JP3157866B2 - Substrate holder for molecular beam crystal growth and molecular beam crystal growth method - Google Patents

Substrate holder for molecular beam crystal growth and molecular beam crystal growth method

Info

Publication number
JP3157866B2
JP3157866B2 JP26593391A JP26593391A JP3157866B2 JP 3157866 B2 JP3157866 B2 JP 3157866B2 JP 26593391 A JP26593391 A JP 26593391A JP 26593391 A JP26593391 A JP 26593391A JP 3157866 B2 JP3157866 B2 JP 3157866B2
Authority
JP
Japan
Prior art keywords
substrate
molecular beam
crystal growth
beam crystal
substrate holder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP26593391A
Other languages
Japanese (ja)
Other versions
JPH05109875A (en
Inventor
光隆 坪倉
仁章 平間
浩 岡田
純朗 酒井
成典 ▲高▼岸
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
Original Assignee
Sumitomo Electric Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries Ltd filed Critical Sumitomo Electric Industries Ltd
Priority to JP26593391A priority Critical patent/JP3157866B2/en
Publication of JPH05109875A publication Critical patent/JPH05109875A/en
Application granted granted Critical
Publication of JP3157866B2 publication Critical patent/JP3157866B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】この発明は、半導体、特に化合物
半導体の基板上にエピタキシャル層を成長させるための
分子線結晶成長法およびそれに用いられる基板ホルダに
関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a molecular beam crystal growth method for growing an epitaxial layer on a substrate of a semiconductor, particularly a compound semiconductor, and a substrate holder used for the method.

【0002】[0002]

【従来の技術】分子線結晶成長を行なうにあたり、基板
は高真空にされた装置内で基板ホルダによって保持され
る。図3に従来の基板ホルダを示す。基板ホルダ30
は、中空の円板形状であり、中空の部分を基板保持部3
1として、ここに基板33が配置される。また、基板保
持部31には、環状の支持体32が形成される。基板3
3は、支持体32によってその周縁部全体が支持され
る。
2. Description of the Related Art In growing a molecular beam crystal, a substrate is held by a substrate holder in a high-vacuum apparatus. FIG. 3 shows a conventional substrate holder. Substrate holder 30
Has a hollow disk shape, and the hollow portion is
As 1, the substrate 33 is disposed here. An annular support 32 is formed on the substrate holding unit 31. Substrate 3
3 is supported on the entire periphery by the support 32.

【0003】[0003]

【発明が解決しようとする課題】基板は、上記基板ホル
ダに保持された状態で輻射により加熱される。基板ホル
ダは高真空中で数百℃とされても元素を揮発しにくい材
料(たとえば、タンタルおよびモリブデン等)で形成さ
れる一方、基板を形成する材料(たとえばGaAs等の
化合物半導体)は、輻射光を透過しやすい。したがっ
て、上記ホルダで保持される基板を加熱していった場
合、ホルダの温度が基板よりも急激に上昇するため、基
板においてホルダが接触する周縁部分と中心部との間に
熱勾配が形成される。このため、基板に熱ひずみが生じ
るようになり、特に、基板の周縁部で(110)面およ
びその近傍にスリップが多数発生するという問題が生じ
た。
The substrate is heated by radiation while being held by the substrate holder. The substrate holder is made of a material (for example, tantalum and molybdenum) that hardly volatilizes elements even at a temperature of several hundred degrees centigrade in a high vacuum, while the material for forming the substrate (for example, a compound semiconductor such as GaAs) emits radiation. Easy to transmit light. Therefore, when the substrate held by the holder is heated, the temperature of the holder rises more rapidly than the substrate, so that a thermal gradient is formed between the peripheral portion and the center of the substrate where the holder contacts. You. For this reason, thermal distortion occurs in the substrate, and in particular, there is a problem that a large number of slips occur on the (110) plane and its vicinity at the peripheral edge of the substrate.

【0004】本発明の目的は、分子線結晶成長において
基板を加熱するに際し、スリップの発生を抑制すること
にある。
An object of the present invention is to suppress occurrence of slip when heating a substrate in molecular beam crystal growth.

【0005】[0005]

【課題を解決するための手段】第1の発明に従う分子線
結晶成長用基板ホルダは、分子線結晶成長装置内で基板
を分子線にさらすため、基板の周縁部を支持することに
より基板を保持するホルダにおいて、基板周縁部におけ
る複数の箇所に接触して基板を保持する複数の支持片を
備える。さらに、上記複数の支持片は、基板周縁部の
(110)面部分から離れた部分に接触できるよう所定
の間隔をあけて設けられる。
A substrate holder for growing a molecular beam crystal according to the first invention holds a substrate by supporting a peripheral portion of the substrate in order to expose the substrate to a molecular beam in a molecular beam crystal growing apparatus. The holder includes a plurality of support pieces that hold the substrate in contact with a plurality of locations on the peripheral portion of the substrate. Further, the plurality of support pieces are provided on a peripheral portion of the substrate.
It is provided at a predetermined interval so as to be able to contact a part distant from the (110) plane part .

