JPS6010156A - Through-hole inspecting apparatus - Google Patents
Through-hole inspecting apparatusInfo
- Publication number
- JPS6010156A JPS6010156A JP11908883A JP11908883A JPS6010156A JP S6010156 A JPS6010156 A JP S6010156A JP 11908883 A JP11908883 A JP 11908883A JP 11908883 A JP11908883 A JP 11908883A JP S6010156 A JPS6010156 A JP S6010156A
- Authority
- JP
- Japan
- Prior art keywords
- mask
- transparent sheet
- printed circuit
- printed board
- thin transparent
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N21/95692—Patterns showing hole parts, e.g. honeycomb filtering structures
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Description
【発明の詳細な説明】
（１） 発明の技術分野
本発明は、プリント板のスルーホール検査装置に係り、
特に高速で検査が行なえるスルーホール検査装置に関す
る。DETAILED DESCRIPTION OF THE INVENTION (1) Technical field of the invention The present invention relates to a through-hole inspection device for printed circuit boards.
In particular, the present invention relates to a through-hole inspection device that can perform inspections at high speed.
（２） 技術の背景
近年、電子技術の発達に伴い、電子回路の素子を実装す
る為のプリント板の技術も進歩し、多層基板となり、而
も多数のスルーホールが設けられる様になった。このス
ルーホールには導電性のメッキが施されているが必ずし
も良好な状態とならない場合が有り、ピンホール等の欠
陥を生ずる場合がある。この欠陥はプリント板の信頼性
を低下せしめる事になるので予め検査する必要があった
。(2) Background of the technology In recent years, with the development of electronic technology, the technology of printed circuit boards for mounting electronic circuit elements has also advanced, resulting in multilayer boards with many through holes. Although this through hole is plated with conductive material, it may not always be in a good condition, and defects such as pinholes may occur. Since this defect would reduce the reliability of the printed board, it was necessary to inspect it in advance.
而も、多数のプリント板を高速で、而も精度良く検査が
行なえるスルーホール検査装置が要望されている。Furthermore, there is a need for a through-hole inspection device that can inspect a large number of printed boards at high speed and with high precision.
（３） 従来技術と問題点
ＩＣ技術の進歩に伴い多層プリント板のスルーホールを
正確に迅速に検査する為に従来はプリント板と検査対象
のスルーホールを覆うマスクの間を僅かに離し、プリン
ト板或いはマスクを高速で移動させて、検査が行なわれ
ていた。(3) Conventional technology and problems With the advancement of IC technology, in order to accurately and quickly inspect through-holes in multilayer printed boards, conventionally the printed board and the mask covering the through-holes to be inspected were placed slightly apart, and the printed Inspections were performed by moving plates or masks at high speed.
然し乍ら前記の方法はプリント板とマスクの間隙を常に
一定とする為に機械的な高精度を要求する欠点を有し、
而も一定とならない問題を有していた。更にプリント板
とマスクとの間隙を小さくするとマスクがプリント板に
設けられているランドに引ワ掛りスムーズに検査が行な
えない問題を有していた。However, the above method has the disadvantage of requiring high mechanical precision in order to maintain a constant gap between the printed board and the mask.
However, there were problems that were not constant. Furthermore, if the gap between the printed board and the mask is made small, there is a problem in that the mask gets caught on the lands provided on the printed board, making it difficult to perform inspections smoothly.
（４） 発明の目的
本発明は上記従来の欠点に鑑み、プリント板とマスクの
間に薄い透明のシートを設ける事で、該プリント板のス
ルーポールをマスクを高速移動させることで検査できる
スルフホール検査装置を提供する事を目的とするもので
ある。(4) Purpose of the Invention In view of the above-mentioned conventional drawbacks, the present invention provides a through-hole inspection in which a thin transparent sheet is provided between a printed board and a mask, and the through-holes of the printed board can be inspected by moving the mask at high speed. The purpose is to provide equipment.
（５） 発明の構成
そして、この目的は本発明によればプリント板のマスク
で遮断されているスルーホールの欠陥から漏れた光を検
知するスルーホール検査装置ｔこ於いて、該プリント板
と該マスクの間に透明なシートを設りたことを特徴とす
るスルーホール検査装置を提供することにより達成され
る。(5) Structure of the Invention According to the present invention, the present invention provides a through-hole inspection device for detecting light leaking from a defect in a through-hole blocked by a mask on a printed board. This is achieved by providing a through-hole inspection device characterized by providing a transparent sheet between masks.
（６） 発明の実施例
以下１本発明の実施例を図面に基づいて詳細に説明する
。(6) Embodiments of the Invention Below, one embodiment of the present invention will be described in detail based on the drawings.
図は本発明の一実施例の断面図である。The figure is a sectional view of one embodiment of the present invention.
図に於いてスルーホール２と該スルーホールと一体とな
っているランド３が設けられているプリント板１の光を
照射する側全体に薄く透明なシート４例えばビニールシ
ートが接触している。前記薄く透明なシート４の前記プ
リント板１が接触している側と反対側にはマスク５が設
けられている。In the figure, a thin transparent sheet 4, such as a vinyl sheet, is in contact with the entire light-irradiated side of a printed board 1, which is provided with a through hole 2 and a land 3 integrated with the through hole. A mask 5 is provided on the opposite side of the thin transparent sheet 4 to the side in contact with the printed board 1.
