JPS60234967A - Target for sputtering - Google Patents
Target for sputteringInfo
- Publication number
- JPS60234967A JPS60234967A JP8835584A JP8835584A JPS60234967A JP S60234967 A JPS60234967 A JP S60234967A JP 8835584 A JP8835584 A JP 8835584A JP 8835584 A JP8835584 A JP 8835584A JP S60234967 A JPS60234967 A JP S60234967A
- Authority
- JP
- Japan
- Prior art keywords
- target
- substrate
- thin film
- elements
- central
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/0682—Silicides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は2以上の成分元素からなる合金、焼結体等のス
パッタリング用ターゲットに関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a sputtering target made of an alloy, a sintered body, etc. consisting of two or more component elements.
従来、基板表面に一複数元素からなる薄膜をスパッタリ
ングによシ形成する場合、第1図示のように真空室a内
にシリコンウェハ等の基板すと例えばMo5ilのター
ゲットcを対向設置して行なう會一般とするが、基板す
の表面に付着する薄膜は第2図に見られるようにMoF
iはぼ均一に分布するがSiは基板中央部分で成分比が
小さくなって均質な薄膜が得られない。こうした不均一
な成分比の薄膜が形成される理由はスパッタされたとき
元素の稲類によって飛び出し方向が異なることや、ガス
原子と衝突した際の方向の偏位角が異なることによるも
のと思われ、通常81の成分比が基板中心に於て外周部
よ夕も5%以上もの狂いを生ずることがあシ、VLS
Iの基板として不適当なものとなる。Conventionally, when forming a thin film made of one or more elements on the surface of a substrate by sputtering, the process is carried out by placing a target c of Mo5il, for example, in a vacuum chamber a, facing the substrate such as a silicon wafer, as shown in Figure 1. Generally speaking, the thin film attached to the surface of the substrate is MoF as shown in Figure 2.
Although i is almost uniformly distributed, the component ratio of Si is small in the center of the substrate, making it impossible to obtain a homogeneous thin film. The reason why thin films with such uneven component ratios are formed is thought to be due to the fact that when sputtered, the ejecting direction of the elements differs depending on the species, and the deviation angle of the direction when colliding with gas atoms differs. , normally the component ratio of 81 may deviate by more than 5% at the center of the board and at the outer periphery.
This makes it unsuitable as a substrate for I.
本発明は基板に複数の元素がほぼ均一に分布した薄膜を
形成するに適したターゲットの提供を目的とするもので
、基板表面に複数元素からなる薄膜をスパッタリングに
よシ形成すべく該基板に対向して配置される該複数元素
からなる合金等のターゲットに於て、該ターゲットヶ、
その中央部分とその外周部分とで該基板に対して付着性
の悪い元素の配合比會異ならせて形成して成る。The present invention aims to provide a target suitable for forming a thin film on a substrate in which a plurality of elements are distributed almost uniformly. In a target such as an alloy made of the plurality of elements arranged facing each other, the target is
The central portion and the outer peripheral portion thereof are formed with different proportions of elements that have poor adhesion to the substrate.
本発明の実施例を第3図につき説明すると、符号(1)
は複数元素からなる合金或は焼結体等を円形の板状体に
形成して得たクーゲラ)k示し。An embodiment of the present invention will be explained with reference to FIG.
indicates Kugela)k, which is obtained by forming an alloy or sintered body made of multiple elements into a circular plate-like body.
該ターゲット(1)か第1図のように真空室内に基板と
対向して設けられてスパッタリングに供されるとその成
分元素が該基板の表面に薄膜状に付着する。この場合該
ターゲット(1)の中央部分(2)とその外周部分(3
)とで基板に対し付着性の悪い元素の配合比を変えるこ
とによシ基板に形成される薄膜の成分比が基板の中央部
分と外周部分とで余り異ならないほぼ均一な良好な薄膜
が得られる。When the target (1) is provided in a vacuum chamber facing the substrate as shown in FIG. 1 and subjected to sputtering, its constituent elements adhere to the surface of the substrate in the form of a thin film. In this case, the central part (2) of the target (1) and its outer peripheral part (3)
) By changing the compounding ratio of elements that have poor adhesion to the substrate, it is possible to obtain a good, almost uniform thin film in which the component ratio of the thin film formed on the substrate does not differ much between the central part and the outer peripheral part of the substrate. It will be done.
