JPS6117310B2 - - Google Patents
Info
- Publication number
- JPS6117310B2 JPS6117310B2 JP53104000A JP10400078A JPS6117310B2 JP S6117310 B2 JPS6117310 B2 JP S6117310B2 JP 53104000 A JP53104000 A JP 53104000A JP 10400078 A JP10400078 A JP 10400078A JP S6117310 B2 JPS6117310 B2 JP S6117310B2
- Authority
- JP
- Japan
- Prior art keywords
- slit light
- circuit
- circuit board
- printed circuit
- component
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Geophysics And Detection Of Objects (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10400078A JPS5530659A (en) | 1978-08-25 | 1978-08-25 | Parts inspecting device for print substrate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10400078A JPS5530659A (en) | 1978-08-25 | 1978-08-25 | Parts inspecting device for print substrate |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5530659A JPS5530659A (en) | 1980-03-04 |
| JPS6117310B2 true JPS6117310B2 (enrdf_load_stackoverflow) | 1986-05-07 |
Family
ID=14369009
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10400078A Granted JPS5530659A (en) | 1978-08-25 | 1978-08-25 | Parts inspecting device for print substrate |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5530659A (enrdf_load_stackoverflow) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5733304A (en) * | 1980-08-06 | 1982-02-23 | Hitachi Ltd | Method and device for shape inspection |
| JPS57199945A (en) * | 1981-06-03 | 1982-12-08 | Toshiba Corp | Measuring and evaluating device for solder wettability |
| DE3204086A1 (de) * | 1982-02-06 | 1983-08-11 | Ibm Deutschland Gmbh, 7000 Stuttgart | Vorrichtung zur automatischen optischen beschaffenheitspruefung |
| JPS58135941A (ja) * | 1982-02-08 | 1983-08-12 | Matsushita Electric Ind Co Ltd | チツプ部品の装着検査装置 |
| US4670726A (en) * | 1984-12-20 | 1987-06-02 | Hitachi Metals, Ltd. | Convergence device for electron beams in color picture tube |
| EP0228963B1 (en) * | 1985-12-27 | 1993-08-04 | AT&T Corp. | Linescan inspection system for circuit boards |
| JP2551683Y2 (ja) * | 1986-07-10 | 1997-10-27 | 日本電気株式会社 | 光学検査画像取込装置 |
| JPS63170746U (enrdf_load_stackoverflow) * | 1987-01-14 | 1988-11-07 | ||
| JPH0499963U (enrdf_load_stackoverflow) * | 1991-02-01 | 1992-08-28 |
-
1978
- 1978-08-25 JP JP10400078A patent/JPS5530659A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5530659A (en) | 1980-03-04 |
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