そして前記マスク５と前記薄く透明なシート４には照明
部６から光７が照射されている。The mask 5 and the thin transparent sheet 4 are irradiated with light 7 from an illumination section 6.
図に於いて、プリント板１と薄く透明なシート４は接触
し、マスク５上を高速で移動する。この時、前記プリン
ト板ｌに設けられているランド３が前記薄く透明なシー
ト４に覆われるので前記マスク５が引掛かる事がない為
、前記プリント基板１ばスムーズに移動する。そして所
定の検査対象となっているスルーホールの位置にマスク
５が来るように前記プリント板１と薄く透明なシート４
を移動させる。その後、前記マスク５と周辺部に照明部
６から所定の光７が照射される。前記検査対象のスルー
ホールに欠陥があった場合、該欠陥からの漏れ光８を図
示しない光検知器で検出し。In the figure, a printed board 1 and a thin transparent sheet 4 are in contact with each other and are moved at high speed over a mask 5. At this time, since the land 3 provided on the printed board 1 is covered with the thin transparent sheet 4, the mask 5 will not be caught, and the printed board 1 will move smoothly. Then, the printed board 1 and the thin transparent sheet 4 are placed so that the mask 5 is located at the position of the through hole that is the predetermined inspection target.
move. Thereafter, the mask 5 and the surrounding area are irradiated with a predetermined light 7 from the illumination section 6. If there is a defect in the through hole to be inspected, leaked light 8 from the defect is detected by a photodetector (not shown).
前記スルーホールの検査を行う。前記スルーホールの検
査後１次の検査対象のスルーホールに前記マスク５が位
置する様に前記プリント板１と前記薄く透明なシート４
は前述同様に高速で移動する。The through-hole is inspected. After inspecting the through holes, the printed board 1 and the thin transparent sheet 4 are placed so that the mask 5 is located at the through hole to be inspected first.
moves at high speed as before.
以上の如く本発明はプリント板１とマスク５の間隙にプ
リン１−板１と一体で移動できる様に薄く透明なシート
４を設ける事で前記プリント板１とマスク５の間隙を機
械的に高精度で行なう必要もなく、容易で安価な装置で
ある。そしてプリント板 、■とマスク５０間隙は使用
する薄く透明なシート４の厚さまで小さくでき一定にで
きる。従ってスルーホール検査の際マスク５の回りから
スルーホールに光が漏れて欠陥光と間違えて検査する事
がなくなる。As described above, the present invention mechanically increases the gap between the printed board 1 and the mask 5 by providing the thin transparent sheet 4 in the gap between the printed board 1 and the mask 5 so that it can move together with the printed board 1 and the board 1. There is no need for precision, and the device is easy and inexpensive. The gap between the printed board and the mask 5 can be made as small as the thickness of the thin transparent sheet 4 used. Therefore, when inspecting through-holes, there is no possibility that light leaks from around the mask 5 into the through-holes and is mistaken for defective light.
（７） 発明の効果
以上、詳細に説明したように本発明のスルーホール検査
装置はプリント板とマスクの間隙に薄く透明なシートを
設ける事で、複雑で高精度な機構を必要とせず、該間隙
を小さく一定に保って行なえる勿Ｊ果大なるものである
。またスルーホールと一体となっているランドを前記薄
く透明なシートは覆う事になるのでマスクが引っ掛かる
事なくプリント板を高速で移動させる事ができる効果を
有する。(7) Effects of the Invention As explained in detail above, the through-hole inspection device of the present invention provides a thin transparent sheet in the gap between the printed board and the mask, thereby eliminating the need for a complicated and high-precision mechanism. Of course, it is a great advantage to be able to do this while keeping the gap small and constant. Furthermore, since the thin transparent sheet covers the land that is integrated with the through hole, the printed board can be moved at high speed without the mask getting caught.
図は本発明一実施例の概略的断面図である。
１・・・プリント板 ２・・・スルーホール３・・・ラ
ンド ４・・・シート
５・・・マスク ６・・・照明部
７・・・光 ８・・・漏れ光
特許出願人 富士通株式会社The figure is a schematic cross-sectional view of one embodiment of the present invention. 1... Printed board 2... Through hole 3... Land 4... Sheet 5... Mask 6... Lighting part 7... Light 8... Light leakage patent applicant Fujitsu Limited
Claims (1)
ールの欠陥から漏れた光を検知するスルーホール検査装
置に於いて、該プリント板と該マスクの間に透明なシー
トを設けたことを特徴とするスルーホール検査装置。(1) A through hole inspection device that detects light leaking from a defect in a through ball that is blocked by a mask on a printed board, characterized in that a transparent sheet is provided between the printed board and the mask. Through-hole inspection equipment.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11908883A JPS6010156A (en) | 1983-06-30 | 1983-06-30 | Through-hole inspecting apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11908883A JPS6010156A (en) | 1983-06-30 | 1983-06-30 | Through-hole inspecting apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6010156A true JPS6010156A (en) | 1985-01-19 |
Family
ID=14752591
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11908883A Pending JPS6010156A (en) | 1983-06-30 | 1983-06-30 | Through-hole inspecting apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6010156A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62162089A (en) * | 1986-01-09 | 1987-07-17 | 大成建設株式会社 | Tension material |
-
1983
- 1983-06-30 JP JP11908883A patent/JPS6010156A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62162089A (en) * | 1986-01-09 | 1987-07-17 | 大成建設株式会社 | Tension material |
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