JPS59946B2 - 質量分析計 - Google Patents

質量分析計

Info

Publication number
JPS59946B2
JPS59946B2 JP51160888A JP16088876A JPS59946B2 JP S59946 B2 JPS59946 B2 JP S59946B2 JP 51160888 A JP51160888 A JP 51160888A JP 16088876 A JP16088876 A JP 16088876A JP S59946 B2 JPS59946 B2 JP S59946B2
Authority
JP
Japan
Prior art keywords
ions
positive
negative
mass
ion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP51160888A
Other languages
English (en)
Japanese (ja)
Other versions
JPS52119290A (en
Inventor
ドナルド・エフ・ハント
ジヨ−ジ・シ−・スタフオ−ド・ジユニア
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Virginia UVA
Original Assignee
University of Virginia UVA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of Virginia UVA filed Critical University of Virginia UVA
Publication of JPS52119290A publication Critical patent/JPS52119290A/ja
Publication of JPS59946B2 publication Critical patent/JPS59946B2/ja
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
    • H01J49/4215—Quadrupole mass filters
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0095—Particular arrangements for generating, introducing or analyzing both positive and negative analyte ions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/025—Detectors specially adapted to particle spectrometers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP51160888A 1976-01-20 1976-12-30 質量分析計 Expired JPS59946B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US000000650783 1976-01-20
US05/650,783 US4066894A (en) 1976-01-20 1976-01-20 Positive and negative ion recording system for mass spectrometer

Publications (2)

Publication Number Publication Date
JPS52119290A JPS52119290A (en) 1977-10-06
JPS59946B2 true JPS59946B2 (ja) 1984-01-09

Family

ID=24610271

Family Applications (1)

Application Number Title Priority Date Filing Date
JP51160888A Expired JPS59946B2 (ja) 1976-01-20 1976-12-30 質量分析計

Country Status (10)

Country Link
US (1) US4066894A (en, 2012)
JP (1) JPS59946B2 (en, 2012)
AU (1) AU502854B2 (en, 2012)
BE (1) BE849983A (en, 2012)
CH (1) CH617869A5 (en, 2012)
DE (1) DE2701606A1 (en, 2012)
FR (1) FR2339249A1 (en, 2012)
GB (1) GB1567490A (en, 2012)
NL (1) NL7700502A (en, 2012)
SE (1) SE414094B (en, 2012)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA1076714A (en) * 1976-01-20 1980-04-29 Donald F. Hunt Positive and negative ion recording system for mass spectrometer
USRE33344E (en) * 1977-04-22 1990-09-18 Finnigan Corporation Apparatus and method for detecting negative ions
US4423324A (en) * 1977-04-22 1983-12-27 Finnigan Corporation Apparatus for detecting negative ions
DE2737199A1 (de) * 1977-08-18 1979-02-22 Varian Mat Gmbh Verfahren und vorrichtung zur exakten bestimmung der masse einer substanz
US4377745A (en) * 1978-12-01 1983-03-22 Cherng Chang Mass spectrometer for chemical ionization, electron impact ionization and mass spectrometry/mass spectrometry operation
JPS61296650A (ja) * 1985-06-25 1986-12-27 Anelva Corp 四重極型質量分析計電源
US4766312A (en) * 1987-05-15 1988-08-23 Vestec Corporation Methods and apparatus for detecting negative ions from a mass spectrometer
FR2657724A1 (fr) * 1990-01-26 1991-08-02 Nermag Ste Nouvelle Source ionique pour spectrometre de masse quadripolaire.
JPH05251039A (ja) * 1992-03-04 1993-09-28 Ebara Corp 二次イオン質量分析計
GB9604655D0 (en) * 1996-03-05 1996-05-01 Fisons Plc Mass spectrometer and detector apparatus therefor
US6153880A (en) * 1999-09-30 2000-11-28 Agilent Technologies, Inc. Method and apparatus for performance improvement of mass spectrometers using dynamic ion optics
GB0511386D0 (en) * 2005-06-03 2005-07-13 Shimadzu Res Lab Europe Ltd Method for introducing ions into an ion trap and an ion storage apparatus
US7855361B2 (en) * 2008-05-30 2010-12-21 Varian, Inc. Detection of positive and negative ions
US9905407B2 (en) 2014-10-02 2018-02-27 908 Devices Inc. Mass spectrometry by detecting positively and negatively charged particles
US9564290B2 (en) * 2014-11-18 2017-02-07 Hamilton Sundstrand Corporation Micro machined two dimensional faraday collector grid
US9728386B1 (en) 2014-12-08 2017-08-08 Flir Detection, Inc. Mass analysis instruments and methods
JP7621900B2 (ja) 2021-07-01 2025-01-27 浜松ホトニクス株式会社 イオン検出器
US20230105334A1 (en) * 2021-10-06 2023-04-06 Thermo Finnigan Llc High-speed polarity switching dual conversion dynode ion detector for mass spectrometer

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT528250A (en, 2012) * 1953-12-24
US2816243A (en) * 1956-04-09 1957-12-10 High Voltage Engineering Corp Negative ion source
NL263539A (en, 2012) * 1960-04-14
DE1298738B (de) * 1963-05-02 1969-07-03 Siemens Ag Massenfilter mit erhoehter Trennschaerfe und Empfindlichkeit
US3555272A (en) * 1968-03-14 1971-01-12 Exxon Research Engineering Co Process for chemical ionization for intended use in mass spectrometry and the like
GB1252569A (en, 2012) * 1968-12-17 1971-11-10
US3641340A (en) * 1969-09-22 1972-02-08 Gen Electric Multichannel readout mass spectrometer
US3629573A (en) * 1970-08-20 1971-12-21 Bendix Corp Monopole/quadrupole mass spectrometer
US3767914A (en) * 1971-05-17 1973-10-23 Bendix Corp Continuous injection mass spectrometer
CA973282A (en) * 1973-07-20 1975-08-19 Peter H. Dawson High-resolution focussing dipole mass spectrometer
DE2445711A1 (de) * 1973-10-03 1975-04-10 Hewlett Packard Co Ionen/elektronen-umwandler
JPS51141688A (en) * 1975-06-02 1976-12-06 Hitachi Ltd Mass spectrometer

Also Published As

Publication number Publication date
FR2339249A1 (fr) 1977-08-19
AU502854B2 (en) 1979-08-09
CH617869A5 (en, 2012) 1980-06-30
DE2701606A1 (de) 1977-07-21
NL7700502A (nl) 1977-07-22
FR2339249B1 (en, 2012) 1982-01-22
SE414094B (sv) 1980-07-07
JPS52119290A (en) 1977-10-06
DE2701606C2 (en, 2012) 1988-03-03
US4066894A (en) 1978-01-03
AU2148077A (en) 1978-07-27
BE849983A (fr) 1977-04-15
GB1567490A (en) 1980-05-14
SE7700438L (sv) 1977-07-21

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