シリコンの基板VCMoとSIからなる薄膜を形成する
場合、MoSi2からなるターゲットを使用するが、こ
の場合基板の中央部分のSiの成分比が前記したように
その外周部分よシも小さくなるので問題となるSiミラ
ターゲット1)の中央部分(2)に於てその外周部分(
3)の配合比よりも多く配合することにより基板上の薄
膜のSiの成分比が全体にほぼ均一となし得る。When forming a thin film made of silicon substrates VCMo and SI, a target made of MoSi2 is used, but in this case there is a problem because the Si component ratio in the central part of the substrate is smaller than in the outer periphery as described above. In the central part (2) of the Si Mira target 1), its outer peripheral part (
By blending more than the blending ratio of 3), the Si component ratio of the thin film on the substrate can be made almost uniform throughout.
中央部分(2)と外周部分(3)とで成分元素の配合比
を変える手段として、実施例では環状の外周部分(3)
とその円孔(3a)内に適合する中央部:分(2)とに
分け、核外8部分(31VCはMoと81の配合比を例
えは1:2とするが、中央部分(2)では] : 2.
5に配合される。尚成分元素の数は3種以上であっても
よい。As a means of changing the blending ratio of component elements between the central portion (2) and the outer circumferential portion (3), in the embodiment, an annular outer circumferential portion (3) is used.
and a central part (2) that fits inside the circular hole (3a), and 8 parts outside the core (for example, the blending ratio of Mo and 81 is 1:2 for 31VC, but the central part (2) Then]: 2.
5. Note that the number of component elements may be three or more.
このように本発明によるときはターゲットの中央部分と
その外周部分とで複数元素の配合比を変えるようにした
ので基板にスパッタリングで形成される薄膜の成分比を
全体的にほぼ均一となし得、特KVLSIの基板の製造
に好都合である等の効果がある。In this way, according to the present invention, since the compounding ratio of multiple elements is changed between the central part of the target and its outer peripheral part, the composition ratio of the thin film formed on the substrate by sputtering can be made almost uniform throughout. It has effects such as being particularly convenient for manufacturing KVLSI substrates.
第1図は一般的なスパッタリング装置の断面線図、第2
図−基板に形成され7(薄膜の成分比の線図、第3図は
本発明の実施例の一部門断斜視図である。
(1)・・・ターゲット (2)・・・中央部分(3)
・・・外周部分Figure 1 is a cross-sectional diagram of a general sputtering device, Figure 2
Fig. 3 is a cross-sectional perspective view of a section of an embodiment of the present invention. (1) Target (2) Central part ( 3)
・・・Outer part
Claims (1)
り形成すべく該基板に対向して配置される該複数元素か
らなる合金等のターゲットに於て、該ターゲラ)k、そ
の中央部分とその外周部分とで該基板に対して付着性の
悪い元素の配合比を異ならせて形成して敗るスパッタリ
ング用ターゲット。In a target such as an alloy made of a plurality of elements, which is placed facing the substrate to form a thin film made of a plurality of elements on the surface of the substrate by scattering, Sputtering targets are formed by forming different blending ratios of elements that have poor adhesion to the substrate.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8835584A JPS60234967A (en) | 1984-05-04 | 1984-05-04 | Target for sputtering |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8835584A JPS60234967A (en) | 1984-05-04 | 1984-05-04 | Target for sputtering |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS60234967A true JPS60234967A (en) | 1985-11-21 |
Family
ID=13940504
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8835584A Pending JPS60234967A (en) | 1984-05-04 | 1984-05-04 | Target for sputtering |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60234967A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63307267A (en) * | 1987-06-04 | 1988-12-14 | Toshiba Corp | Sputtering target and its production |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5835261A (en) * | 1981-08-25 | 1983-03-01 | Mitsubishi Heavy Ind Ltd | Fuel injection valve |
-
1984
- 1984-05-04 JP JP8835584A patent/JPS60234967A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5835261A (en) * | 1981-08-25 | 1983-03-01 | Mitsubishi Heavy Ind Ltd | Fuel injection valve |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63307267A (en) * | 1987-06-04 | 1988-12-14 | Toshiba Corp | Sputtering target and its production |
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