JPS62115820A - Molecular beam crystal growth device - Google Patents

Molecular beam crystal growth device

Info

Publication number
JPS62115820A
JPS62115820A JP25508885A JP25508885A JPS62115820A JP S62115820 A JPS62115820 A JP S62115820A JP 25508885 A JP25508885 A JP 25508885A JP 25508885 A JP25508885 A JP 25508885A JP S62115820 A JPS62115820 A JP S62115820A
Authority
JP
Japan
Prior art keywords
molecular beam
shutter
beam source
impurity
source cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP25508885A
Other languages
Japanese (ja)
Other versions
JPH022283B2 (en
Inventor
Akihiro Shibatomi
昭洋 柴富
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP25508885A priority Critical patent/JPS62115820A/en
Publication of JPS62115820A publication Critical patent/JPS62115820A/en
Publication of JPH022283B2 publication Critical patent/JPH022283B2/ja
Granted legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)

Abstract

PURPOSE:To allow growth of high quality impurity-free crystal and obtain a high performance semiconductor material by providing a shutter for capturing impurity comprising a control shutter and impurity accommodating part in front of the molecular beam source cell of molecular beam crystal growth device. CONSTITUTION:A movable shutter 21 for capturing vaporized substance is arranged in parallel with a opening and closing controllable control shutter 22 at the rear position of said shutter arranged in front of the molecular beam source cells of MBE device. Namely, the control shutter 22 is moved in the direction of arrow mark A in front of the opening 9 of molecular beam source cell, the shutter 21 for capturing impurity moves, in place of it, in the direction of arrow mark C and it is then arranged in front of the aperture 9 of molecular beam source cell. Under this condition, impurity, gas or vaporized substance from the molecular beam source material are adhered to the impurity shielding shutter surface and impurity is not adhered at all to the control shutter. Therefore, since vaporized substance of impurity adhered to the surface of foreign matter capturing shutter drops to and is accommodated in the impurity accommodating part of foreign matter capturing shutter, the peeled impurity drops into the impurity accommodation part and does not enter the molecular beam source cell even when the molecular beam growth device vibrates.

Description

【発明の詳細な説明】 [概要] 本発明は、分子線結晶成長装置(以下MBE装置と略称
)における分子線源セルのシャッタの構造であって、分
子線源セルにチャージされた分子線源材料に含まれるガ
スや不純物を除去するために、超高真空中で分子線源材
料を長時間にわたり加熱するが、その際に分子線源材料
も超高真空中に蒸発して、されらの蒸発材料が低温度の
分子線制御シャッタに付着する。
[Detailed Description of the Invention] [Summary] The present invention relates to a structure of a shutter of a molecular beam source cell in a molecular beam crystal growth apparatus (hereinafter abbreviated as MBE apparatus), which comprises a molecular beam source charged in the molecular beam source cell. In order to remove gases and impurities contained in the material, the molecular beam source material is heated for a long period of time in an ultra-high vacuum, but at that time the molecular beam source material also evaporates in the ultra-high vacuum and its The evaporated material attaches to the low temperature molecular beam control shutter.

この結果、制御シャッタの付着物が制御シャツタ開閉時
の撮動等で剥離して分子線源セルに混入して、分子線源
の汚染源となる。
As a result, the deposits on the control shutter are peeled off during photographing when the control shutter is opened and closed and mixed into the molecular beam source cell, becoming a source of contamination of the molecular beam source.

本発明は、新たに付着異物捕捉用シャッタを設けること
により付着異物混入のない良質のエピタキシャル成長を
行う装置を提供するものである。
The present invention provides an apparatus that performs high-quality epitaxial growth without contamination by foreign matter by newly providing a shutter for trapping foreign matter.

[産業上の利用分野] 本発明は、分子線結晶成長装置に係り、特に分子線源セ
ルの前面に配置されたシャッタの構造に関するものであ
る。
[Industrial Field of Application] The present invention relates to a molecular beam crystal growth apparatus, and particularly to the structure of a shutter disposed in front of a molecular beam source cell.

