JPS61153958U - - Google Patents
Info
- Publication number
- JPS61153958U JPS61153958U JP3726285U JP3726285U JPS61153958U JP S61153958 U JPS61153958 U JP S61153958U JP 3726285 U JP3726285 U JP 3726285U JP 3726285 U JP3726285 U JP 3726285U JP S61153958 U JPS61153958 U JP S61153958U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- magnetic field
- detector
- electron beam
- field type
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010894 electron beam technology Methods 0.000 claims description 3
- 230000003287 optical effect Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3726285U JPS61153958U (enExample) | 1985-03-15 | 1985-03-15 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3726285U JPS61153958U (enExample) | 1985-03-15 | 1985-03-15 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61153958U true JPS61153958U (enExample) | 1986-09-24 |
Family
ID=30543186
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3726285U Pending JPS61153958U (enExample) | 1985-03-15 | 1985-03-15 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61153958U (enExample) |
-
1985
- 1985-03-15 JP JP3726285U patent/JPS61153958U/ja active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2899629B2 (ja) | 荷電二次粒子の検出装置 | |
| JPS63165761U (enExample) | ||
| JPS58110956U (ja) | 荷電粒子照射装置 | |
| JPS61153958U (enExample) | ||
| JP2001126655A5 (enExample) | ||
| JPS63108156U (enExample) | ||
| JPS61116063U (enExample) | ||
| JPH0319166Y2 (enExample) | ||
| JPS61101956U (enExample) | ||
| JPH067557Y2 (ja) | ２次電子検出器 | |
| JP3114583B2 (ja) | 二次電子検出装置 | |
| JPS6157464U (enExample) | ||
| JPS619761U (ja) | 電子線装置 | |
| JPS5841642Y2 (ja) | 電子線照射分析装置の試料ホルダ− | |
| JPH024442Y2 (enExample) | ||
| JPS5854783Y2 (ja) | 走査電子顕微鏡 | |
| JPS63131059U (enExample) | ||
| JPS62145262U (enExample) | ||
| JPS59125057U (ja) | Ｘ線分析装置を備えた電子顕微鏡 | |
| JPS60187450U (ja) | 走査電子顕微鏡用２次電子検出装置 | |
| JPH0429156U (enExample) | ||
| JPS62116354U (enExample) | ||
| JPH0369853U (enExample) | ||
| JPH0181858U (enExample) | ||
| JPS613662U (ja) | ２次電子検出装置 |