JPS60109297A - Method of producing printed board - Google Patents
Method of producing printed boardInfo
- Publication number
- JPS60109297A JPS60109297A JP21614583A JP21614583A JPS60109297A JP S60109297 A JPS60109297 A JP S60109297A JP 21614583 A JP21614583 A JP 21614583A JP 21614583 A JP21614583 A JP 21614583A JP S60109297 A JPS60109297 A JP S60109297A
- Authority
- JP
- Japan
- Prior art keywords
- continuity
- inner layer
- printed board
- test
- continuity test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Production Of Multi-Layered Print Wiring Board (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
〔発明の利用分野〕
本発明は、プリント板の内層コアに、導通試5M 用2
/l/ *−ルを全格子上に作成することにより、特
にプリント板の内層コア導通試験工数を低減するに好適
な、プリント板の製造方法に関する。[Detailed Description of the Invention] [Field of Application of the Invention] The present invention provides a conductivity test 5M 2 for the inner core of a printed board.
The present invention relates to a method of manufacturing a printed board, which is particularly suitable for reducing the number of man-hours required for inner layer core continuity testing of a printed board by creating /l/*-rules on the entire grid.
従来のプリント板製造は第5図に示すように(α)の基
材より、(C)の内層コアを作成する。In conventional printed board manufacturing, as shown in FIG. 5, an inner layer core (C) is created from a base material (α).
(C)の内層コアは第1図の状態の回路が作成されてお
り、このパターンの導通な試験するには第6図に示すよ
うに、両面よりの導通試験が必要となり、従い論理を有
する内層コアの導通試験には、多(の時間を要し、プリ
ント板が高密度化される九つれ所要時間が増加するとい
う問題があった。The inner layer core in (C) has a circuit in the state shown in Figure 1, and in order to test the continuity of this pattern, it is necessary to conduct a continuity test from both sides as shown in Figure 6, and therefore it has logic. Continuity testing of the inner core takes a lot of time, and there is a problem in that the time required for the printed circuit board to be densified increases.
本発明の目的とするところは前記の如き従来の問題点を
除去するものでありプリント板の内層コア導通試験を一
度で完了させるため内層コア製造時に全格子上にスルホ
ールな設けるプリント板の製造方法を提供するところに
ある。The object of the present invention is to eliminate the above-mentioned conventional problems, and to complete the continuity test of the inner layer core of the printed board at once, there is a method for manufacturing a printed board in which through-holes are provided on all the grids during the manufacture of the inner layer core. It is in a place where we provide.
本発明の特徴とするところは内層コアの導通試験を一度
で完了するために、内層コア製造時に導通試験用スルホ
ールを全格子上に設けた、このことより表側の導通試験
を行なうと同時に。A feature of the present invention is that in order to complete the continuity test of the inner core at once, through-holes for continuity testing are provided on the entire grid during the production of the inner core, which allows the continuity test of the front side to be performed at the same time.
裏側も導通試験用スルホールにより導通試験を行なうこ
とができる。Continuity tests can also be performed on the back side using through holes for continuity tests.
次に本発明の実施例につき図面を用いて詳細に説明する
。Next, embodiments of the present invention will be described in detail using the drawings.
第5図に従来のプリント板製造方法を示し、第6図に本
発明のプリント板製造方法を示すものである。第6図に
おいて内層コア材銅箔6を両面に貼り合わせた内層コア
基材7に公知の方法による穴明けを行ない、公知の方法
による銅メッキにより導通試験用スルホール2を全格子
上に作成する。その後公知の方法により内層ライン1を
作成9次の工程で内層コアの導通試験を実施する。導通
試験実施後は公知の方法により積層接着される。積層接
着後は公知の方法により貫通スルホール用穴10が穴明
される。この時、導通試験用スルホール用穴2は貫通ス
ルホール10より穴径を小さくしている為に貫通スルホ
ール用穴20穴明時に除去される。貫通スルホール穴明
後は公知の方法により、多層の内層回路を有するプリン
ト板となる。FIG. 5 shows a conventional printed board manufacturing method, and FIG. 6 shows a printed board manufacturing method of the present invention. In FIG. 6, holes are made in the inner layer core base material 7 with the inner layer core material copper foil 6 pasted on both sides by a known method, and through holes 2 for continuity testing are created on the entire grid by copper plating by a known method. . Thereafter, the inner layer line 1 is created by a known method, and in the next step, a continuity test of the inner layer core is performed. After conducting the continuity test, the layers are laminated and bonded using a known method. After lamination and adhesion, holes 10 for through-holes are bored by a known method. At this time, since the through-hole hole 2 for continuity testing has a smaller diameter than the through-hole 10, it is removed when the through-hole hole 20 is drilled. After drilling the through holes, a printed board having multilayer inner layer circuits is obtained by a known method.
実施例により導通試験を行なう場合と従来の製造方法に
よる導通試験の違いを第5図、第4、図を用いて説明す
る。The difference between the continuity test performed in the embodiment and the continuity test performed by the conventional manufacturing method will be explained with reference to FIGS. 5 and 4.