近時、分子線結晶成長方法を利用することにより、超格
子構造の薄膜や多層へテロ接合の構造を可能にした。ま
た薄膜形成条件の制御を高精度にすることができるため
に、その利用は急速に増加している。
Recently, by using the molecular beam crystal growth method, it has become possible to create thin films with superlattice structures and multilayer heterojunction structures. Furthermore, since thin film formation conditions can be controlled with high precision, its use is rapidly increasing.

特に、高電子易動度トランジスタ(HEMT)をはじめ
、新しいレーザ素子に使用されているガリウム砒素(G
aAs)やアルミニウム、ガリウム砒素(AIGaAs
)薄膜の形成等には、制御性が良好で高品質であり、再
現性の優れたMBE法が利用されている。
In particular, gallium arsenide (G) is used in new laser devices, including high electron mobility transistors (HEMTs).
aAs), aluminum, gallium arsenide (AIGaAs)
) The MBE method, which has good controllability, high quality, and excellent reproducibility, is used for forming thin films.

一般に、MBE装置に使用される分子線源は、高品質の
エピタキシャル結晶を得るために、分子線源材料をチャ
ージした後、結晶成長に先立って、分子線源材料に含ま
れるガスや不純物を除去しなければならない。この除去
方法として、分子線源材料を超高真空中で長時間加熱す
ることにより、分子線源材料から不純物を蒸発除去する
方法がとられている。
In general, in order to obtain high-quality epitaxial crystals, molecular beam sources used in MBE equipment charge the molecular beam source material and remove gases and impurities contained in the molecular beam source material prior to crystal growth. Must. As a method for removing impurities from the molecular beam source material, the impurities are removed by evaporation from the molecular beam source material by heating the material in an ultra-high vacuum for a long time.

この際に、分子線源材料に含まれるガスや不純物の他に
、分子線源材料自体も加熱によって、かなりの量が蒸発
することになる。
At this time, in addition to gases and impurities contained in the molecular beam source material, a considerable amount of the molecular beam source material itself is evaporated due to heating.

然しなから、従来のMBE装置では、分子線源の前面に
、低温の制御用シャフタを配置したまま、ガスや不純物
の除去を行うために、蒸発した分子線源材料や不純物は
、総て低温度の制御シャッタに付着する。その結果この
付着物が制御シャ、夕の開閉による振動等で剥離して、
分子線源セルに混入して、汚染源になるという不都合が
あるため、その改善が要望されている。
However, in conventional MBE equipment, gases and impurities are removed while a low-temperature control shaft is placed in front of the molecular beam source, so all of the evaporated molecular beam source material and impurities are Adhere to the temperature control shutter. As a result, this deposit peels off due to vibrations caused by opening and closing of the control shaft, etc.
Since there is a problem that it mixes into the molecular beam source cell and becomes a source of contamination, there is a desire to improve this problem.

[従来の技術] 従来の一実施例として、HEMT等に使用されるGaA
s化合物、アルミニウムガリウム砒素(AIGaAs)
化合物のうち、GaAs化合物をMBE装置によって成
長する場合について説明する。
[Prior Art] As a conventional example, GaA used in HEMT etc.
s compound, aluminum gallium arsenide (AIGaAs)
Among the compounds, a case where a GaAs compound is grown using an MBE apparatus will be described.

第2図は、従来の分子線結晶成長装置の装置内の配置を
示す模式要部断面図である。
FIG. 2 is a schematic cross-sectional view of essential parts showing the arrangement inside a conventional molecular beam crystal growth apparatus.

分子線結晶成長装置の超高真空容器1があり、通常真空
度はlQ−Torr以下の超高真空に保たれ、その内部
には、成長基板2が基板ホルダ3によって保持され、ヒ
ータ4により基板の温度は600°C〜700℃に加熱
されている。
There is an ultra-high vacuum chamber 1 of a molecular beam crystal growth apparatus, and the degree of vacuum is normally maintained at an ultra-high vacuum of 1Q-Torr or less. is heated to a temperature of 600°C to 700°C.

