JPS60255697A - 炭化珪素単結晶の不純物濃度制御方法 - Google Patents
炭化珪素単結晶の不純物濃度制御方法Info
- Publication number
- JPS60255697A JPS60255697A JP59112569A JP11256984A JPS60255697A JP S60255697 A JPS60255697 A JP S60255697A JP 59112569 A JP59112569 A JP 59112569A JP 11256984 A JP11256984 A JP 11256984A JP S60255697 A JPS60255697 A JP S60255697A
- Authority
- JP
- Japan
- Prior art keywords
- silicon carbide
- single crystal
- impurity concentration
- carbide single
- gas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/36—Carbides
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Chemical Vapour Deposition (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59112569A JPS60255697A (ja) | 1984-05-31 | 1984-05-31 | 炭化珪素単結晶の不純物濃度制御方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59112569A JPS60255697A (ja) | 1984-05-31 | 1984-05-31 | 炭化珪素単結晶の不純物濃度制御方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60255697A true JPS60255697A (ja) | 1985-12-17 |
JPH0343240B2 JPH0343240B2 (enrdf_load_html_response) | 1991-07-01 |
Family
ID=14589984
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59112569A Granted JPS60255697A (ja) | 1984-05-31 | 1984-05-31 | 炭化珪素単結晶の不純物濃度制御方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60255697A (enrdf_load_html_response) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1178132A3 (en) * | 2000-08-02 | 2003-06-25 | Tokai Carbon Company, Ltd. | SiC material and method for manufacturing same |
KR100450316B1 (ko) * | 2000-08-10 | 2004-09-30 | 호야 가부시키가이샤 | 탄화 규소 및 이의 제조 방법 |
CN109576784A (zh) * | 2017-09-29 | 2019-04-05 | 上海新昇半导体科技有限公司 | 一种SiC外延层的制备方法及装置 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54104488A (en) * | 1978-02-03 | 1979-08-16 | Sharp Corp | Production of silicon carbide crystal layer |
-
1984
- 1984-05-31 JP JP59112569A patent/JPS60255697A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54104488A (en) * | 1978-02-03 | 1979-08-16 | Sharp Corp | Production of silicon carbide crystal layer |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1178132A3 (en) * | 2000-08-02 | 2003-06-25 | Tokai Carbon Company, Ltd. | SiC material and method for manufacturing same |
KR100450316B1 (ko) * | 2000-08-10 | 2004-09-30 | 호야 가부시키가이샤 | 탄화 규소 및 이의 제조 방법 |
CN109576784A (zh) * | 2017-09-29 | 2019-04-05 | 上海新昇半导体科技有限公司 | 一种SiC外延层的制备方法及装置 |
Also Published As
Publication number | Publication date |
---|---|
JPH0343240B2 (enrdf_load_html_response) | 1991-07-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US3956032A (en) | Process for fabricating SiC semiconductor devices | |
US4623425A (en) | Method of fabricating single-crystal substrates of silicon carbide | |
JPS60145992A (ja) | 炭化珪素単結晶基板の製造方法 | |
US4865659A (en) | Heteroepitaxial growth of SiC on Si | |
JPS60255697A (ja) | 炭化珪素単結晶の不純物濃度制御方法 | |
JPS61243000A (ja) | 炭化珪素単結晶基板の製造方法 | |
JP2550024B2 (ja) | 減圧cvd装置 | |
JPH0977594A (ja) | 低抵抗単結晶炭化珪素の製造方法 | |
JPS63283014A (ja) | 炭化珪素半導体素子 | |
JPS61291495A (ja) | 炭化珪素単結晶基板の製造方法 | |
JPS61242998A (ja) | 炭化珪素単結晶半導体の製造方法 | |
JPS6115150B2 (enrdf_load_html_response) | ||
JP2680617B2 (ja) | 炭化ケイ素単結晶の成長方法 | |
JPS63277596A (ja) | 炭化珪素単結晶の成長方法 | |
JPH0443878B2 (enrdf_load_html_response) | ||
JPS6230699A (ja) | 炭化珪素単結晶基板の製造方法 | |
JPS60264399A (ja) | 炭化珪素単結晶の製造方法 | |
JPH09142995A (ja) | P型単結晶炭化珪素の製造方法 | |
JPH0327515B2 (enrdf_load_html_response) | ||
JP2539427B2 (ja) | 炭化珪素半導体素子の製造方法 | |
JPS61242999A (ja) | 炭化珪素単結晶基板の製造方法 | |
JPS6360199A (ja) | 炭化珪素単結晶の製造方法 | |
JPH0458691B2 (enrdf_load_html_response) | ||
JPS63303896A (ja) | 炭化珪素単結晶膜の製造方法 | |
JPS6230696A (ja) | 広禁制帯幅半導体結晶の製造方法 |