第3図が従来の内層コア導通試験を示したものであるが
(α)の方向より実例した場合■@の導通試験機検査用
ピン50つながりは検出できるが0θのつながりは検出
不可能である為、(b)のように裏面より導通試験が必
要となる。これは完成されたプリント板においては、貫
通スルホールで■よりθまで接続された状態になるため
である。本発明のプリント板製造方法では、第4図の示
すように内層コア拐の導通試験においては、導通試験用
スルホール2’ll’介して■@θのつながりは一度で
検出可能となる。Figure 3 shows the conventional inner layer core continuity test, but when viewed from the direction of (α), the continuity tester test pin 50 connection at @ can be detected, but the connection at 0θ cannot be detected. Therefore, a continuity test is required from the back side as shown in (b). This is because in the completed printed board, the connection will be made from ■ to θ through the through-hole. In the printed board manufacturing method of the present invention, as shown in FIG. 4, in the continuity test of the inner layer core, the connection of ■@θ can be detected at once through the continuity test through hole 2'll'.
本発明によれば次のような効果が得られる。 According to the present invention, the following effects can be obtained.
1、 全格子上に設けられた導通試験用スルホールによ
り内層コアのいがなる格子上に有る回。1. The through-holes for continuity testing provided on all the grids make it possible for the inner layer core to pass through the grid.
路についても一度の導通試験で機能試験が可能となるた
め導通試験工数を低減できる。It is also possible to perform a functional test on circuits with a single continuity test, reducing the number of man-hours required for continuity testing.
2、従来の導通試験では導通ピンが先端の1点で接触し
ていたが、本発明によれば、導通ピンの接触面が導通試
験用スルホールの円周上となり導通試験の検査精度が向
上する。2. In conventional continuity tests, the continuity pin contacts at one point at the tip, but according to the present invention, the contact surface of the continuity pin is on the circumference of the continuity test through hole, improving the accuracy of continuity tests. .
第1図は従来の内層コア材の平面図、第2図は本発明の
一実施例の内層コア材の平面図、第3図は従来の内層コ
ア材導通試馳の説明図、第4図は本発明による導通試験
方法の説明図、第。
5図は従来のプリント板製造を示す説明図、第6図は本
発明によるプリント板製造方法の一実。
施例を示す説明図である。
1:内層ライン、2:内層導通試験用スルホール、6:
内層パッド、4:内層コア材、5:導通試験機検査用ピ
ン、6:内層コア材銅箔、7:内層コア基材、8ニブリ
プレグ、9:外層コア基材、10:貫通スルホール用穴
。
第1図 第2図
第5図 第牛何
第5図
第 Δ 図FIG. 1 is a plan view of a conventional inner core material, FIG. 2 is a plan view of an inner core material according to an embodiment of the present invention, FIG. 3 is an explanatory diagram of a conventional inner core material conduction test, and FIG. 4 is an explanatory diagram of the continuity test method according to the present invention, No. FIG. 5 is an explanatory diagram showing conventional printed board manufacturing, and FIG. 6 is an example of the printed board manufacturing method according to the present invention. It is an explanatory view showing an example. 1: Inner layer line, 2: Through hole for inner layer continuity test, 6:
Inner layer pad, 4: Inner layer core material, 5: Continuity tester inspection pin, 6: Inner layer core material copper foil, 7: Inner layer core base material, 8 Niblipreg, 9: Outer layer core base material, 10: Hole for through hole. Figure 1 Figure 2 Figure 5 Figure 5 Figure Δ Figure
Claims (1)
おいて、前記内層回路を導通試験を行なうにあたり、片
面の導通試験を行なうことにより両面の導通試験が行な
うことのできる、スルホールとパッドを全格子上に有し
たことと、前記スルホールは、多層の内層回路を積層し
た後に形成される貫通スルホールより小さいスルホール
であることを特徴とするプリント板の製造方法。1. In a method for manufacturing a printed circuit board having a multilayer inner layer circuit, when conducting a continuity test on the inner layer circuit, through-holes and pads are placed on the entire grid so that a continuity test on both sides can be performed by conducting a continuity test on one side. A method for manufacturing a printed board, characterized in that the through hole is smaller than a through hole formed after laminating multilayer inner layer circuits.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP21614583A JPS60109297A (en) | 1983-11-18 | 1983-11-18 | Method of producing printed board |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP21614583A JPS60109297A (en) | 1983-11-18 | 1983-11-18 | Method of producing printed board |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60109297A true JPS60109297A (en) | 1985-06-14 |
JPH0580837B2 JPH0580837B2 (en) | 1993-11-10 |
Family
ID=16683977
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP21614583A Granted JPS60109297A (en) | 1983-11-18 | 1983-11-18 | Method of producing printed board |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60109297A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6249276U (en) * | 1985-09-13 | 1987-03-26 | ||
JPH03219694A (en) * | 1990-01-24 | 1991-09-27 | Nec Corp | Multilayer wiring board and its inspection method |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000151081A (en) * | 1998-11-12 | 2000-05-30 | Nec Ibaraki Ltd | Discontinued wiring repairing method for wiring board |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5445364U (en) * | 1977-09-06 | 1979-03-29 | ||
JPS5524447A (en) * | 1978-08-09 | 1980-02-21 | Fujitsu Ltd | Method of testing ceramic circuit board |
-
1983
- 1983-11-18 JP JP21614583A patent/JPS60109297A/en active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5445364U (en) * | 1977-09-06 | 1979-03-29 | ||
JPS5524447A (en) * | 1978-08-09 | 1980-02-21 | Fujitsu Ltd | Method of testing ceramic circuit board |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6249276U (en) * | 1985-09-13 | 1987-03-26 | ||
JPH03219694A (en) * | 1990-01-24 | 1991-09-27 | Nec Corp | Multilayer wiring board and its inspection method |
Also Published As
Publication number | Publication date |
---|---|
JPH0580837B2 (en) | 1993-11-10 |
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