分子源セルには、それぞれの分子線源セルに所定の原料
をチャージするが、砒素を充填する分子源セル5とガリ
ウムを充填する分子源セル6に、それぞれ砒素7と、ガ
リウム8が通量だけ充填されている。
Each molecular beam source cell is charged with a predetermined raw material, and arsenic 7 and gallium 8 are passed through the molecular source cell 5 filled with arsenic and the molecular source cell 6 filled with gallium, respectively. Only filled.

分子線源セルの材料は、高純度で、且つガリウムや砒素
と容易に化学反応をしない、熱分解沈着型のボロンナイ
トライド(PBN)が使用されるのが普通である。分子
線源セルの形状は、通常開口部9が真円の円筒または円
錐型の坩堝が使用されている。
The material used for the molecular beam source cell is usually pyrolytically deposited boron nitride (PBN), which has high purity and does not easily chemically react with gallium or arsenic. The shape of the molecular beam source cell is usually a cylindrical or conical crucible with an opening 9 of a perfect circle.

MBEW置で結晶成長を行う際には、予めMBE装置の
真空容器の内壁に被着しているガスや水分を除去する目
的で、真空容器全体を250′C程度で、長時間の加熱
をして脱ガスを行なう。続いて、それぞれの分子源セル
に充填された分子線源材料のガスと不純物を除去するた
めの加熱が行われる。この場合、基板支持周辺に蒸発物
が蒸着することを防止するために、分子線源セルの前面
に制御用シャッタ11が配置されている。その結果、そ
れぞれの制御シャッタの表面には、分子源材料と、その
なかに含まれている不純物とが蒸発して付着する。
When crystal growth is performed in an MBEW device, the entire vacuum container is heated at approximately 250'C for a long period of time in order to remove gas and moisture adhering to the inner wall of the vacuum container of the MBE device. Perform degassing. Subsequently, heating is performed to remove gas and impurities from the molecular beam source material filled in each molecular source cell. In this case, a control shutter 11 is disposed in front of the molecular beam source cell to prevent evaporated matter from being deposited around the substrate support. As a result, the molecular source material and the impurities contained therein evaporate and adhere to the surface of each control shutter.

次に、ガリウム砒素化合物の結晶成長をする際は、制御
シャッタ11を矢印A方向に移Usさせ、砒素7が充填
された分子線源セル5を約300℃に加熱し、ガリウム
8が充填された分子線源セル6を約1000℃程度に加
熱して分子線源材料の蒸発が行われる。
Next, when growing a crystal of a gallium arsenide compound, the control shutter 11 is moved in the direction of arrow A, the molecular beam source cell 5 filled with arsenic 7 is heated to about 300°C, and the molecular beam source cell 5 filled with arsenic 7 is heated to about 300°C. The molecular beam source material is evaporated by heating the molecular beam source cell 6 to about 1000°C.

蒸発した砒素とガリウムの分子は、それぞれの分子線源
セル5.6から基板支持器方向に蒸発して基板上に被着
成長する。成長速度が1μm / hr程度の割合で、
高品質のガリウム砒素化合物が成長される。
The evaporated arsenic and gallium molecules evaporate from each molecular beam source cell 5.6 toward the substrate support and grow on the substrate. At a growth rate of about 1 μm/hr,
High quality gallium arsenide compounds are grown.

