JPS61193364U - - Google Patents

Info

Publication number
JPS61193364U
JPS61193364U JP1985078312U JP7831285U JPS61193364U JP S61193364 U JPS61193364 U JP S61193364U JP 1985078312 U JP1985078312 U JP 1985078312U JP 7831285 U JP7831285 U JP 7831285U JP S61193364 U JPS61193364 U JP S61193364U
Authority
JP
Japan
Prior art keywords
ray
spot
mounting table
image receiving
provided below
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1985078312U
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1985078312U priority Critical patent/JPS61193364U/ja
Priority to US06/865,014 priority patent/US4727561A/en
Priority to DE198686200879T priority patent/DE204365T1/de
Priority to EP86200879A priority patent/EP0204365B1/en
Priority to DE8686200879T priority patent/DE3677819D1/de
Publication of JPS61193364U publication Critical patent/JPS61193364U/ja
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H51/00—Electromagnetic relays
    • H01H51/28—Relays having both armature and contacts within a sealed casing outside which the operating coil is located, e.g. contact carried by a magnetic leaf spring or reed
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Electromagnetism (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)

Description

【図面の簡単な説明】
第１図は従来のＸ線検査法による黒化度と試料
厚みとの関係を示す黒化度特性曲線図、第２図は
本考案で処理された吸収係数と厚みとの関係を示
す吸収係数曲線図、第３図は本考案Ｘ線組成検査
装置の実施例を示す説明図、第４図はスポツト法
での使用状態を示す説明図、第５図は回転フイル
ターを示す平面図、第６図はフイルターを示す断
面図、第７図は各Ｘ線電圧におけるＸ線画像と組
画像の状態を示す説明図、第８図は画像法とスポ
ツト法の切換えを示す説明図である。 １：Ｘ線発生装置、２：回転フイルター、３，
３′…：フイルター、４：試料載置台、５：Ｘ線
受像カメラ、６：スポツトＸ線センサー、１７：
演算装置、２０：コンピユータ、Ｓ：試料。

Claims (1)

    【実用新案登録請求の範囲】
  1. フイルターを通過させてＸ線を照射するＸ線発
    生装置の下方に試料載置台を移動自在に設け、同
    試料載置台の下方にＸ線受像カメラ及びスポツト
    Ｘ線センサーを交替的に作動可能に設け、同Ｘ線
    受像カメラ又はスポツトＸ線センサーのＸ線強さ
    と試料非通過の定点Ｘ線強さとの比の対数値を求
    め、その対数値を計測出力信号として画像及び組
    成定量検査処理することを特徴とするＸ線組成検
    査装置。
JP1985078312U 1985-05-24 1985-05-24 Pending JPS61193364U (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP1985078312U JPS61193364U (ja) 1985-05-24 1985-05-24
US06/865,014 US4727561A (en) 1985-05-24 1986-05-20 Measuring apparatus and method employing hard X-rays
DE198686200879T DE204365T1 (de) 1985-05-24 1986-05-21 Messverfahren und -vorrichtung unter verwendung harter roentgenstrahlen.
EP86200879A EP0204365B1 (en) 1985-05-24 1986-05-21 Measuring apparatus and method employing hard x-rays
DE8686200879T DE3677819D1 (de) 1985-05-24 1986-05-21 Messverfahren und -vorrichtung unter verwendung harter roentgenstrahlen.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1985078312U JPS61193364U (ja) 1985-05-24 1985-05-24

Publications (1)

Publication Number Publication Date
JPS61193364U true JPS61193364U (ja) 1986-12-02

Family

ID=13658418

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1985078312U Pending JPS61193364U (ja) 1985-05-24 1985-05-24

Country Status (4)

Country Link
US (1) US4727561A (ja)
EP (1) EP0204365B1 (ja)
JP (1) JPS61193364U (ja)
DE (2) DE3677819D1 (ja)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0715442B2 (ja) * 1988-01-28 1995-02-22 エックスライド株式会社 Ｘ線検査方法及び装置
US5081660A (en) * 1990-06-06 1992-01-14 Yokio Fujisaki High resolution x-ray imaging system with energy fluctuation restricting filters
US5107529A (en) * 1990-10-03 1992-04-21 Thomas Jefferson University Radiographic equalization apparatus and method
DE19729414A1 (de) * 1997-07-09 1999-02-11 Siemens Ag Strahlenblende eines medizinischen Gerätes
GB2409271B (en) * 2000-08-03 2005-09-21 Cambridge Imaging Ltd Improvements in and relating to material identification using x-rays
US7502442B2 (en) 2002-01-28 2009-03-10 Smiths Heimann Gmbh X-ray inspection system and method
EP2427756A1 (en) * 2009-05-07 2012-03-14 L-3 Communications Security and Detection Systems, Inc. Filtering of a source of pulsed radiation
JP4868034B2 (ja) * 2009-07-16 2012-02-01 横河電機株式会社 放射線検査装置
JP4883378B2 (ja) * 2009-12-22 2012-02-22 横河電機株式会社 放射線検出装置
IT201600093579A1 (it) * 2016-09-16 2018-03-16 Sacmi Metodo e apparato per la formatura di manufatti di polveri compattate

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58191959A (ja) * 1982-05-06 1983-11-09 Houseki Rigaku Kenkyusho:Kk 物体組成判別法
JPS6042951B2 (ja) * 1976-06-30 1985-09-25 ヤマハ株式会社 電子楽器の音源装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2469206A (en) * 1946-11-14 1949-05-03 Gen Electric X-ray absorption photometer
US2467812A (en) * 1947-04-01 1949-04-19 Gen Electric Noncontacting thickness gauge
DE2347178B2 (de) * 1973-09-19 1975-09-18 Siemens Ag, 1000 Berlin Und 8000 Muenchen Röntgendiag nostikapparat
GB1475493A (en) * 1974-05-20 1977-06-01 Emi Ltd Apparatus for examining objects by means of penetrating radiation
US4448200A (en) * 1978-03-27 1984-05-15 University Of Southern California System and method for dynamic background subtraction
US4204225A (en) * 1978-05-16 1980-05-20 Wisconsin Alumni Research Foundation Real-time digital X-ray subtraction imaging
DE2831038C2 (de) * 1978-07-14 1982-07-01 Siemens AG, 1000 Berlin und 8000 München Strahlendiagnostikgerät für die Erzeugung von Schichtbildern
US4375068A (en) * 1980-04-21 1983-02-22 Technicare Corporation Radiographic apparatus and method with logarithmic video compression
US4399550A (en) * 1981-02-27 1983-08-16 General Electric Company Spinning filter for X-ray apparatus
DE3207816A1 (de) * 1982-03-04 1983-09-15 Siemens AG, 1000 Berlin und 8000 München Roentgendiagnostikeinrichtung fuer roentgenschichtbilder
US4528685A (en) * 1983-05-16 1985-07-09 General Electric Company X-ray beam filter device
DE3402888A1 (de) * 1984-01-27 1985-08-01 Siemens AG, 1000 Berlin und 8000 München Roentgendiagnostikanlage

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6042951B2 (ja) * 1976-06-30 1985-09-25 ヤマハ株式会社 電子楽器の音源装置
JPS58191959A (ja) * 1982-05-06 1983-11-09 Houseki Rigaku Kenkyusho:Kk 物体組成判別法

Also Published As

Publication number Publication date
US4727561A (en) 1988-02-23
EP0204365B1 (en) 1991-03-06
EP0204365A2 (en) 1986-12-10
EP0204365A3 (en) 1988-12-07
DE3677819D1 (de) 1991-04-11
DE204365T1 (de) 1987-07-02

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