JPS6093904A - イメ−ジセンサ上の光スポツト位置検出装置 - Google Patents

イメ−ジセンサ上の光スポツト位置検出装置

Info

Publication number
JPS6093904A
JPS6093904A JP20152683A JP20152683A JPS6093904A JP S6093904 A JPS6093904 A JP S6093904A JP 20152683 A JP20152683 A JP 20152683A JP 20152683 A JP20152683 A JP 20152683A JP S6093904 A JPS6093904 A JP S6093904A
Authority
JP
Japan
Prior art keywords
image sensor
output
clock
light spot
sensor output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP20152683A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0575964B2 (enrdf_load_stackoverflow
Inventor
Itaru Ichikawa
市川　格
Yasunari Kuroda
黒田　康徳
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SANPA KOGYO KK
Original Assignee
SANPA KOGYO KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SANPA KOGYO KK filed Critical SANPA KOGYO KK
Priority to JP20152683A priority Critical patent/JPS6093904A/ja
Publication of JPS6093904A publication Critical patent/JPS6093904A/ja
Publication of JPH0575964B2 publication Critical patent/JPH0575964B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP20152683A 1983-10-28 1983-10-28 イメ−ジセンサ上の光スポツト位置検出装置 Granted JPS6093904A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20152683A JPS6093904A (ja) 1983-10-28 1983-10-28 イメ−ジセンサ上の光スポツト位置検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20152683A JPS6093904A (ja) 1983-10-28 1983-10-28 イメ−ジセンサ上の光スポツト位置検出装置

Publications (2)

Publication Number Publication Date
JPS6093904A true JPS6093904A (ja) 1985-05-25
JPH0575964B2 JPH0575964B2 (enrdf_load_stackoverflow) 1993-10-21

Family

ID=16442502

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20152683A Granted JPS6093904A (ja) 1983-10-28 1983-10-28 イメ−ジセンサ上の光スポツト位置検出装置

Country Status (1)

Country Link
JP (1) JPS6093904A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62176704U (enrdf_load_stackoverflow) * 1986-04-28 1987-11-10

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5852508A (ja) * 1981-09-22 1983-03-28 Yokogawa Hokushin Electric Corp 形状測定装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5852508A (ja) * 1981-09-22 1983-03-28 Yokogawa Hokushin Electric Corp 形状測定装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62176704U (enrdf_load_stackoverflow) * 1986-04-28 1987-11-10

Also Published As

Publication number Publication date
JPH0575964B2 (enrdf_load_stackoverflow) 1993-10-21

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