然しなから、前記の制御シャッタに付着した不純物の被
着膜は1.振動や開閉時のショック等によリ、それらの
不純物が分子源セルに混入して、分子線材料を汚染する
原因になる。特にガリウムの場合には、制御用シャッタ
に付着したガリウムは、粘性のある融液状であるために
、かなり厚く付着する。そして付着部分から落下したガ
リウムが分子線源を汚染する程度が大きくなる。また制
御用シャッタに付着したガリウムは流出してシャッタの
可動部分に付着した結果、シャッタの機能を阻害する等
の不都合が生ずる。
However, the film of impurities attached to the control shutter is 1. Due to vibrations, shocks during opening and closing, etc., these impurities enter the molecular source cell and cause contamination of the molecular beam material. Particularly in the case of gallium, the gallium that adheres to the control shutter is in the form of a viscous melt, so it adheres quite thickly. The extent to which gallium falling from the attached portion contaminates the molecular beam source increases. Further, the gallium that has adhered to the control shutter flows out and adheres to the movable parts of the shutter, resulting in problems such as inhibiting the function of the shutter.

また砒素の場合には、砒素が制御用シャッタに成程度の
厚みに付着すると、剥離をおこして飛散し、ガリウムの
場合と同様な欠点を生ずる。
In the case of arsenic, if arsenic adheres to a certain thickness on the control shutter, it will peel off and scatter, causing the same drawbacks as in the case of gallium.

[発明が解決しようとする問題点] 従来の、MBEvi置の分子線源セルの前面に配置され
た制御用シャンクは、分子線源材料の加熱の際に不純物
と分子線源材料が蒸着し、その蒸着物が振動等により剥
離落下して、分子源セルに混入し、分子線源材料の純度
を低下させるということが問題点である。
[Problems to be Solved by the Invention] The conventional control shank placed in front of the molecular beam source cell of the MBEvi device has the problem that impurities and the molecular beam source material are deposited during heating of the molecular beam source material. The problem is that the deposits may peel off and fall due to vibrations or the like, enter the molecular source cell, and reduce the purity of the molecular beam source material.

c問題点を解決するための手段フ 本発明は、上記問題点を解決するためのMBE装置を提
供するもので、その解決の手段は、MBE装置の分子線
源セルの前面に配置された開閉可能な制御用シャッタの
後部の位置で、その制御用シャッタと平行に、移動可能
な茎発物捕捉用シャッタを配置することにより解決され
る。
c. Means for solving the problems The present invention provides an MBE apparatus for solving the above problems. The problem is solved by arranging a movable stem capture shutter parallel to the control shutter in a rear position of the control shutter.

[作用] 本発明は、MBE装置の分子線源セルを加熱して分子線
材料を浄化する際に、分子線源セルのi:1面に配置さ
れた制御用シャッタに蒸発物が付着して、その蒸発物が
、分子源セルに混入して分子線源材料の純度を低下させ
ることを防止するものである。分子線源材料を浄化のた
めに加熱する場合、制御用シャッタは分子線源セルの前
面から移動する。その代わり移動可能な異物捕捉用シャ
ッタを分子線源セルの前面に配置する。異物捕捉用シャ
ッタの表面に不純物を付着させ、充分分子線源材料から
不純物が除去がなされた後に、異物hti捉用シャッタ
を除去する。そして再び制御用シャッタを分子線源セル
の前面に移動させる。以上のごとく分子線材料から不純
物を除去する場合に、両シャ、夕を適宜開閉して蒸着物
を除去し、再混入を防止するようにしたものである。こ
れにより高品質テ均−性のあるエピタキシャル結晶を成
長することができる。
[Function] The present invention prevents evaporated matter from adhering to the control shutter disposed on the i:1 side of the molecular beam source cell when heating the molecular beam source cell of the MBE apparatus to purify the molecular beam material. This is to prevent the evaporated matter from entering the molecular source cell and reducing the purity of the molecular beam source material. When heating the molecular beam source material for purification, the control shutter is moved from the front of the molecular beam source cell. Instead, a movable foreign matter trapping shutter is placed in front of the molecular beam source cell. Impurities are attached to the surface of the shutter for trapping foreign matter, and after the impurities are sufficiently removed from the molecular beam source material, the shutter for trapping foreign matter hti is removed. Then, the control shutter is moved to the front of the molecular beam source cell again. As described above, when impurities are removed from the molecular beam material, the vapor deposits are removed by appropriately opening and closing both the shutters and the valve, thereby preventing re-contamination. This makes it possible to grow epitaxial crystals of high quality and uniformity.

[実施例コ 第1図(a)〜第1図(blは本発明による分子線結晶
成長装置の動作を説明するための模式要部断面図である
[Example 1] Figures 1(a) to 1(bl are schematic cross-sectional views of essential parts for explaining the operation of the molecular beam crystal growth apparatus according to the present invention.

第1図(a)は分子線源材料の不純物を浄化するために
、加熱している状態を示している。
FIG. 1(a) shows a state in which the molecular beam source material is heated to purify impurities.

真空容器20内の基板2、基板ホルダ3、分子線源セル
5.6や分子線源材料7.8は第2図と同様である。
The substrate 2, substrate holder 3, molecular beam source cell 5.6, and molecular beam source material 7.8 in the vacuum container 20 are the same as those shown in FIG.

分子線源セルの開口部9の前面では、制御用シャッタ2
2は矢印六方向に移動され、代わりに移動する不純物捕
捉用シャッタ21が矢印C方向に移動して、分子線源セ
ルの開口部9の前面に配置されている。
In front of the opening 9 of the molecular beam source cell, a control shutter 2 is installed.
2 is moved in the six directions of the arrow, and the moving impurity trapping shutter 21 is moved in the direction of the arrow C to be placed in front of the opening 9 of the molecular beam source cell.

この状態では、分子線源材料からの不純物やガスまたは
蒸発物質は不純物a蔽用シャッタ面に付着し、反面制御
用シャッタには全く不純物の付着がない。
In this state, impurities, gases, or evaporated substances from the molecular beam source material adhere to the impurity shielding shutter surface, whereas no impurities adhere to the control shutter surface.

第1図(blは、第1図(a)に示した分子線源セルの
In浄化の後に行われるエピタキシャル成長をする際の
、制御用シャッタと不純物捕捉用シャッタの動作を示し
ている。
FIG. 1(bl) shows the operation of the control shutter and the impurity trapping shutter during epitaxial growth performed after In purification of the molecular beam source cell shown in FIG. 1(a).

この状態では、不純物や蒸発物質が付着した不純物捕捉
用シャッタ21は、分子線源セルの開口部9の前面から
矢印でしめすD方向に移動し、入れ換わりに制御用シャ
ッタ22が分子線源セルの開口部の前面の矢印Bの方向
に移動して、適宜開閉して分子線結晶成圏の制御を行う
ことになる。
In this state, the impurity trapping shutter 21 to which impurities and evaporated substances have adhered moves in the direction D shown by the arrow from the front of the opening 9 of the molecular beam source cell, and the control shutter 22 replaces the molecular beam source cell. The molecular beam crystallization sphere is controlled by moving in the direction of arrow B in front of the opening and opening and closing as appropriate.

従って、異物捕捉用シャッタの表面に付着した不純物の
蒸発物質は、異物捕捉用シャッタの下部に設けられた不
純物収納部23に落下収納されるので、分子線結晶成長
装置に振動等があっても、不純物の剥離物は不純物収納
部に落下し、分子線源セルに混入することがない。
Therefore, the evaporated substances of impurities attached to the surface of the shutter for trapping foreign matter fall and are stored in the impurity storage section 23 provided at the bottom of the shutter for trapping foreign matter, so even if there is vibration etc. in the molecular beam crystal growth apparatus. The peeled impurities fall into the impurity storage section and do not mix into the molecular beam source cell.

[発明の効果] 以上、詳細に説明したように、本発明による分子線結晶
成長装置の分子線源セルの前面に、制御用シャッタと更
に不純物収納部を備えた不純物捕捉用シャッタを設ける
ことにより、不純物のない高品質の結晶が成長でき、高
性能の半導体材料が供し得るという効果大なるものがあ
る。
[Effects of the Invention] As explained above in detail, by providing a control shutter and an impurity trapping shutter including an impurity storage section on the front side of the molecular beam source cell of the molecular beam crystal growth apparatus according to the present invention, This has the great effect of allowing the growth of high-quality crystals free of impurities and providing high-performance semiconductor materials.

