JPH052119B2 - - Google Patents

Info

Publication number
JPH052119B2
JPH052119B2 JP59273693A JP27369384A JPH052119B2 JP H052119 B2 JPH052119 B2 JP H052119B2 JP 59273693 A JP59273693 A JP 59273693A JP 27369384 A JP27369384 A JP 27369384A JP H052119 B2 JPH052119 B2 JP H052119B2
Authority
JP
Japan
Prior art keywords
slit
zone plate
optical axis
ray
control signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59273693A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61153550A (ja
Inventor
Oku Kuraki
Tsuneo Urisu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP59273693A priority Critical patent/JPS61153550A/ja
Publication of JPS61153550A publication Critical patent/JPS61153550A/ja
Publication of JPH052119B2 publication Critical patent/JPH052119B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP59273693A 1984-12-27 1984-12-27 Ｘ線分光器 Granted JPS61153550A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59273693A JPS61153550A (ja) 1984-12-27 1984-12-27 Ｘ線分光器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59273693A JPS61153550A (ja) 1984-12-27 1984-12-27 Ｘ線分光器

Publications (2)

Publication Number Publication Date
JPS61153550A JPS61153550A (ja) 1986-07-12
JPH052119B2 true JPH052119B2 (enrdf_load_stackoverflow) 1993-01-11

Family

ID=17531235

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59273693A Granted JPS61153550A (ja) 1984-12-27 1984-12-27 Ｘ線分光器

Country Status (1)

Country Link
JP (1) JPS61153550A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010230481A (ja) * 2009-03-27 2010-10-14 Fujitsu Ltd 試料分析装置及び試料分析方法

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7191311B2 (ja) * 2018-03-05 2022-12-19 国立大学法人徳島大学 集光機能を有する分光素子を利用した分光装置
CN110133709B (zh) * 2019-06-06 2022-06-14 中国工程物理研究院激光聚变研究中心 类δ响应软X射线能谱仪
CN114295082B (zh) * 2021-12-10 2024-01-26 散裂中子源科学中心 一种基于近场散斑的曲面波前与面形高精度检测方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010230481A (ja) * 2009-03-27 2010-10-14 Fujitsu Ltd 試料分析装置及び試料分析方法

Also Published As

Publication number Publication date
JPS61153550A (ja) 1986-07-12

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