【0006】第2の発明に従う分子線結晶成長法は、加
熱した基板に分子線を入射させて基板上にエピタキシャ
ル層を成長させる方法において、基板周縁部の(11
0)面部分から離れた部分を基板ホルダにより保持して
基板を加熱することを特徴とする。
[0006] Molecular beam epitaxy method according to the second aspect of the present invention is the method of irradiating with an incident molecular beams to the heated substrate to grow an epitaxial layer on a substrate, the substrate peripheral portion (11
0) The substrate is heated by holding a portion away from the surface portion by a substrate holder.

【0007】[0007]

【作用】第1の発明に従う基板ホルダに基板を配置すれ
ば、基板周縁部における複数の箇所に基板ホルダの支持
片が接触して基板は支持される。これにより、基板は分
子線結晶成長装置内で基板ホルダによって保持される。
基板を支持する支持片は、所定の間隔をあけて複数設け
られており、基板ホルダ周縁部で〈110〉成長が現わ
れる部分から離れた部分に接触することができる。たと
えば、GaAs基板の場合、図4の矢印に示すように4
ヵ所で〈110〉成長が現われるが、これらの部分の間
に支持片が接触するよう支持片を複数設ければ、(11
0)面部分を避けて基板を支持することができる。支持
片の間隔、数および大きさ等は、基板の大きさおよび重
量に従って最適となるよう設定すればよい。
When the substrate is placed on the substrate holder according to the first aspect of the invention, the support pieces of the substrate holder come into contact with a plurality of positions on the peripheral portion of the substrate, and the substrate is supported. Thus, the substrate is held by the substrate holder in the molecular beam crystal growth apparatus.
A plurality of support pieces for supporting the substrate are provided at predetermined intervals, and can be in contact with a portion of the peripheral edge of the substrate holder away from the portion where <110> growth appears. For example, in the case of a GaAs substrate, as shown by an arrow in FIG.
Although <110> growth appears in several places, if a plurality of supporting pieces are provided so that the supporting pieces come into contact between these portions, (11)
0) The substrate can be supported while avoiding the plane portion . The spacing, number, size, etc. of the support pieces may be set to be optimal according to the size and weight of the substrate.

【0008】このように、(110)面部分およびその
近傍へのホルダの接触を防ぐことによって、(110)
面部分近傍に大きな温度勾配がかかるのを阻止し、スリ
ップの発生を防止している。
[0008] Thus, by preventing the contact of the holder to the (110) plane portion and the vicinity thereof, (110)
A large temperature gradient is prevented from being applied in the vicinity of the surface portion , thereby preventing the occurrence of slip.

【0009】また、第2の発明に従って基板の周縁部で
(110)面部分から離れた部分を基板ホルダにより保
持して基板を加熱すれば、加熱によってスリップの発生
しやすい(110)面部分およびその近傍での熱ひずみ
の発生が抑制される。
Further, according to a second aspect of the present invention, at the peripheral portion of the substrate,
If the substrate is heated while holding the part away from the (110) plane part by the substrate holder, the generation of thermal strain in the (110) plane part where heating is likely to occur and the vicinity thereof is suppressed.

【0010】[0010]

【実施例】図1に示す基板ホルダを本発明に従って作製
した。図1において(a)は基板ホルダの平面図、
(b)はA−A′断面図を示す。
EXAMPLE A substrate holder shown in FIG. 1 was manufactured according to the present invention. In FIG. 1, (a) is a plan view of a substrate holder,
(B) shows an AA 'sectional view.

【0011】基板ホルダ10は、中空の円板形状であ
り、中空の部分は基板保持部11とされる。基板保持部
11は、基板に沿った形状を有し、オリエンテーション
フラットが位置する部分は平面にされる一方、他の部分
は円筒面とされる。基板保持部11は、分子線結晶成長
の間、基板がずれないよう適当な大きさとされる。
The substrate holder 10 has a hollow disk shape, and the hollow portion serves as a substrate holding portion 11. The substrate holding part 11 has a shape along the substrate, and the portion where the orientation flat is located is made flat, while the other portions are made cylindrical. The substrate holding portion 11 has an appropriate size so that the substrate does not shift during molecular beam crystal growth.

