JPH0113213B2 - - Google Patents
Info
- Publication number
- JPH0113213B2 JPH0113213B2 JP57207378A JP20737882A JPH0113213B2 JP H0113213 B2 JPH0113213 B2 JP H0113213B2 JP 57207378 A JP57207378 A JP 57207378A JP 20737882 A JP20737882 A JP 20737882A JP H0113213 B2 JPH0113213 B2 JP H0113213B2
- Authority
- JP
- Japan
- Prior art keywords
- gas
- silicon
- thin film
- hydrogen
- torr
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000000758 substrate Substances 0.000 claims description 31
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 claims description 26
- 239000007789 gas Substances 0.000 claims description 24
- 229910052739 hydrogen Inorganic materials 0.000 claims description 20
- 229910052710 silicon Inorganic materials 0.000 claims description 20
- 238000000034 method Methods 0.000 claims description 18
- 239000010703 silicon Substances 0.000 claims description 18
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 17
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 17
- 239000001257 hydrogen Substances 0.000 claims description 17
- 239000010409 thin film Substances 0.000 claims description 13
- 229910021417 amorphous silicon Inorganic materials 0.000 claims description 12
- 229910021529 ammonia Inorganic materials 0.000 claims description 11
- 238000004519 manufacturing process Methods 0.000 claims description 8
- 239000004065 semiconductor Substances 0.000 claims description 8
- 238000010894 electron beam technology Methods 0.000 claims description 7
- -1 silicon ions Chemical class 0.000 claims description 6
- 230000004913 activation Effects 0.000 claims description 3
- 238000001704 evaporation Methods 0.000 claims description 3
- 238000010438 heat treatment Methods 0.000 claims description 3
- 239000000203 mixture Substances 0.000 claims 1
- 239000010408 film Substances 0.000 description 18
- 150000002500 ions Chemical class 0.000 description 8
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 6
- 239000002245 particle Substances 0.000 description 5
- 108091008695 photoreceptors Proteins 0.000 description 5
- 125000004429 atom Chemical group 0.000 description 4
- 230000005684 electric field Effects 0.000 description 4
- 238000005566 electron beam evaporation Methods 0.000 description 4
- 150000002431 hydrogen Chemical class 0.000 description 3
- 229910052757 nitrogen Inorganic materials 0.000 description 3
- 230000009257 reactivity Effects 0.000 description 3
- 230000001133 acceleration Effects 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 238000007733 ion plating Methods 0.000 description 2
- 230000001678 irradiating effect Effects 0.000 description 2
- 230000007935 neutral effect Effects 0.000 description 2
- 239000003921 oil Substances 0.000 description 2
- 238000002441 X-ray diffraction Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 229910021419 crystalline silicon Inorganic materials 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005685 electric field effect Effects 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02532—Silicon, silicon germanium, germanium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
- Light Receiving Elements (AREA)
- Photoreceptors In Electrophotography (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57207378A JPS5996720A (ja) | 1982-11-25 | 1982-11-25 | 薄膜半導体の製造方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57207378A JPS5996720A (ja) | 1982-11-25 | 1982-11-25 | 薄膜半導体の製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5996720A JPS5996720A (ja) | 1984-06-04 |
JPH0113213B2 true JPH0113213B2 (enrdf_load_stackoverflow) | 1989-03-03 |
Family
ID=16538731
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57207378A Granted JPS5996720A (ja) | 1982-11-25 | 1982-11-25 | 薄膜半導体の製造方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5996720A (enrdf_load_stackoverflow) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CH683776A5 (de) * | 1991-12-05 | 1994-05-13 | Alusuisse Lonza Services Ag | Beschichten einer Substratfläche mit einer Permeationssperre. |
-
1982
- 1982-11-25 JP JP57207378A patent/JPS5996720A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5996720A (ja) | 1984-06-04 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP0280315B1 (en) | Method of forming a diamond film | |
US4676194A (en) | Apparatus for thin film formation | |
US4376688A (en) | Method for producing semiconductor films | |
US4416755A (en) | Apparatus and method for producing semiconducting films | |
US5039376A (en) | Method and apparatus for the plasma etching, substrate cleaning, or deposition of materials by D.C. glow discharge | |
JPH0259862B2 (enrdf_load_stackoverflow) | ||
JPS62222076A (ja) | 無定形ケイ素膜用の改良された装置 | |
EP0029747A1 (en) | An apparatus for vacuum deposition and a method for forming a thin film by the use thereof | |
JPH0113213B2 (enrdf_load_stackoverflow) | ||
JP2689419B2 (ja) | イオンドーピング装置 | |
JPS6134173A (ja) | 高硬度窒化ホウ素膜の製造方法 | |
JPH04285154A (ja) | 炭素薄膜の作成方法 | |
JPH0131289B2 (enrdf_load_stackoverflow) | ||
JPS639743B2 (enrdf_load_stackoverflow) | ||
JP3007579B2 (ja) | シリコン薄膜の製造方法 | |
KR900008155B1 (ko) | 박막형성방법 및 그 장치 | |
JPH0377870B2 (enrdf_load_stackoverflow) | ||
JPS5996718A (ja) | 薄膜半導体の製造方法 | |
EP0809721B1 (en) | Method and apparatus for producing single crystal carbon films | |
JP3102540B2 (ja) | 低水素量非晶質シリコン半導体薄膜の形成方法 | |
JP2000303174A (ja) | 炭化ケイ素膜の形成方法 | |
JPH0524992B2 (enrdf_load_stackoverflow) | ||
JPS60181262A (ja) | 高硬度窒化ホウ素膜の製造方法 | |
JP2834475B2 (ja) | 半導体薄膜の形成装置 | |
JPH0610338B2 (ja) | ホウ素薄膜の形成方法 |