit equipped with a Knudsen cell and an electron gun is disposed so as to face the surface of the substrate to be epitaxially grown, and evaporation is performed by the evaporation source unit. The molecular beam epitaxy apparatus has a structure in which the periphery of the evaporation source unit is surrounded by a liquid nitrogen cooling jacket or the like so as not to hinder the deposition of molecules on the substrate, the evaporation source unit and the substrate are The source units are located diagonally below the board, so that they face each other in the direction of gravity without destroying their mutual facing relationship.
They are arranged at an angle of 30° to 50°, and the acute angle formed between the opposing direction of the electron gun and the substrate and the direction of gravity is the same as the angle between the opposing direction of the Knudsen type cell and the substrate and the gravitational direction. A molecular beam epitaxy apparatus characterized in that the evaporation source unit is arranged within the evaporation source unit so that the angle is smaller than the acute angle formed by the evaporation source unit.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3198687U JPS642437Y2 (en) | 1987-03-06 | 1987-03-06 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3198687U JPS642437Y2 (en) | 1987-03-06 | 1987-03-06 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62147334U JPS62147334U (en) | 1987-09-17 |
JPS642437Y2 true JPS642437Y2 (en) | 1989-01-20 |
Family
ID=30838233
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3198687U Expired JPS642437Y2 (en) | 1987-03-06 | 1987-03-06 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS642437Y2 (en) |
-
1987
- 1987-03-06 JP JP3198687U patent/JPS642437Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS62147334U (en) | 1987-09-17 |
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