JPS5996720A - 薄膜半導体の製造方法 - Google Patents
薄膜半導体の製造方法Info
- Publication number
- JPS5996720A JPS5996720A JP57207378A JP20737882A JPS5996720A JP S5996720 A JPS5996720 A JP S5996720A JP 57207378 A JP57207378 A JP 57207378A JP 20737882 A JP20737882 A JP 20737882A JP S5996720 A JPS5996720 A JP S5996720A
- Authority
- JP
- Japan
- Prior art keywords
- silicon
- gas
- hydrogen
- torr
- electron
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000010409 thin film Substances 0.000 title claims abstract description 10
- 238000004519 manufacturing process Methods 0.000 title claims description 10
- 239000004065 semiconductor Substances 0.000 title claims description 6
- 239000000758 substrate Substances 0.000 claims abstract description 33
- 239000007789 gas Substances 0.000 claims abstract description 31
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 claims abstract description 30
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims abstract description 21
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 20
- 239000010703 silicon Substances 0.000 claims abstract description 19
- 238000000034 method Methods 0.000 claims abstract description 18
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 17
- 238000010894 electron beam technology Methods 0.000 claims abstract description 8
- 239000002245 particle Substances 0.000 claims abstract description 7
- 150000002500 ions Chemical class 0.000 claims description 11
- -1 silicon ions Chemical class 0.000 claims description 4
- 238000001704 evaporation Methods 0.000 claims description 3
- 239000000203 mixture Substances 0.000 claims description 3
- 230000005685 electric field effect Effects 0.000 claims description 2
- 238000010438 heat treatment Methods 0.000 claims description 2
- 229910052739 hydrogen Inorganic materials 0.000 abstract description 21
- 239000001257 hydrogen Substances 0.000 abstract description 20
- 239000010408 film Substances 0.000 abstract description 19
- 229910021529 ammonia Inorganic materials 0.000 abstract description 12
- 229910021417 amorphous silicon Inorganic materials 0.000 abstract description 12
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 abstract description 8
- 238000005566 electron beam evaporation Methods 0.000 abstract description 4
- 229910052757 nitrogen Inorganic materials 0.000 abstract description 4
- 230000009257 reactivity Effects 0.000 abstract description 4
- 150000002431 hydrogen Chemical class 0.000 abstract description 2
- 238000010494 dissociation reaction Methods 0.000 abstract 1
- 230000005593 dissociations Effects 0.000 abstract 1
- 108091008695 photoreceptors Proteins 0.000 description 5
- 125000004429 atom Chemical group 0.000 description 4
- 230000005684 electric field Effects 0.000 description 4
- 230000001133 acceleration Effects 0.000 description 2
- 230000004913 activation Effects 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000002784 hot electron Substances 0.000 description 2
- 230000001678 irradiating effect Effects 0.000 description 2
- 239000012528 membrane Substances 0.000 description 2
- 239000003921 oil Substances 0.000 description 2
- 206010010071 Coma Diseases 0.000 description 1
- 240000002989 Euphorbia neriifolia Species 0.000 description 1
- 206010033799 Paralysis Diseases 0.000 description 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 229910000069 nitrogen hydride Inorganic materials 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000010025 steaming Methods 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 239000011593 sulfur Substances 0.000 description 1
- 229910052845 zircon Inorganic materials 0.000 description 1
- GFQYVLUOOAAOGM-UHFFFAOYSA-N zirconium(iv) silicate Chemical compound [Zr+4].[O-][Si]([O-])([O-])[O-] GFQYVLUOOAAOGM-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02532—Silicon, silicon germanium, germanium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
- Light Receiving Elements (AREA)
- Photoreceptors In Electrophotography (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57207378A JPS5996720A (ja) | 1982-11-25 | 1982-11-25 | 薄膜半導体の製造方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57207378A JPS5996720A (ja) | 1982-11-25 | 1982-11-25 | 薄膜半導体の製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5996720A true JPS5996720A (ja) | 1984-06-04 |
JPH0113213B2 JPH0113213B2 (enrdf_load_stackoverflow) | 1989-03-03 |
Family
ID=16538731
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57207378A Granted JPS5996720A (ja) | 1982-11-25 | 1982-11-25 | 薄膜半導体の製造方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5996720A (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5436035A (en) * | 1991-12-05 | 1995-07-25 | Alusuisse-Lonza Services Ltd. | Coating a substrate surface with a permeation barrier |
-
1982
- 1982-11-25 JP JP57207378A patent/JPS5996720A/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5436035A (en) * | 1991-12-05 | 1995-07-25 | Alusuisse-Lonza Services Ltd. | Coating a substrate surface with a permeation barrier |
Also Published As
Publication number | Publication date |
---|---|
JPH0113213B2 (enrdf_load_stackoverflow) | 1989-03-03 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4959242A (en) | Method for forming a thin film | |
Lipp et al. | A comparison of focused ion beam and electron beam induced deposition processes | |
WO2007087212A1 (en) | Methods of implanting ions and ion sources used for same | |
JPS5996720A (ja) | 薄膜半導体の製造方法 | |
JPS62222076A (ja) | 無定形ケイ素膜用の改良された装置 | |
Toyoda et al. | Advancement of gas cluster ion beam processes for chemically enhanced surface modification and etching | |
CN104395496A (zh) | 沉积装置和沉积方法 | |
JPH0131289B2 (enrdf_load_stackoverflow) | ||
JPS5996718A (ja) | 薄膜半導体の製造方法 | |
JP3295133B2 (ja) | 非晶質半導体の製造方法 | |
JPS6028225A (ja) | 光気相成長法 | |
JPH04285154A (ja) | 炭素薄膜の作成方法 | |
Gleeson et al. | Negative ion formation in the scattering of CF 3+ from graphite | |
KR900008155B1 (ko) | 박막형성방법 및 그 장치 | |
JP2951564B2 (ja) | 薄膜形成方法 | |
JPH10112426A (ja) | 中性アルゴンビームを用いた基体表面処理方法 | |
JP2001176870A (ja) | 窒化膜形成方法 | |
TWI412624B (zh) | 薄膜沉積裝置及其用以製備薄膜之方法 | |
Huang et al. | Control of Ion Species and Energy in High-Flux Helicon-Wave-Excited Plasma Using Ar/N 2 Gas Mixtures | |
Takaoka et al. | Development of liquid polyatomic ion beam system for surface modification | |
JPH09237762A (ja) | シリコン薄膜の製造方法 | |
JP2000303174A (ja) | 炭化ケイ素膜の形成方法 | |
JP2672185B2 (ja) | 薄膜素子加工方法とその装置 | |
JPH0864543A (ja) | 非晶質半導体薄膜の形成方法 | |
JPS59145044A (ja) | 蒸着方法 |