JPS61182547A - ヘツドランプの光軸検査方法及びその装置 - Google Patents

ヘツドランプの光軸検査方法及びその装置

Info

Publication number
JPS61182547A
JPS61182547A JP2330285A JP2330285A JPS61182547A JP S61182547 A JPS61182547 A JP S61182547A JP 2330285 A JP2330285 A JP 2330285A JP 2330285 A JP2330285 A JP 2330285A JP S61182547 A JPS61182547 A JP S61182547A
Authority
JP
Japan
Prior art keywords
optical axis
headlamp
light distribution
screen
video signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2330285A
Other languages
English (en)
Japanese (ja)
Other versions
JPH047941B2 (enExample
Inventor
Kazuyuki Yamakura
山倉　和之
Mamoru Yoshida
吉田　衛
Takahiko Matsui
松井　崇彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toyota Motor Corp
Original Assignee
Toyota Motor Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toyota Motor Corp filed Critical Toyota Motor Corp
Priority to JP2330285A priority Critical patent/JPS61182547A/ja
Publication of JPS61182547A publication Critical patent/JPS61182547A/ja
Publication of JPH047941B2 publication Critical patent/JPH047941B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/06—Testing the alignment of vehicle headlight devices
    • G01M11/064—Testing the alignment of vehicle headlight devices by using camera or other imaging system for the light analysis

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP2330285A 1985-02-08 1985-02-08 ヘツドランプの光軸検査方法及びその装置 Granted JPS61182547A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2330285A JPS61182547A (ja) 1985-02-08 1985-02-08 ヘツドランプの光軸検査方法及びその装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2330285A JPS61182547A (ja) 1985-02-08 1985-02-08 ヘツドランプの光軸検査方法及びその装置

Publications (2)

Publication Number Publication Date
JPS61182547A true JPS61182547A (ja) 1986-08-15
JPH047941B2 JPH047941B2 (enExample) 1992-02-13

Family

ID=12106808

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2330285A Granted JPS61182547A (ja) 1985-02-08 1985-02-08 ヘツドランプの光軸検査方法及びその装置

Country Status (1)

Country Link
JP (1) JPS61182547A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1366989A1 (de) 2002-05-27 2003-12-03 Stefan Wichmann Verfahren und Vorrichtung zur Überprüfung von Leuchtmitteln und Lichtsignalen

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1366989A1 (de) 2002-05-27 2003-12-03 Stefan Wichmann Verfahren und Vorrichtung zur Überprüfung von Leuchtmitteln und Lichtsignalen

Also Published As

Publication number Publication date
JPH047941B2 (enExample) 1992-02-13

Similar Documents

Publication Publication Date Title
KR100452413B1 (ko) 컴퓨터-생성 투사 영상의 캘리브레이션을 위한 방법 및 장치
JPS6363849B2 (enExample)
CN112577439A (zh) 基于红外和光学图像的微电子基板翘曲测量方法和系统
US10812764B2 (en) Display apparatus, display system, and method for controlling display apparatus
KR101056393B1 (ko) Ｐｃｂ 결함검사를 위한 마이크로 비젼검사장치
JPH0399376A (ja) 画質検査装置
CN110441326A (zh) 缺陷检测方法与检测装置及计算机可读存储介质
JPS61182547A (ja) ヘツドランプの光軸検査方法及びその装置
JPH0814524B2 (ja) ヘッドランプの光軸検査方法
CN1673708A (zh) 镜头光学解析量测系统
JP2020129187A (ja) 外形認識装置、外形認識システム及び外形認識方法
JPH047940B2 (enExample)
JPH047939B2 (enExample)
JPH09312859A (ja) カラー表示装置の画質測定装置及び画質測定方法
Zhou A study of microsoft kinect calibration
JPH0377533A (ja) 注視姿勢及び注視点絶対位置の計測装置
JPH0587782B2 (enExample)
JP2005024618A (ja) 傾斜角度測定装置を有するプロジェクタ。
KR970012877A (ko) 음극선관 화면 검사 조정 장치 및 방법
KR101056392B1 (ko) 표면 검사방법 및 장치
JPH06105212B2 (ja) ヘツドライトの主光軸検査方法
JPS6022550B2 (ja) コンバ−ゼンス色ずれ検出装置
TWI229749B (en) Lens MTF measurement system
JP2816456B2 (ja) フォーカス測定装置
JPH09182115A (ja) Ｃｒｔ検査装置