JPS6050935A - ガリウム砒素ウェーハ検査装置 - Google Patents
ガリウム砒素ウェーハ検査装置Info
- Publication number
- JPS6050935A JPS6050935A JP58157966A JP15796683A JPS6050935A JP S6050935 A JPS6050935 A JP S6050935A JP 58157966 A JP58157966 A JP 58157966A JP 15796683 A JP15796683 A JP 15796683A JP S6050935 A JPS6050935 A JP S6050935A
- Authority
- JP
- Japan
- Prior art keywords
- light
- polarizing plate
- plate
- measurement
- light source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H10P74/00—
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58157966A JPS6050935A (ja) | 1983-08-31 | 1983-08-31 | ガリウム砒素ウェーハ検査装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58157966A JPS6050935A (ja) | 1983-08-31 | 1983-08-31 | ガリウム砒素ウェーハ検査装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6050935A true JPS6050935A (ja) | 1985-03-22 |
| JPH0317217B2 JPH0317217B2 (enExample) | 1991-03-07 |
Family
ID=15661332
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58157966A Granted JPS6050935A (ja) | 1983-08-31 | 1983-08-31 | ガリウム砒素ウェーハ検査装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6050935A (enExample) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01122133A (ja) * | 1987-11-06 | 1989-05-15 | Toshiba Corp | 接合型半導体基板の検査方法 |
| JPH01263540A (ja) * | 1988-04-15 | 1989-10-20 | Hitachi Ltd | パターン検出装置 |
| US11805574B2 (en) | 2017-02-01 | 2023-10-31 | Nicoventures Trading Limited | Heating element selection method |
| US11818812B2 (en) | 2017-02-01 | 2023-11-14 | Nicoventures Trading Limited | Heating element and method of analyzing |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54149586A (en) * | 1978-05-17 | 1979-11-22 | Hitachi Ltd | Mask aligner |
| JPS5632116A (en) * | 1979-08-23 | 1981-04-01 | Toshiba Corp | Specimen observing device |
-
1983
- 1983-08-31 JP JP58157966A patent/JPS6050935A/ja active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54149586A (en) * | 1978-05-17 | 1979-11-22 | Hitachi Ltd | Mask aligner |
| JPS5632116A (en) * | 1979-08-23 | 1981-04-01 | Toshiba Corp | Specimen observing device |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01122133A (ja) * | 1987-11-06 | 1989-05-15 | Toshiba Corp | 接合型半導体基板の検査方法 |
| JPH01263540A (ja) * | 1988-04-15 | 1989-10-20 | Hitachi Ltd | パターン検出装置 |
| US11805574B2 (en) | 2017-02-01 | 2023-10-31 | Nicoventures Trading Limited | Heating element selection method |
| US11818812B2 (en) | 2017-02-01 | 2023-11-14 | Nicoventures Trading Limited | Heating element and method of analyzing |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0317217B2 (enExample) | 1991-03-07 |
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