【0012】一方、基板保持部11には4ヶ所に基板支
持片12a、12b、12cおよび12dが形成され
る。保持すべきGaAs基板13は、オリエンテーショ
ンフラット14(以下OFと略記)が、(110)面と
されているため、基板13の外周面でOFに対向する部
分15、OFから90度回転したIF16、およびIF
に対抗する部分17に〈110〉成長が現われる。した
がって、たとえば基板支持片12aは、基板周縁部でO
FとIFの中間あたりを支持するよう形成され、支持片
12cは12aに対向する位置に、支持片12bおよび
12dは12aから図に向かって左右それぞれ90度回
転した位置に形成される。図に示すように、基板13は
その周縁部を4つの支持片で支持されることにより基板
ホルダ10内に保持される。
On the other hand, substrate support pieces 12a, 12b, 12c and 12d are formed at four places on the substrate holding portion 11. Since the orientation flat 14 (hereinafter abbreviated as OF) of the GaAs substrate 13 to be held has a (110) plane, a portion 15 facing the OF on the outer peripheral surface of the substrate 13, an IF 16 rotated by 90 degrees from the OF, And IF
<110> growth appears in the portion 17 opposing the. Therefore, for example, the substrate support piece 12a
The support piece 12c is formed at a position facing 12a, and the support pieces 12b and 12d are formed at positions rotated by 90 degrees from the 12a to the left and right in the figure. As shown in the figure, the substrate 13 is held in the substrate holder 10 by supporting the peripheral portion of the substrate 13 with four support pieces.

【0013】分子結晶成長装置において以上に示した基
板ホルダで4インチφのGaAs基板を保持し、アンド
ープGaAs層を成長させた。成長条件は以下のとおり
であった。
In a molecular crystal growth apparatus, a GaAs substrate having a diameter of 4 inches was held by the substrate holder described above, and an undoped GaAs layer was grown. The growth conditions were as follows.

【0014】昇温温度:20℃/min、成長温度:6
50℃、成長時間:1時間、降温温度20℃/min、
As圧:1×10-5Torr、成長速度:1μm/h
r。
Heating temperature: 20 ° C./min, growth temperature: 6
50 ° C., growth time: 1 hour, cooling temperature: 20 ° C./min,
As pressure: 1 × 10 −5 Torr, growth rate: 1 μm / h
r.

【0015】一方、図3に示した従来の基板ホルダを用
いて同様の条件で分子線結晶成長を行なった。
On the other hand, molecular beam crystal growth was carried out under the same conditions using the conventional substrate holder shown in FIG.

【0016】これらの条件下でそれぞれエピタキシャル
成長させた基板の表面を比較観察した結果、スリップの
長さおよび数とも本発明のホルダを用いた場合、従来の
ホルダを用いた場合の半分以下に抑えられた。したがっ
て、本発明に従えばスリップの発生が抑制させることが
明らかとなった。
As a result of comparing and observing the surfaces of the substrates epitaxially grown under these conditions, the length and the number of the slips can be suppressed to less than half when the holder of the present invention is used and when the conventional holder is used. Was. Therefore, it has been clarified that the occurrence of slip is suppressed according to the present invention.

【0017】なお、上記実施例においては、基板支持片
が4ヵ所に設けられたが、基板支持片の数、間隔、大き
さおよび形状等は上記実施例に限定されず、種々の変更
が可能である。たとえば、図2に示すように、基板保持
部の8ヵ所にこの発明に従って支持片を設けることもで
きる。
In the above embodiment, the substrate support pieces are provided at four positions. However, the number, interval, size, shape, etc. of the substrate support pieces are not limited to the above embodiment, and various changes are possible. It is. For example, as shown in FIG. 2, supporting pieces can be provided at eight positions of the substrate holding portion according to the present invention.

【0018】[0018]

【発明の効果】以上説明したように本発明に従えば、分
子線結晶成長においてスリップの発生が抑制される。し
たがって、基板上で高速素子や発光素子等のデバイスと
して使用できる領域が従来より増えるため、本発明はデ
バイス製造の歩留向上に寄与する。
As described above, according to the present invention, the occurrence of slip is suppressed in molecular beam crystal growth. Therefore, the area that can be used as a device such as a high-speed element or a light-emitting element on the substrate is increased as compared with the related art, and the present invention contributes to improvement in the yield of device manufacturing.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明に従う基板ホルダの一例を示す(a)平
面図および(b)A−A′断面図。
FIG. 1A is a plan view and FIG. 1B is a cross-sectional view taken along the line AA ′, showing an example of a substrate holder according to the present invention.

【図2】本発明に従う基板ホルダの他の例を示す平面
図。
FIG. 2 is a plan view showing another example of the substrate holder according to the present invention.

【図3】従来の基板ホルダを示す(a)平面図および
(b)断面図。
FIG. 3A is a plan view and FIG. 3B is a cross-sectional view showing a conventional substrate holder.

【図4】基板の成長方向を説明するための平面図。FIG. 4 is a plan view for explaining a growth direction of a substrate.

【符号の説明】[Explanation of symbols]

11、31 基板保持部 12a、12b、12c、12d 基板支持片 11, 31 substrate holding parts 12a, 12b, 12c, 12d substrate support pieces

フロントページの続き (72)発明者 岡田 浩 兵庫県伊丹市昆陽北一丁目1番1号 住 友電気工業株式会社 伊丹製作所内 (72)発明者 酒井 純朗 東京都府中市四谷5丁目8番1号 日電 アネルバ株式会社内 (72)発明者 ▲高▼岸 成典 兵庫県伊丹市昆陽北一丁目1番1号 住 友電気工業株式会社 伊丹製作所内 (56)参考文献 特開 昭61−201420(JP,A) 実開 昭63−157925(JP,U) (58)調査した分野(Int.Cl.7,DB名) H01L 21/68 C30B 25/12 H01L 21/203 Continuing from the front page (72) Inventor Hiroshi Okada 1-1-1, Konokita, Itami-shi, Hyogo Sumitomo Electric Industries, Ltd. Itami Works (72) Inventor Junro Sakai 5-81, Yotsuya, Fuchu-shi, Tokyo (72) Inventor ▲ Taka ▼ Shigenori Kishi 1-1-1, Kunyokita, Itami-shi, Hyogo Prefecture Itami Works, Sumitomo Electric Industries, Ltd. (56) References JP-A-61-201420 (JP, A) Fully open 1988-157925 (JP, U) (58) Fields investigated (Int. Cl. 7 , DB name) H01L 21/68 C30B 25/12 H01L 21/203

Claims (3)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 分子線結晶成長装置内で基板を分子線に
さらすため、前記基板の周縁部を支持することにより前
記基板を保持する分子線結晶成長用基板ホルダにおい
て、 前記基板周縁部における複数の箇所に接触して前記基板
を支持する複数の支持片を備え、 前記複数の支持片は、前記基板周縁部の(110)面部
から離れた部分に接触できるよう所定の間隔をあけて
設けられる、分子線結晶成長用基板ホルダ。
1. A molecular beam crystal growth substrate holder for holding a substrate by supporting a peripheral portion of the substrate in order to expose the substrate to a molecular beam in a molecular beam crystal growing apparatus. And a plurality of support pieces for supporting the substrate in contact with the above-mentioned portions, wherein the plurality of support pieces are a (110) surface portion of the peripheral portion of the substrate.
Provided at a predetermined interval so that it can contact the portion apart from the distribution, molecular beam crystal growth substrate holder.
【請求項2】 加熱した基板に分子線を入射させて前記
基板上にエピタキシャル層を成長させる分子線結晶成長
法において、 前記基板周縁部の(110)面部分から離れた部分を基
板ホルダにより保持して前記基板を加熱することを特徴
とする、分子線結晶成長法。
2. In a molecular beam crystal growth method for growing an epitaxial layer on a substrate by applying a molecular beam to a heated substrate, a portion of the peripheral portion of the substrate that is separated from a (110) plane is held by a substrate holder. And heating the substrate.
【請求項3】 4つまたは8つの前記支持片を備える、
請求項1に記載の分子線結晶成長用基板ホルダ。
3. comprising four or eight said support pieces;
The substrate holder for growing a molecular beam crystal according to claim 1.
JP26593391A 1991-10-15 1991-10-15 Substrate holder for molecular beam crystal growth and molecular beam crystal growth method Expired - Fee Related JP3157866B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26593391A JP3157866B2 (en) 1991-10-15 1991-10-15 Substrate holder for molecular beam crystal growth and molecular beam crystal growth method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26593391A JP3157866B2 (en) 1991-10-15 1991-10-15 Substrate holder for molecular beam crystal growth and molecular beam crystal growth method

Publications (2)

Publication Number Publication Date
JPH05109875A JPH05109875A (en) 1993-04-30
JP3157866B2 true JP3157866B2 (en) 2001-04-16

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Country Status (1)

Country Link
JP (1) JP3157866B2 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106653664B (en) * 2016-12-07 2019-11-15 南方科技大学 Oxygen removing tray for gallium arsenide wafer

Also Published As

Publication number Publication date
JPH05109875A (en) 1993-04-30

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