【図面の簡単な説明】[Brief explanation of drawings]

第1図(a)〜第1図(b)は、本発明の分子線源セル
のシャッタの機能を示す模式要部断面図、第2図は、従
来の分子線源セルのシャッタの機能を示す模式要部断面
図、 図において、 2は基板、       3は基板ホルダ、5.6は分
子線源セル、 7.8は分子線源材料、9は開口部、 21は不純物捕捉用シャッタ、 22は制御用シャンク、 23は不純物収納部、をそれ
ぞれ示している。 刷打ジp入工修財代表 箋りカ 土 1jII  図 第2図
1(a) to 1(b) are schematic cross-sectional views of main parts showing the function of the shutter of the molecular beam source cell of the present invention, and FIG. 2 shows the function of the shutter of the conventional molecular beam source cell. 2 is a substrate, 3 is a substrate holder, 5.6 is a molecular beam source cell, 7.8 is a molecular beam source material, 9 is an opening, 21 is an impurity trapping shutter, 22 23 indicates a control shank, and 23 indicates an impurity storage section. Representative of Printing Construction and Repairs Irika Sat 1jII Figure 2

Claims (1)

【特許請求の範囲】 基板を保持する基板ホルダと、 分子線源材料を収容する分子線源セルと、 該分子線源セルの開口部(9)の前面に配置された開閉
可能な制御用シャッタ(22)と、 該制御用シャッタ(22)より基板ホルダ側に設けられ
た不純物捕捉用シャッタ(21)とを備え、該不純物捕
捉用シャッタ(21)は分子線源セルからの蒸発物を捕
捉する捕捉部と、捕捉した物質を収納する収納部とを有
し、分子線源材料をヒータで加熱するのを開始したとき
に該開口部を覆い、結晶成長のとき除かれるように移動
可能であることを特徴とする分子線結晶成長装置。
[Claims] A substrate holder that holds a substrate, a molecular beam source cell that accommodates a molecular beam source material, and an openable and closable control shutter disposed in front of an opening (9) of the molecular beam source cell. (22), and an impurity trapping shutter (21) provided closer to the substrate holder than the control shutter (22), and the impurity trapping shutter (21) traps evaporated matter from the molecular beam source cell. and a storage part that stores the captured substance, and is movable so as to cover the opening when heating of the molecular beam source material with a heater starts and to be removed during crystal growth. A molecular beam crystal growth apparatus characterized by the following.
JP25508885A 1985-11-15 1985-11-15 Molecular beam crystal growth device Granted JPS62115820A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25508885A JPS62115820A (en) 1985-11-15 1985-11-15 Molecular beam crystal growth device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25508885A JPS62115820A (en) 1985-11-15 1985-11-15 Molecular beam crystal growth device

Publications (2)

Publication Number Publication Date
JPS62115820A true JPS62115820A (en) 1987-05-27
JPH022283B2 JPH022283B2 (en) 1990-01-17

Family

ID=17273958

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25508885A Granted JPS62115820A (en) 1985-11-15 1985-11-15 Molecular beam crystal growth device

Country Status (1)

Country Link
JP (1) JPS62115820A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112746318A (en) * 2020-12-11 2021-05-04 湖南烁科晶磊半导体科技有限公司 Beam source furnace shutter for three-state molecular beam epitaxy

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112746318A (en) * 2020-12-11 2021-05-04 湖南烁科晶磊半导体科技有限公司 Beam source furnace shutter for three-state molecular beam epitaxy
CN112746318B (en) * 2020-12-11 2022-02-18 湖南烁科晶磊半导体科技有限公司 Beam source furnace shutter for three-state molecular beam epitaxy

Also Published As

Publication number Publication date
JPH022283B2 (en) 1990-01-17

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