JPS60118779U - Semiconductor test substrate with heating device - Google Patents
Semiconductor test substrate with heating deviceInfo
- Publication number
- JPS60118779U JPS60118779U JP606384U JP606384U JPS60118779U JP S60118779 U JPS60118779 U JP S60118779U JP 606384 U JP606384 U JP 606384U JP 606384 U JP606384 U JP 606384U JP S60118779 U JPS60118779 U JP S60118779U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor
- heating device
- printed wiring
- test substrate
- fixing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第1図はプリント配線板の構造の一例を示すための斜視
図、第2図および第3図はこの考案の実施例を示すため
のイ蓋板およびロブリント配線板の要部断面図、第4図
および第5図は加熱装置としてのヒータの構造を例示す
るための断面図、第6図イはヒータの応用例を示すため
の平面図、同口はその拡大断面図、第7図は蓋板内面の
一部に埋め込みヒータを取り付けた例を模式的に示した
断面図、第8図は蓋板内面に加熱装置を装着した、状態
を例示するための一部切欠の斜視図である。
1.1′・・・絶縁基板、2・・・回路、2′・・・端
子、3.4・・・半導体、3’、 4’・・・リード
部、5・・・固定用穴、6・・・エラスチックコネクタ
ー、7・・・弾性体、8・・・蓋板、9・・・ヒータ、
10・・・接着剤、11・・・発熱体、12・・・導線
、13・・・保護材、14・・・充填材、15・・・プ
ラスチック板、16・・・金属板。
第2図
(イ) 「ミ
7才
io、FIG. 1 is a perspective view showing an example of the structure of a printed wiring board, FIGS. 2 and 3 are sectional views of main parts of a cover board and a Roblint wiring board showing an embodiment of this invention, and FIG. 5 and 5 are cross-sectional views to illustrate the structure of the heater as a heating device, FIG. FIG. 8 is a cross-sectional view schematically showing an example in which an embedded heater is attached to a part of the inner surface of the plate, and FIG. 8 is a partially cutaway perspective view for illustrating a state in which a heating device is attached to the inner surface of the lid plate. 1.1'...Insulating board, 2...Circuit, 2'...Terminal, 3.4...Semiconductor, 3', 4'...Lead portion, 5...Fixing hole, 6... Elastic connector, 7... Elastic body, 8... Lid plate, 9... Heater,
DESCRIPTION OF SYMBOLS 10... Adhesive, 11... Heating element, 12... Conductor, 13... Protective material, 14... Filler, 15... Plastic plate, 16... Metal plate. Figure 2 (a) “My 7 year old io,
Claims (1)
または固定用爪を設けたプリント配線板と、このプリン
ト配線板上に配置された半導体の本体を押し付けて半導
体のリード部とプリント配線板上の端子とを密着させる
弾性体を設けた蓋板とからなる半導体試験用基板におい
て、少なくともその弾性体の内部または蓋板の全面もし
くは一部に半導体を加熱または保温するためのヒータを
設けたことを特徴とする加熱装置付き半導体試験用基板
。A printed wiring board provided with a fixing hole, a fixing frame, or a fixing claw for determining and fixing a semiconductor device, and the main body of the semiconductor placed on this printed wiring board are pressed together to connect the leads of the semiconductor and the printed wiring. A semiconductor testing board consisting of a lid plate provided with an elastic body that brings the terminals on the board into close contact, with a heater provided at least inside the elastic body or on the entire surface or part of the lid plate to heat or keep the semiconductor warm. A semiconductor test substrate with a heating device characterized by:
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP606384U JPS60118779U (en) | 1984-01-19 | 1984-01-19 | Semiconductor test substrate with heating device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP606384U JPS60118779U (en) | 1984-01-19 | 1984-01-19 | Semiconductor test substrate with heating device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS60118779U true JPS60118779U (en) | 1985-08-10 |
Family
ID=30483158
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP606384U Pending JPS60118779U (en) | 1984-01-19 | 1984-01-19 | Semiconductor test substrate with heating device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60118779U (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007078388A (en) * | 2005-09-12 | 2007-03-29 | Matsushita Electric Ind Co Ltd | Electronic component tester |
JP2007525672A (en) * | 2004-02-27 | 2007-09-06 | ウエルス−シーティーアイ,リミテッド ライアビリティ カンパニー | Equipment and method for energization test |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5143573B2 (en) * | 1972-08-05 | 1976-11-22 | ||
JPS57114866A (en) * | 1981-01-08 | 1982-07-16 | Yamagata Nippon Denki Kk | Measuring device of semiconductor device |
-
1984
- 1984-01-19 JP JP606384U patent/JPS60118779U/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5143573B2 (en) * | 1972-08-05 | 1976-11-22 | ||
JPS57114866A (en) * | 1981-01-08 | 1982-07-16 | Yamagata Nippon Denki Kk | Measuring device of semiconductor device |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007525672A (en) * | 2004-02-27 | 2007-09-06 | ウエルス−シーティーアイ,リミテッド ライアビリティ カンパニー | Equipment and method for energization test |
JP2007078388A (en) * | 2005-09-12 | 2007-03-29 | Matsushita Electric Ind Co Ltd | Electronic component tester |
JP4654852B2 (en) * | 2005-09-12 | 2011-03-23 | パナソニック株式会社 | Electronic component testing equipment |
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