JPS61113240A - Method for sealing electronic parts - Google Patents

Method for sealing electronic parts

Info

Publication number
JPS61113240A
JPS61113240A JP23642184A JP23642184A JPS61113240A JP S61113240 A JPS61113240 A JP S61113240A JP 23642184 A JP23642184 A JP 23642184A JP 23642184 A JP23642184 A JP 23642184A JP S61113240 A JPS61113240 A JP S61113240A
Authority
JP
Japan
Prior art keywords
sealed
sealing
molding
electronic parts
bonding agent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP23642184A
Other languages
Japanese (ja)
Inventor
Makoto Shimanuki
嶋貫 誠
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP23642184A priority Critical patent/JPS61113240A/en
Publication of JPS61113240A publication Critical patent/JPS61113240A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/56Encapsulations, e.g. encapsulation layers, coatings
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Abstract

PURPOSE:To maintain sufficient airtightness on the sealed electronic parts, to obtain high adhesive strength, to cut down the period of formation and to reduce the generation of burrs by a method wherein epoxy bonding agent is coated on the material to be sealed in the thickness of 0.0001-0.01mm, and polyphenylene sulphide polymer (PPS) is used as a sealing material. CONSTITUTION:An IC, a transistor and other electronic parts are mounted on a substrate, and an epoxy bonding agent is coated on the outer surface of the material to be sealed. A spray coating, a potting and the like can be used as the coating method, but the most simple and derirable method is that the material to be sealed is dipped in the epoxy bonding agent diluted by an organic solvent. The desirable thickness of the film formed on the material to be sealed is 0.0001-0.01mm, and 0.002-0.005mm is considered better. Then, said material to be sealed is airtightly sealed using PPS. The well known molding method such as transfer molding or an injection molding can be adopted for the above-mentioned airtight sealing.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は電子部品の封止方法に関する。[Detailed description of the invention] [Industrial application field] The present invention relates to a method for sealing electronic components.

[従来の技術] IC,)ランジスタ、ダイオード、抵抗、コンデンサー
、コイルおよびコネクターなどの種々の電子部品は、各
端子間の電気的絶縁、機械的強度の保持、湿度や浮遊不
純物などの外部環境からの内部保護がその性能維持のた
め必要不可欠である。
[Prior Art] Various electronic components such as ICs, ) transistors, diodes, resistors, capacitors, coils, and connectors must be electrically insulated between terminals, maintain mechanical strength, and protect from external environments such as humidity and floating impurities. Internal protection is essential to maintain its performance.

そのため基板上に取りつけられた電子部品を合成樹脂を
眉いて@封するいわゆる封止が一般に什なわれている。
For this reason, so-called encapsulation, in which electronic components mounted on a board are sealed with synthetic resin, is generally used.

その封止方法としては、熱硬化性樹脂を封止材料とする
方法と、熱可塑性tM譜を封止材料とする方法とがあり
、熱硬化性tMIIWとしてはエボキン慣脂が、熱可塑
性樹脂としてはポリフェニレンサル7Tイド〆リマーが
一般に用いられる。
There are two methods for sealing: one using thermosetting resin as the sealing material, and the other using thermoplastic TM sheet as the sealing material. Generally, polyphenylene salt 7T hydride remer is used.

また封止手段には、生産性や寸法安定性などの点からト
ランス77−成形または射出成形によるモールド法が採
用される。
Further, as the sealing means, a molding method using transformer 77 molding or injection molding is adopted from the viewpoint of productivity and dimensional stability.

[発明が解決しようとする問題点] 従来の封止方法においで、エポキシ樹脂を用いたばあい
は、機械的強度が強い、気密性にすぐれるなどの長所が
あるが、その反面成形時間が長くかかる(1〜5分)、
熱によって會型内で樹脂が低粘度化するのでパリの発生
が多く成形後のパリ取り作業が困難となる、成形品とし
ては不用なランナなどが再生不可能なため材料フスFが
高くなるなどの欠点がある。
[Problems to be solved by the invention] In conventional sealing methods, when epoxy resin is used, it has advantages such as strong mechanical strength and excellent airtightness, but on the other hand, molding time is slow. It takes a long time (1-5 minutes)
As the viscosity of the resin decreases in the mold due to heat, a lot of flakes occur, making it difficult to remove the flakes after molding, and runners that are not needed for molded products cannot be recycled, resulting in a high material floss F. There are drawbacks.

