JPS5992326A - Mtf measuring machine - Google Patents

Mtf measuring machine

Info

Publication number
JPS5992326A
JPS5992326A JP20232682A JP20232682A JPS5992326A JP S5992326 A JPS5992326 A JP S5992326A JP 20232682 A JP20232682 A JP 20232682A JP 20232682 A JP20232682 A JP 20232682A JP S5992326 A JPS5992326 A JP S5992326A
Authority
JP
Japan
Prior art keywords
lens
mtf
measured
illuminance
images
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP20232682A
Other languages
Japanese (ja)
Inventor
Junichi Kitabayashi
淳一 北林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP20232682A priority Critical patent/JPS5992326A/en
Publication of JPS5992326A publication Critical patent/JPS5992326A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0292Testing optical properties of objectives by measuring the optical modulation transfer function

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

PURPOSE:To shorten the setting time of a lens by calculating the MTF of a lens to be measured and illuminance on an image-formation surface at a time from video signals from respective linear image sensors of an MTF measuring machine. CONSTITUTION:Light sources such as fluorescent lamps 11 and 12 light up a chart plate 14 having charts 13 (131-13m) consisting of slits and images of the charts 13 are formed on photodetection surfaces of linear image sensors 16 consisting of charge-coupled elements through the lens 15 to be measured. The charge-coupled elements 16 are so arranged that the direction of an array of numbers of photoelements phi1-N is perpendicular to the lengthwise direction of the images 13a of the slits 13, convert short-directional illuminance distributions of the slit images 13a into electric signals, and output a video signal in time series by self-scanning. This video signal is processed by Fourier transformation to calculate the MTF value of the measured lens 15 and illuminance on the image-formation surface.

Description

【発明の詳細な説明】 (J支 飴j多hID 本光明+J:レンズのMTFを測定するMTF測71機
に関J゛−る。
[Detailed Description of the Invention] (J branch) Honkomei+J: Concerning 71 MTF measuring instruments that measure the MTF of lenses.

ωユ米技体D 1/′r−米、レンズのMTF測定と結(象面照度分4
1iの測定どけ別々の測定機で行なっており、従ってレ
ンズσ)セットiCl+、i同がかかった。
ω Yume Technique D 1/'r - Lens MTF measurement and result (image surface illuminance 4
The measurement distance of 1i was carried out using separate measuring machines, and therefore the lenses σ) set iCl+, iCl+ and iCl+ were used.

(月 白′す) 本発明+J−レンズのMTFと結像面照度とを同時に測
定することによって上記欠点を数置1−る様にしたMT
F測定機を提供することを目的とする。
(Tsuki Shiro'su) The present invention + J- A MT that eliminates the above drawbacks by simultaneously measuring the MTF and imaging surface illuminance of the lens.
The purpose is to provide an F measuring device.

C施f1.D 以下図面を参照しながら本発明について実施例をあげて
説明1−る。
C f1. D The present invention will be described below by way of examples with reference to the drawings.

第11図(a) K本発明の一笑7iん例1Cおける光
学系を示1−6 2本の螢光灯11.12よりなる光源はスリットよりな
るチャー1・13を有するチャート板14を照明し、チ
ャート13の像は被測定レンズ15により亀伺結合素子
よりなる1次・元イメージセンザ16の受光面に結球さ
れる。屯荷結合紫子16は多数のホトエレメントφ〜N
が直線上に配列されている方向とスリット13のf&4
13aの長手方向とがIU父するように配置されており
、スリット1象Leaの胞子方向(幅方向)の照jt分
布を′電気信号に斐侠して自己定食により時系列で抛2
図に示すとと(ビデオ信号■、として出力“ツ″る。こ
のビデオ信号にフーリエ変換処8!ヶはどこり−ことに
より被測定レンズ15のMTF (iM 力演’Jl−
される。一般にレンズのMTF iiiはしンズの性能
の他に像高位置、ラジフ′ル方向、タンジェンシャル方
向によっても変化するσ)で、それぞれに対応した位1
゛妊に複数のスリンl−131〜16m及び電荷結合素
子161〜16mが配置される。
FIG. 11(a) shows the optical system in Example 1C of the present invention 1-6 A light source consisting of two fluorescent lamps 11 and 12 illuminates a chart board 14 having charts 1 and 13 consisting of slits. However, the image of the chart 13 is focused by the lens 15 to be measured on the light receiving surface of a primary/primary image sensor 16 made of a hexagonal coupling element. The load-binding purple child 16 has a large number of photoelements φ~N
are arranged on a straight line and f&4 of slit 13
The longitudinal direction of the slit 13a is arranged so as to be opposite to the IU direction, and the irradiation distribution in the spore direction (width direction) of the slit 1 lea is controlled in time series by self-fixation using the electric signal.
As shown in the figure, the video signal is outputted as a video signal. This video signal is subjected to Fourier transform 8!.
be done. In general, the MTF III of a lens is σ) which varies depending on the image height position, radial direction, and tangential direction in addition to the lens performance.
A plurality of Surins 131 to 16m and charge coupled devices 161 to 16m are arranged in the carrier.

被測ボレンズの壁間周波数f (!’y+#i )のM
’rF11げMTF(f)は次のフーリエ変換の式11
1により削A−さ」しK  : ス リ  ソ  ト 
11幅 補 正 ++i■□二′亀竹結合素子の出力(
1−φ〜N)Xl:走査方向距離(Wり わす。レンズの1象高が高くなると、一般に結1象面の
照度が低下1″あので、各電荷結合素子161〜16m
の出力は第1図(b)のように1象高に応じ−(変化1
−る。
M of the wall frequency f (!'y+#i) of the Bolens to be measured
'rF11+MTF(f) is the following Fourier transform equation 11
By 1, cut A-sa' and K: pickpocket
11 Width correction ++i■□2'Kametake coupling element output (
1-φ~N)
As shown in Fig. 1(b), the output of -(change 1
-ru.

