JPS61153550A - Ｘ線分光器 - Google Patents

Ｘ線分光器

Info

Publication number
JPS61153550A
JPS61153550A JP59273693A JP27369384A JPS61153550A JP S61153550 A JPS61153550 A JP S61153550A JP 59273693 A JP59273693 A JP 59273693A JP 27369384 A JP27369384 A JP 27369384A JP S61153550 A JPS61153550 A JP S61153550A
Authority
JP
Japan
Prior art keywords
slit
optical axis
zone plate
wavelength
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59273693A
Other languages
English (en)
Japanese (ja)
Other versions
JPH052119B2 (enrdf_load_stackoverflow
Inventor
Oku Kuraki
億 久良木
Tsuneo Urisu
恒雄 宇理須
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP59273693A priority Critical patent/JPS61153550A/ja
Publication of JPS61153550A publication Critical patent/JPS61153550A/ja
Publication of JPH052119B2 publication Critical patent/JPH052119B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP59273693A 1984-12-27 1984-12-27 Ｘ線分光器 Granted JPS61153550A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59273693A JPS61153550A (ja) 1984-12-27 1984-12-27 Ｘ線分光器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59273693A JPS61153550A (ja) 1984-12-27 1984-12-27 Ｘ線分光器

Publications (2)

Publication Number Publication Date
JPS61153550A true JPS61153550A (ja) 1986-07-12
JPH052119B2 JPH052119B2 (enrdf_load_stackoverflow) 1993-01-11

Family

ID=17531235

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59273693A Granted JPS61153550A (ja) 1984-12-27 1984-12-27 Ｘ線分光器

Country Status (1)

Country Link
JP (1) JPS61153550A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110133709A (zh) * 2019-06-06 2019-08-16 中国工程物理研究院激光聚变研究中心 类δ响应软X射线能谱仪
JP2019152768A (ja) * 2018-03-05 2019-09-12 学校法人同志社 集光機能を有する分光素子および該素子を利用した分光装置
CN114295082A (zh) * 2021-12-10 2022-04-08 散裂中子源科学中心 一种基于近场散斑的曲面波前与面形高精度检测方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5332801B2 (ja) * 2009-03-27 2013-11-06 富士通株式会社 試料分析装置及び試料分析方法

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019152768A (ja) * 2018-03-05 2019-09-12 学校法人同志社 集光機能を有する分光素子および該素子を利用した分光装置
CN110133709A (zh) * 2019-06-06 2019-08-16 中国工程物理研究院激光聚变研究中心 类δ响应软X射线能谱仪
CN110133709B (zh) * 2019-06-06 2022-06-14 中国工程物理研究院激光聚变研究中心 类δ响应软X射线能谱仪
CN114295082A (zh) * 2021-12-10 2022-04-08 散裂中子源科学中心 一种基于近场散斑的曲面波前与面形高精度检测方法
CN114295082B (zh) * 2021-12-10 2024-01-26 散裂中子源科学中心 一种基于近场散斑的曲面波前与面形高精度检测方法

Also Published As

Publication number Publication date
JPH052119B2 (enrdf_load_stackoverflow) 1993-01-11

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