JPS61178643A - 粒子分析装置 - Google Patents

粒子分析装置

Info

Publication number
JPS61178643A
JPS61178643A JP60020299A JP2029985A JPS61178643A JP S61178643 A JPS61178643 A JP S61178643A JP 60020299 A JP60020299 A JP 60020299A JP 2029985 A JP2029985 A JP 2029985A JP S61178643 A JPS61178643 A JP S61178643A
Authority
JP
Japan
Prior art keywords
peak
particle
signal
circuit
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60020299A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0533342B2 (enrdf_load_stackoverflow
Inventor
Tokihiro Kosaka
小坂　時弘
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sysmex Corp
Original Assignee
Sysmex Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sysmex Corp filed Critical Sysmex Corp
Priority to JP60020299A priority Critical patent/JPS61178643A/ja
Publication of JPS61178643A publication Critical patent/JPS61178643A/ja
Publication of JPH0533342B2 publication Critical patent/JPH0533342B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/1031—Investigating individual particles by measuring electrical or magnetic effects
    • G01N15/12—Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
    • G01N15/131—Details
    • G01N15/132—Circuits

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Measurement Of Current Or Voltage (AREA)
JP60020299A 1985-02-05 1985-02-05 粒子分析装置 Granted JPS61178643A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60020299A JPS61178643A (ja) 1985-02-05 1985-02-05 粒子分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60020299A JPS61178643A (ja) 1985-02-05 1985-02-05 粒子分析装置

Publications (2)

Publication Number Publication Date
JPS61178643A true JPS61178643A (ja) 1986-08-11
JPH0533342B2 JPH0533342B2 (enrdf_load_stackoverflow) 1993-05-19

Family

ID=12023271

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60020299A Granted JPS61178643A (ja) 1985-02-05 1985-02-05 粒子分析装置

Country Status (1)

Country Link
JP (1) JPS61178643A (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0261538A (ja) * 1988-08-26 1990-03-01 Fuji Electric Co Ltd 微粒子測定装置
US6473177B2 (en) 2000-07-07 2002-10-29 Horiba, Ltd. Particle-size distribution measuring apparatus
US6864979B2 (en) 2000-12-08 2005-03-08 Horiba, Ltd Particle size distribution measuring apparatus
US6970243B2 (en) 2001-02-19 2005-11-29 Horiba, Ltd. Particle size distribution measuring apparatus

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5068173A (enrdf_load_stackoverflow) * 1973-10-16 1975-06-07
JPS568527A (en) * 1979-07-02 1981-01-28 Toa Medical Electronics Co Ltd Particle analyzing device
JPS5841336A (ja) * 1981-09-04 1983-03-10 Toa Medical Electronics Co Ltd 粒子分析装置
JPS61126447A (ja) * 1984-11-26 1986-06-13 Hitachi Ltd 粒子分析装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5068173A (enrdf_load_stackoverflow) * 1973-10-16 1975-06-07
JPS568527A (en) * 1979-07-02 1981-01-28 Toa Medical Electronics Co Ltd Particle analyzing device
JPS5841336A (ja) * 1981-09-04 1983-03-10 Toa Medical Electronics Co Ltd 粒子分析装置
JPS61126447A (ja) * 1984-11-26 1986-06-13 Hitachi Ltd 粒子分析装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0261538A (ja) * 1988-08-26 1990-03-01 Fuji Electric Co Ltd 微粒子測定装置
US6473177B2 (en) 2000-07-07 2002-10-29 Horiba, Ltd. Particle-size distribution measuring apparatus
US6864979B2 (en) 2000-12-08 2005-03-08 Horiba, Ltd Particle size distribution measuring apparatus
US6970243B2 (en) 2001-02-19 2005-11-29 Horiba, Ltd. Particle size distribution measuring apparatus

Also Published As

Publication number Publication date
JPH0533342B2 (enrdf_load_stackoverflow) 1993-05-19

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