JPS60100448A - 光応答信号利用走査像形成装置 - Google Patents

光応答信号利用走査像形成装置

Info

Publication number
JPS60100448A
JPS60100448A JP59208259A JP20825984A JPS60100448A JP S60100448 A JPS60100448 A JP S60100448A JP 59208259 A JP59208259 A JP 59208259A JP 20825984 A JP20825984 A JP 20825984A JP S60100448 A JPS60100448 A JP S60100448A
Authority
JP
Japan
Prior art keywords
signal
photovoltage
sample
image
light beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59208259A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6412093B2 (enrdf_load_stackoverflow
Inventor
Tadasuke Munakata
忠輔 棟方
Hideki Kono
秀樹 河野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP59208259A priority Critical patent/JPS60100448A/ja
Publication of JPS60100448A publication Critical patent/JPS60100448A/ja
Publication of JPS6412093B2 publication Critical patent/JPS6412093B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Light Receiving Elements (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP59208259A 1984-10-05 1984-10-05 光応答信号利用走査像形成装置 Granted JPS60100448A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59208259A JPS60100448A (ja) 1984-10-05 1984-10-05 光応答信号利用走査像形成装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59208259A JPS60100448A (ja) 1984-10-05 1984-10-05 光応答信号利用走査像形成装置

Publications (2)

Publication Number Publication Date
JPS60100448A true JPS60100448A (ja) 1985-06-04
JPS6412093B2 JPS6412093B2 (enrdf_load_stackoverflow) 1989-02-28

Family

ID=16553273

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59208259A Granted JPS60100448A (ja) 1984-10-05 1984-10-05 光応答信号利用走査像形成装置

Country Status (1)

Country Link
JP (1) JPS60100448A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07278924A (ja) * 1994-04-12 1995-10-24 Dia Gomme Kk 作業用手袋及びその製造方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07278924A (ja) * 1994-04-12 1995-10-24 Dia Gomme Kk 作業用手袋及びその製造方法

Also Published As

Publication number Publication date
JPS6412093B2 (enrdf_load_stackoverflow) 1989-02-28

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