一方、ポリフェニレンサルファイドポリマーを眉いる封
止方法では、耐熱性がすぐれている、パリの発生が少な
い、成形時間が短い、ランナなどの一部が再生可能など
の長所がある反面、熱可塑性樹脂の本質として熱架橋反
応がないためIt[上物との接着力が弱(、気密性が充
分えられないという欠点がある。
On the other hand, sealing methods using polyphenylene sulfide polymers have advantages such as excellent heat resistance, less generation of flakes, short molding time, and the ability to recycle some parts such as runners. Since there is essentially no thermal crosslinking reaction, it has the disadvantage of weak adhesion to the upper material (and insufficient airtightness).

以上のように従来はいずれの方法によっても一長一短で
あり、全ての要求条件を満足する封止方法はいまだに知
られていない。
As described above, each conventional method has its advantages and disadvantages, and there is still no known sealing method that satisfies all the requirements.

そこで本発明は、エポキシ樹脂を用いた封止方法のもつ
長所とポリフェニレンサルファイドポリマーを眉いた封
止方法のもつ長所とを併せ有じ、いかなる欠点も有しな
いきわめてすぐれた封止方法を提供することを目的とす
る。
Therefore, the present invention provides an extremely excellent sealing method that combines the advantages of a sealing method using an epoxy resin and the advantages of a sealing method using a polyphenylene sulfide polymer, and does not have any drawbacks. With the goal.

[問題点を解決するための手段] 本発明の電子部品の封止方法は、基板上に電子部品を取
りつけでなる被封上物にエポキシ系接着剤をo、ooo
t〜o、oi翼瀧の膜厚に塗布し、ついで封止材料とし
てポリフェニレンサルファイドポリマー(以下、PPS
という)を用い、トランスファー成形または射出成形に
上るモールド法によって電子部品を封止するようにして
いる。
[Means for Solving the Problems] The electronic component sealing method of the present invention includes attaching the electronic component to a substrate and applying an epoxy adhesive to the sealed object.
t to o, oi is applied to the film thickness of the wing, and then polyphenylene sulfide polymer (hereinafter referred to as PPS) is applied as a sealing material.
), and electronic components are encapsulated using a molding method that is superior to transfer molding or injection molding.

[実施例1 本発明の封止方法を施すにあたっては、まず金属製フレ
ームなどの基板上にグイボンドやワイヤボンドなどの方
法でICやトラン7スタその他の電子部品を取りつけて
おく。
[Example 1] In applying the sealing method of the present invention, first, ICs, transistors, and other electronic components are attached to a substrate such as a metal frame by a method such as wire bonding or wire bonding.

そのようにして被封止物をえると、その被封止物の外表
面にエポキシ系接着剤を塗布する。
Once the object to be sealed is obtained in this way, an epoxy adhesive is applied to the outer surface of the object.

エポキシ系接着剤の塗布方法としては、スプレー塗布、
ボッティングなどを用いることができるが、前記エポキ
シ系接着剤を有機溶剤で希釈し、その溶液中に浸漬する
のがもつとも簡単であるため好ましい。
Application methods for epoxy adhesive include spray application,
Although botting or the like can be used, it is preferable to dilute the epoxy adhesive with an organic solvent and immerse it in the solution because it is very simple.

前記方法で被封止物に形成される塗膜は、0.0OO1
zz以下であると密封性が損なわれ、また0、0111
11以上であると封止時に接着塗膜の変形などの不具合
が発生するのでo、ooot〜0.01mmとするのが
好ましく、さらに0.002〜0,005zgとするの
がより望ましい。
The coating film formed on the object to be sealed by the above method has a thickness of 0.0OO1
If it is less than zz, the sealing performance will be impaired, and 0,0111
If it is 11 or more, problems such as deformation of the adhesive coating will occur during sealing, so it is preferably o,ooot to 0.01 mm, and more preferably 0.002 to 0,005 zg.

