JPS6076647A - 塗膜乾燥度検知方法 - Google Patents

塗膜乾燥度検知方法

Info

Publication number
JPS6076647A
JPS6076647A JP18558083A JP18558083A JPS6076647A JP S6076647 A JPS6076647 A JP S6076647A JP 18558083 A JP18558083 A JP 18558083A JP 18558083 A JP18558083 A JP 18558083A JP S6076647 A JPS6076647 A JP S6076647A
Authority
JP
Japan
Prior art keywords
light
applied film
amount
reflected light
film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18558083A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0458571B2 (enrdf_load_stackoverflow
Inventor
Yasutoshi Okuzawa
奥沢 保利
Kenichi Masuyama
健一 増山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Holdings Corp
Original Assignee
Fuji Photo Film Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Photo Film Co Ltd filed Critical Fuji Photo Film Co Ltd
Priority to JP18558083A priority Critical patent/JPS6076647A/ja
Publication of JPS6076647A publication Critical patent/JPS6076647A/ja
Publication of JPH0458571B2 publication Critical patent/JPH0458571B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/4738Diffuse reflection, e.g. also for testing fluids, fibrous materials

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP18558083A 1983-10-04 1983-10-04 塗膜乾燥度検知方法 Granted JPS6076647A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18558083A JPS6076647A (ja) 1983-10-04 1983-10-04 塗膜乾燥度検知方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18558083A JPS6076647A (ja) 1983-10-04 1983-10-04 塗膜乾燥度検知方法

Publications (2)

Publication Number Publication Date
JPS6076647A true JPS6076647A (ja) 1985-05-01
JPH0458571B2 JPH0458571B2 (enrdf_load_stackoverflow) 1992-09-17

Family

ID=16173292

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18558083A Granted JPS6076647A (ja) 1983-10-04 1983-10-04 塗膜乾燥度検知方法

Country Status (1)

Country Link
JP (1) JPS6076647A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4693038A (en) * 1985-04-06 1987-09-15 Schaudt Maschinenbau Gmbh Apparatus for optically monitoring the surface finish of ground workpieces
WO2000031516A1 (en) * 1998-11-20 2000-06-02 Honeywell-Measurex Corporation Gel point sensor
EP3674687A4 (en) * 2018-01-08 2020-11-25 Lg Chem, Ltd. METHOD AND APPARATUS FOR MONITORING THE DRY STATE OF AN ELECTRODE SUBSTRATE

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS549689A (en) * 1977-06-23 1979-01-24 Sony Corp Dryness detecting method
JPS5636496A (en) * 1980-08-08 1981-04-09 Kao Corp Hydroxyalkyl etherified glycolipid ester and its preparation

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS549689A (en) * 1977-06-23 1979-01-24 Sony Corp Dryness detecting method
JPS5636496A (en) * 1980-08-08 1981-04-09 Kao Corp Hydroxyalkyl etherified glycolipid ester and its preparation

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4693038A (en) * 1985-04-06 1987-09-15 Schaudt Maschinenbau Gmbh Apparatus for optically monitoring the surface finish of ground workpieces
WO2000031516A1 (en) * 1998-11-20 2000-06-02 Honeywell-Measurex Corporation Gel point sensor
JP2002530669A (ja) * 1998-11-20 2002-09-17 ハネウエル−メジャレクス・コーポレーション ゲル化点センサ
EP1131619B1 (en) * 1998-11-20 2006-10-18 Honeywell-Measurex Corporation Method for monitoring drying speed of a coating
EP3674687A4 (en) * 2018-01-08 2020-11-25 Lg Chem, Ltd. METHOD AND APPARATUS FOR MONITORING THE DRY STATE OF AN ELECTRODE SUBSTRATE

Also Published As

Publication number Publication date
JPH0458571B2 (enrdf_load_stackoverflow) 1992-09-17

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees