SE414094B - Forfarande och apparat for generering och detektering av positiva och negativa joner nermelsevis samtidigt - Google Patents
Forfarande och apparat for generering och detektering av positiva och negativa joner nermelsevis samtidigtInfo
- Publication number
- SE414094B SE414094B SE7700438A SE7700438A SE414094B SE 414094 B SE414094 B SE 414094B SE 7700438 A SE7700438 A SE 7700438A SE 7700438 A SE7700438 A SE 7700438A SE 414094 B SE414094 B SE 414094B
- Authority
- SE
- Sweden
- Prior art keywords
- procedure
- positive
- generation
- detection
- same time
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
- H01J49/4215—Quadrupole mass filters
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0095—Particular arrangements for generating, introducing or analyzing both positive and negative analyte ions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/025—Detectors specially adapted to particle spectrometers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US05/650,783 US4066894A (en) | 1976-01-20 | 1976-01-20 | Positive and negative ion recording system for mass spectrometer |
Publications (2)
Publication Number | Publication Date |
---|---|
SE7700438L SE7700438L (sv) | 1977-07-21 |
SE414094B true SE414094B (sv) | 1980-07-07 |
Family
ID=24610271
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE7700438A SE414094B (sv) | 1976-01-20 | 1977-01-17 | Forfarande och apparat for generering och detektering av positiva och negativa joner nermelsevis samtidigt |
Country Status (10)
Country | Link |
---|---|
US (1) | US4066894A (sv) |
JP (1) | JPS59946B2 (sv) |
AU (1) | AU502854B2 (sv) |
BE (1) | BE849983A (sv) |
CH (1) | CH617869A5 (sv) |
DE (1) | DE2701606A1 (sv) |
FR (1) | FR2339249A1 (sv) |
GB (1) | GB1567490A (sv) |
NL (1) | NL7700502A (sv) |
SE (1) | SE414094B (sv) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA1076714A (en) * | 1976-01-20 | 1980-04-29 | Donald F. Hunt | Positive and negative ion recording system for mass spectrometer |
US4423324A (en) * | 1977-04-22 | 1983-12-27 | Finnigan Corporation | Apparatus for detecting negative ions |
USRE33344E (en) * | 1977-04-22 | 1990-09-18 | Finnigan Corporation | Apparatus and method for detecting negative ions |
DE2737199A1 (de) * | 1977-08-18 | 1979-02-22 | Varian Mat Gmbh | Verfahren und vorrichtung zur exakten bestimmung der masse einer substanz |
US4377745A (en) * | 1978-12-01 | 1983-03-22 | Cherng Chang | Mass spectrometer for chemical ionization, electron impact ionization and mass spectrometry/mass spectrometry operation |
JPS61296650A (ja) * | 1985-06-25 | 1986-12-27 | Anelva Corp | 四重極型質量分析計電源 |
US4766312A (en) * | 1987-05-15 | 1988-08-23 | Vestec Corporation | Methods and apparatus for detecting negative ions from a mass spectrometer |
FR2657724A1 (fr) * | 1990-01-26 | 1991-08-02 | Nermag Ste Nouvelle | Source ionique pour spectrometre de masse quadripolaire. |
JPH05251039A (ja) * | 1992-03-04 | 1993-09-28 | Ebara Corp | 二次イオン質量分析計 |
GB9604655D0 (en) * | 1996-03-05 | 1996-05-01 | Fisons Plc | Mass spectrometer and detector apparatus therefor |
US6153880A (en) * | 1999-09-30 | 2000-11-28 | Agilent Technologies, Inc. | Method and apparatus for performance improvement of mass spectrometers using dynamic ion optics |
GB0511386D0 (en) * | 2005-06-03 | 2005-07-13 | Shimadzu Res Lab Europe Ltd | Method for introducing ions into an ion trap and an ion storage apparatus |
US7855361B2 (en) * | 2008-05-30 | 2010-12-21 | Varian, Inc. | Detection of positive and negative ions |
US9905407B2 (en) | 2014-10-02 | 2018-02-27 | 908 Devices Inc. | Mass spectrometry by detecting positively and negatively charged particles |
US9564290B2 (en) * | 2014-11-18 | 2017-02-07 | Hamilton Sundstrand Corporation | Micro machined two dimensional faraday collector grid |
US9728386B1 (en) | 2014-12-08 | 2017-08-08 | Flir Detection, Inc. | Mass analysis instruments and methods |
JP2023007108A (ja) | 2021-07-01 | 2023-01-18 | 浜松ホトニクス株式会社 | イオン検出器 |
CN115938907A (zh) * | 2021-10-06 | 2023-04-07 | 萨默费尼根有限公司 | 用于质谱仪的高速极性切换双转换倍增极离子检测器 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
IT528250A (sv) * | 1953-12-24 | |||
US2816243A (en) * | 1956-04-09 | 1957-12-10 | High Voltage Engineering Corp | Negative ion source |
NL122125C (sv) * | 1960-04-14 | |||
DE1298738B (de) * | 1963-05-02 | 1969-07-03 | Siemens Ag | Massenfilter mit erhoehter Trennschaerfe und Empfindlichkeit |
US3555272A (en) * | 1968-03-14 | 1971-01-12 | Exxon Research Engineering Co | Process for chemical ionization for intended use in mass spectrometry and the like |
GB1252569A (sv) * | 1968-12-17 | 1971-11-10 | ||
US3641340A (en) * | 1969-09-22 | 1972-02-08 | Gen Electric | Multichannel readout mass spectrometer |
US3629573A (en) * | 1970-08-20 | 1971-12-21 | Bendix Corp | Monopole/quadrupole mass spectrometer |
US3767914A (en) * | 1971-05-17 | 1973-10-23 | Bendix Corp | Continuous injection mass spectrometer |
CA973282A (en) * | 1973-07-20 | 1975-08-19 | Peter H. Dawson | High-resolution focussing dipole mass spectrometer |
DE2445711A1 (de) * | 1973-10-03 | 1975-04-10 | Hewlett Packard Co | Ionen/elektronen-umwandler |
JPS51141688A (en) * | 1975-06-02 | 1976-12-06 | Hitachi Ltd | Mass spectrometer |
-
1976
- 1976-01-20 US US05/650,783 patent/US4066894A/en not_active Expired - Lifetime
- 1976-12-27 FR FR7639200A patent/FR2339249A1/fr active Granted
- 1976-12-29 BE BE173742A patent/BE849983A/xx unknown
- 1976-12-30 JP JP51160888A patent/JPS59946B2/ja not_active Expired
-
1977
- 1977-01-14 GB GB1509/77A patent/GB1567490A/en not_active Expired
- 1977-01-17 CH CH56077A patent/CH617869A5/de not_active IP Right Cessation
- 1977-01-17 DE DE19772701606 patent/DE2701606A1/de active Granted
- 1977-01-17 SE SE7700438A patent/SE414094B/sv not_active IP Right Cessation
- 1977-01-19 NL NL7700502A patent/NL7700502A/xx not_active Application Discontinuation
- 1977-01-20 AU AU21480/77A patent/AU502854B2/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS52119290A (en) | 1977-10-06 |
FR2339249B1 (sv) | 1982-01-22 |
NL7700502A (nl) | 1977-07-22 |
JPS59946B2 (ja) | 1984-01-09 |
AU2148077A (en) | 1978-07-27 |
BE849983A (fr) | 1977-04-15 |
FR2339249A1 (fr) | 1977-08-19 |
GB1567490A (en) | 1980-05-14 |
CH617869A5 (sv) | 1980-06-30 |
SE7700438L (sv) | 1977-07-21 |
DE2701606A1 (de) | 1977-07-21 |
US4066894A (en) | 1978-01-03 |
DE2701606C2 (sv) | 1988-03-03 |
AU502854B2 (en) | 1979-08-09 |
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