この電荷結合素子16の出力のピーク値が被測定レンズ
15のj管(象性能(MTF) Kよっても異なるため
、結1象簡の照度分卯を測定するためには電荷結合素子
16の出力のイ責分1(+’jをQIA−17よければ
ならない。
Since the peak value of the output of the charge coupled device 16 differs depending on the lens performance (MTF) K of the lens 15 to be measured, in order to measure the illuminance distribution of the lens 15, the output of the charge coupled device 16 is The liability of 1 (+'j must be equal to QIA-17.

これはMTF測定機を利用することによりfI1式の分
IUの値を各稼高位戦でσ)照)髪とすれば良(・ので
、1゛ハJIlう、となる。
This can be done by using an MTF measuring device to set the value of IU in the fI1 formula for each high-earning race.

第3図はこの実施例における回路部の栴成を示づ−。各
像高位i6.にげラジアル力回、タンジェンシャルカ回
に向けて2個ずつの電荷結合素子161〜16mが配置
されている。これらの電荷結合素子161〜16mの出
力信号のつF−)1個の電荷結合素子の出力かマルチプ
レクサ17VCよって選択されてアナログ/デジタル変
換器18によりテジクル信号Vcll換され、ラノダム
アク七スメモリ(RAM) 19 vcとり込まれる。
FIG. 3 shows the construction of the circuit section in this embodiment. Each statue height i6. Two charge-coupled devices 161 to 16m are arranged for the radial power cycle and the tangential power cycle. One of the output signals of these charge-coupled devices 161 to 16m (F-) is selected by the multiplexer 17VC and converted into a signal Vcll by the analog/digital converter 18, and then sent to the random access memory (RAM). 19 VC is taken in.

こσ)RAM19にとり込まれた信号は演算回路20に
おいて電荷結合素子16のホトエレメントの感度、暗電
流のバラツギが融水しない回E¥121からの補正値に
より補1r′さiシた後に、(2)示しなし・回路22
からのsin、 cosのデータを用(・て(11式の
〕−IJ工変換の演算がほどこされてMTF値MTF(
f)と子161〜16mの出力信号がl1ll’j次に
マルチプレクサ17により選択されて同様&、)処IH
が行なゎ1L、各1市及びラジアル方向、クンジェンン
ヤル方向のMTF値と照度分布とが得られ4)。
σ) The signal taken into the RAM 19 is corrected in the arithmetic circuit 20 by the correction value from the time when the sensitivity of the photoelement of the charge-coupled device 16 and the dark current is not melted. (2) Not shown/Circuit 22
Using the data of sin and cos from
The output signals of f) and children 161 to 16m are then selected by the multiplexer 17 and similarly &,) processed IH
The MTF value and illuminance distribution for each city, radial direction, and radial direction were obtained for 1L4).

■−り 以上のように本発明によればMTF fJIH定様にお
いて1次元イメージ士ンサ谷々からのビデオ信号より被
側足レンズのMTF及び照度を同時に測定1−るので、
被測定レンズのセットが間中でその時間を短縮すること
かできる。
As described above, according to the present invention, the MTF and illuminance of the lateral leg lens are simultaneously measured from the video signal from the one-dimensional image sensor valley in the MTF fJIH constant.
The time required to set the lens to be measured can be shortened.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図(al (bJは本発明の一実施例におけと)光
学系を示′−3〜斜規図及びそのビデオ信号を示づ波形
図、第2図(al (b)は電荷結合素子を示1一平面
図及びそQ〕ビテオ信号を示す波形1ン1、第6図は上
記実施列の回j脩1り15を示すブロック図である。 20・・冒寅舞−回路。
Figure 1 (al (b) is an example of the present invention) shows the optical system; Figure 2 (al) shows the waveform diagram showing the oblique diagram and its video signal; Figure 2 (b) shows the charge coupling Figure 6 is a block diagram showing the steps 15 of the above implementation sequence. 20... Adventure circuit.

Claims (1)

【特許請求の範囲】[Claims] 光源と、この光源により照明さ」する複数のチャートと
、このチャートの像が被測定レンズにより結像される複
数の1次元イメージセンザと、この1次元イメージセン
ザ各々からのビデオ信号より岐測定レンズのMTF及び
結[象面照紅ン同時に計算1−る演碧士段とを111a
えたMTF測定槻。
A light source, a plurality of charts illuminated by the light source, a plurality of one-dimensional image sensors on which images of the charts are formed by a lens to be measured, and a video signal from each of the one-dimensional image sensors. Simultaneously calculate the MTF of the measuring lens and the resultant lens (111a).
MTF measurement tool.
JP20232682A 1982-11-18 1982-11-18 Mtf measuring machine Pending JPS5992326A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20232682A JPS5992326A (en) 1982-11-18 1982-11-18 Mtf measuring machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20232682A JPS5992326A (en) 1982-11-18 1982-11-18 Mtf measuring machine

Publications (1)

Publication Number Publication Date
JPS5992326A true JPS5992326A (en) 1984-05-28

Family

ID=16455693

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20232682A Pending JPS5992326A (en) 1982-11-18 1982-11-18 Mtf measuring machine

Country Status (1)

Country Link
JP (1) JPS5992326A (en)

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