JPS60119428A - 波長走査型半導体レ−ザ干渉計 - Google Patents

波長走査型半導体レ−ザ干渉計

Info

Publication number
JPS60119428A
JPS60119428A JP22685083A JP22685083A JPS60119428A JP S60119428 A JPS60119428 A JP S60119428A JP 22685083 A JP22685083 A JP 22685083A JP 22685083 A JP22685083 A JP 22685083A JP S60119428 A JPS60119428 A JP S60119428A
Authority
JP
Japan
Prior art keywords
semiconductor laser
wavelength
interferometer
light
interference fringes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP22685083A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0444939B2 (enrdf_load_stackoverflow
Inventor
Kimio Tateno
立野　公男
Keiji Kataoka
慶二 片岡
Seiji Yonezawa
米沢　成二
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP22685083A priority Critical patent/JPS60119428A/ja
Publication of JPS60119428A publication Critical patent/JPS60119428A/ja
Publication of JPH0444939B2 publication Critical patent/JPH0444939B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP22685083A 1983-12-02 1983-12-02 波長走査型半導体レ−ザ干渉計 Granted JPS60119428A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22685083A JPS60119428A (ja) 1983-12-02 1983-12-02 波長走査型半導体レ−ザ干渉計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22685083A JPS60119428A (ja) 1983-12-02 1983-12-02 波長走査型半導体レ−ザ干渉計

Publications (2)

Publication Number Publication Date
JPS60119428A true JPS60119428A (ja) 1985-06-26
JPH0444939B2 JPH0444939B2 (enrdf_load_stackoverflow) 1992-07-23

Family

ID=16851541

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22685083A Granted JPS60119428A (ja) 1983-12-02 1983-12-02 波長走査型半導体レ−ザ干渉計

Country Status (1)

Country Link
JP (1) JPS60119428A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002511294A (ja) * 1998-04-15 2002-04-16 イントラルーミナル・セラピューティクス・インコーポレーテッド ガイドワイヤアッセンブリ

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002511294A (ja) * 1998-04-15 2002-04-16 イントラルーミナル・セラピューティクス・インコーポレーテッド ガイドワイヤアッセンブリ

Also Published As

Publication number Publication date
JPH0444939B2 (enrdf_load_stackoverflow) 1992-07-23

Similar Documents

Publication Publication Date Title
US4759628A (en) Wavelength scanning interferometry and interferometer employing laser diode
JP2859292B2 (ja) 散乱表面からの過渡運動の光学的検出方法及び装置
US4432239A (en) Apparatus for measuring deformation
JPS6324115A (ja) 磁気ヘツドの浮上量測定方法及びその装置
US3767307A (en) Real time interferometer
GB1596650A (en) Interferometer using phase modulation
KR100503007B1 (ko) 광픽업용 액추에이터의 부공진 측정 장치
JPS6319822B2 (enrdf_load_stackoverflow)
JP2004226093A (ja) レーザ振動計
JPS6134430A (ja) アクテイブミラ−波面センサ
JPS60119428A (ja) 波長走査型半導体レ−ザ干渉計
JPH0344243B2 (enrdf_load_stackoverflow)
JP2923779B1 (ja) 超音波検出用光干渉装置
JPS60253953A (ja) ガス濃度測定方式
JPS63241305A (ja) 縞走査法
SU1026010A1 (ru) Устройство дл измерени малых медленных изменений оптической длины измерительного плеча интерферометра
JPH0648366Y2 (ja) レーザ周波数計
JP2787345B2 (ja) ２波長光源素子
JPS6231281B2 (enrdf_load_stackoverflow)
JPS61133813A (ja) 面形状測定装置
SU842626A1 (ru) Устройство дл измерени фазочастотнойи АМплиТудНО-чАСТОТНОй ХАРАКТЕРиСТиК
SU266266A1 (ru) Отсчетное устройство для измерения отклонениялуча света
JP2002093094A (ja) 磁気ヘッド浮上量測定装置
JPH0774762B2 (ja) レーザ周波数計
JPH02287104A (ja) レーザ測長器