JPS60247133A - モアレ縞によるレンズの焦点距離測定法 - Google Patents

モアレ縞によるレンズの焦点距離測定法

Info

Publication number
JPS60247133A
JPS60247133A JP10411184A JP10411184A JPS60247133A JP S60247133 A JPS60247133 A JP S60247133A JP 10411184 A JP10411184 A JP 10411184A JP 10411184 A JP10411184 A JP 10411184A JP S60247133 A JPS60247133 A JP S60247133A
Authority
JP
Japan
Prior art keywords
grating
lens
fourier image
focal length
focal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10411184A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0339625B2 (enrdf_load_stackoverflow
Inventor
Yoshiaki Nakano
中野　善明
Kazumi Murata
和美 村田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to JP10411184A priority Critical patent/JPS60247133A/ja
Publication of JPS60247133A publication Critical patent/JPS60247133A/ja
Publication of JPH0339625B2 publication Critical patent/JPH0339625B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0228—Testing optical properties by measuring refractive power

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP10411184A 1984-05-22 1984-05-22 モアレ縞によるレンズの焦点距離測定法 Granted JPS60247133A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10411184A JPS60247133A (ja) 1984-05-22 1984-05-22 モアレ縞によるレンズの焦点距離測定法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10411184A JPS60247133A (ja) 1984-05-22 1984-05-22 モアレ縞によるレンズの焦点距離測定法

Publications (2)

Publication Number Publication Date
JPS60247133A true JPS60247133A (ja) 1985-12-06
JPH0339625B2 JPH0339625B2 (enrdf_load_stackoverflow) 1991-06-14

Family

ID=14372014

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10411184A Granted JPS60247133A (ja) 1984-05-22 1984-05-22 モアレ縞によるレンズの焦点距離測定法

Country Status (1)

Country Link
JP (1) JPS60247133A (enrdf_load_stackoverflow)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1324015A1 (en) * 2001-12-27 2003-07-02 Rotlex (1994) Ltd. A method and apparatus for testing and mapping optical elements
US7834990B2 (en) 2006-12-26 2010-11-16 Seiko Epson Corporation Evaluation method for evaluating optical characteristics of optical system, evaluation method for evaluating projector, evaluation device for evaluating optical characteristics, and screen
CN102252824A (zh) * 2011-04-12 2011-11-23 浙江大学 基于泰伯效应的复合差分式长焦距测量装置
CN107515103A (zh) * 2016-06-17 2017-12-26 南京理工大学 一种采用环形光栅的焦距检测装置及方法
CN109799078A (zh) * 2019-03-08 2019-05-24 中国科学院长春光学精密机械与物理研究所 利用莫尔条纹放大作用的平行光管焦距测量装置及方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5816216A (ja) * 1981-07-22 1983-01-29 Canon Inc タルボ干渉計

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5816216A (ja) * 1981-07-22 1983-01-29 Canon Inc タルボ干渉計

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1324015A1 (en) * 2001-12-27 2003-07-02 Rotlex (1994) Ltd. A method and apparatus for testing and mapping optical elements
US6771362B2 (en) 2001-12-27 2004-08-03 Rotlex Ltd. Method and apparatus for testing and mapping phase objects
US7834990B2 (en) 2006-12-26 2010-11-16 Seiko Epson Corporation Evaluation method for evaluating optical characteristics of optical system, evaluation method for evaluating projector, evaluation device for evaluating optical characteristics, and screen
CN102252824A (zh) * 2011-04-12 2011-11-23 浙江大学 基于泰伯效应的复合差分式长焦距测量装置
CN107515103A (zh) * 2016-06-17 2017-12-26 南京理工大学 一种采用环形光栅的焦距检测装置及方法
CN107515103B (zh) * 2016-06-17 2019-06-21 南京理工大学 一种采用环形光栅的焦距检测装置及方法
CN109799078A (zh) * 2019-03-08 2019-05-24 中国科学院长春光学精密机械与物理研究所 利用莫尔条纹放大作用的平行光管焦距测量装置及方法
CN109799078B (zh) * 2019-03-08 2020-05-15 中国科学院长春光学精密机械与物理研究所 利用莫尔条纹放大作用的平行光管焦距测量装置及方法

Also Published As

Publication number Publication date
JPH0339625B2 (enrdf_load_stackoverflow) 1991-06-14

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