以上のようにして被封上物にエポキシJ1%接着剤が塗
布されると、つぎにその被封止物をPPS′?密封する
。それにはトランスファ成形または射出成形による公知
のモールド法が採用される。すなわちトランスファ成形
によるばあいも射出成形によるばあいも、封止材料とし
てのPPSを金型の上に設けられた可塑化室に入れ、軟
化温度まで加熱しで可塑化し、これを前記被封止物が挿
入されている金型の中に圧入して硬化させ、V対成形を
什なう。
Once the epoxy J1% adhesive is applied to the object to be sealed as described above, the object to be sealed is then coated with PPS'? Seal. For this purpose, a known molding method such as transfer molding or injection molding is employed. That is, in both transfer molding and injection molding, PPS as a sealing material is placed in a plasticizing chamber provided above the mold, heated to a softening temperature to plasticize it, and then used as the sealing material. The product is press-fitted into the mold into which it is inserted, allowed to harden, and subjected to V-ply molding.

なお前述の如くエポキシ系接着剤の塗布を浸漬法を用い
たばあいは、被封止物の全表面に前記接着剤が塗布され
ているので、後工程でのはんだ付けをやりやすくするた
め、封止部分以外の塗膜を除去する必要がある。その除
去作業は、前記封止作業の後でショツトブラスト法や液
体ホーニング法、ブラッシング法などの方法で行なうと
よい。
As mentioned above, when applying the epoxy adhesive using the dipping method, the adhesive is applied to the entire surface of the object to be sealed, so in order to facilitate soldering in the subsequent process, It is necessary to remove the paint film other than the sealing area. The removal operation is preferably carried out after the sealing operation by a method such as a shot blasting method, a liquid honing method, or a brushing method.

[発明の効果1 本発明方法によって被封上物に塗布されたエボキン樹l
1ff系接着剤は、それ自体が気密性にすぐれでいるの
で、それによって封止された電子部品は充分に気密性が
保たれ、また強い接着力かえられる。
[Effect of the invention 1 Evokin wood applied to the sealed object by the method of the present invention
Since the 1FF adhesive itself has excellent airtightness, electronic components sealed with it can be kept sufficiently airtight and have strong adhesive strength.

しかも封止材料にはPPSが用いられているので、PP
Sを用いた封止方法の利息である成形時間が短くてすむ
(通常20〜40秒)、パリの発生が少なく封止後の仕
上げ作業が楽になる、ランナの一部の再利用が可能であ
るなどの点をその*ま活かすことができる。
Moreover, since PPS is used as the sealing material, PP
The advantage of the sealing method using S is that the molding time is short (usually 20 to 40 seconds), there is less generation of flakes, and finishing work after sealing is easier, and part of the runner can be reused. You can take advantage of certain points.

そのため本発明の封止方法によると、性能的に充分満足
しうる電子部品の封止が低コストでうろことができるの
である。
Therefore, according to the sealing method of the present invention, electronic components can be sealed with sufficient performance at low cost.

Claims (1)

【特許請求の範囲】[Claims] (1)電子部品を合成樹脂で封止する方法であって、基
板上に電子部品を取りつけてなる被封止物にエポキシ系
接着剤を0.0001〜0.01mmの膜厚に塗布し、
ついで封止材料としてポリフェニレンサルファイドポリ
マーを用い、トランスファー成形または射出成形による
モールド法によって電子部品を封止するようにしたこと
を特徴とする電子部品の封止方法。
(1) A method of sealing electronic components with synthetic resin, in which an epoxy adhesive is applied to a film thickness of 0.0001 to 0.01 mm on an object to be sealed, which is an electronic component mounted on a substrate,
A method for sealing an electronic component, characterized in that the electronic component is then sealed by a molding method using transfer molding or injection molding using polyphenylene sulfide polymer as a sealing material.
JP23642184A 1984-11-07 1984-11-07 Method for sealing electronic parts Pending JPS61113240A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23642184A JPS61113240A (en) 1984-11-07 1984-11-07 Method for sealing electronic parts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23642184A JPS61113240A (en) 1984-11-07 1984-11-07 Method for sealing electronic parts

Publications (1)

Publication Number Publication Date
JPS61113240A true JPS61113240A (en) 1986-05-31

Family

ID=17000503

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23642184A Pending JPS61113240A (en) 1984-11-07 1984-11-07 Method for sealing electronic parts

Country Status (1)

Country Link
JP (1) JPS61113240A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02199687A (en) * 1989-01-27 1990-08-08 Sony Corp Tape reel
JPH02110308U (en) * 1989-02-20 1990-09-04

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02199687A (en) * 1989-01-27 1990-08-08 Sony Corp Tape reel
JPH02110308U (en) * 1989-02-20 1990-09-04

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